IP Library Granted Patent US 9,727,461
Granted Patent B2
US 9,727,461 · App. 14/636,164 · Granted Aug 8, 2017

Storage device, memory controller, and control method

Inventors: Kaori Nakao (Tokyo, JP); Fumitoshi Hidaka (Yokohama Kanagawa, JP); Masatoshi Aoki (Yokohama Kanagawa, JP); Itaru Kakiki (Yokohama Kanagawa, JP); Tomoki Yokoyama (Fujisawa Kanagawa, JP)
Assignee: Kabushiki Kaisha Toshiba
G06F12/0802G06F3/068G06F3/0616G06F3/0631G06F2212/222
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Quick Facts
Patent No.
US 9,727,461
App. No.
14/636,164
Granted
Aug 8, 2017
Kind
B2
Abstract

A storage device includes a first nonvolatile memory that includes memory cells, each capable of storing data of a first number of bits, a second nonvolatile memory of which memory capacity is larger than a memory capacity of the first nonvolatile memory, and a memory controller is configured to control the first nonvolatile memory to store data of a second number of bits that is smaller than the first number in each of at least a part of the memory cells according to a usage amount of the memory cells.

Claims (48)

1. A storage device, comprising:

a first nonvolatile memory that includes a plurality of memory cells;

a second nonvolatile memory of which memory capacity is larger than a memory capacity of the first nonvolatile memory; and

a memory controller configured to control data writing with respect to the first nonvolatile memory, and switch a data writing manner for a part of the memory cells from a first data writing manner according to which data of a first number of bits are written in each memory cell of the part, to a second data writing manner according to which data of a second number of bits that is smaller than the first number are written in each memory cell of the part, according to a usage amount of the part of the memory cells.

2. The storage device according to claim 1 , wherein

the usage amount is indicated by a number of times data have been written in the part of the memory cells.

3. The storage device according to claim 1 , wherein

the memory controller is further configured to cause data stored in the part of the memory cells to be read out, and

the usage amount is indicated by a bit length of error correction data corresponding to data read out from the part of the memory cells.

4. The storage device according to claim 1 , wherein

the memory controller is configured to cause system data to be written in the first nonvolatile memory according to the first writing manner, and cache data to be written in the first nonvolatile memory according to the second writing manner.

5. The storage device according to claim 1 , wherein

the first nonvolatile memory is a NAND-type semiconductor memory.

6. The storage device according to claim 5 , wherein

the second nonvolatile memory is a magnetic memory.

7. The storage device according to claim 1 , wherein

the first number is equal to or greater than two, and the second number is one.

8. A memory controller of a nonvolatile memory that includes a plurality of memory cells, the memory controller comprising:

a memory interface configured to transmit data to the nonvolatile memory and receive data from the nonvolatile memory; and

a control circuit configured to control data writing with respect to the first nonvolatile memory, and switch a data writing manner for a part of the memory cells from a first data writing manner according to which data of a first number of bits are written in each memory cell of the part, to a second data writing manner according to which data of a second number of bits that is smaller than the first number are written in each memory cell of the part, according to a usage amount of the part of the memory cells.

9. The memory controller according to claim 8 , wherein

the usage amount is indicated by a number of times data have been written in the part of the memory cells.

10. The memory controller according to claim 8 , wherein

the usage amount is indicated by a bit length of error correction data corresponding to data read from the part of the memory cells.

11. The memory controller according to claim 8 , wherein

the control circuit is configured to cause system data to be written in the nonvolatile memory according to the first writing manner, and cache data to be written in the nonvolatile memory according to the second writing manner.

12. The memory controller according to claim 8 , wherein

the nonvolatile memory is a NAND-type semiconductor memory.

13. The memory controller according to claim 8 , wherein

the first number is equal to or greater than two, and the second number is one.

14. A method for controlling a storage device having a first nonvolatile memory that includes a plurality of memory cells, and a second nonvolatile memory of which memory capacity is larger than a memory capacity of the first nonvolatile memory, the method comprising:

controlling data writing with respect to the first nonvolatile memory; and

switching a data writing manner for a part of the memory cells from a first data writing manner according to which data of a first number of bits are written in each memory cell of the part, to a second data writing manner according to which data of a second number of bits that is smaller than the first number are written in each memory cell of the part, according to a usage amount of the part of the memory cells.

15. The method according to claim 14 , further comprising:

reading out data stored in the part of the memory cells; and

determining a bit length of error correction data corresponding to read data, wherein

the usage amount is indicated by the bit length.

16. The method according to claim 14 , further comprising:

determining a number of times data have been written in the part of the memory cells, wherein

the usage amount is indicated by the number of times.

17. The method according to claim 14 , wherein

system data are written in the first nonvolatile memory according to the first writing manner, and cache data are written in the first nonvolatile memory according to the second writing manner.

18. The method according to claim 14 , wherein

the first nonvolatile memory is a NAND-type semiconductor memory.

19. The method according to claim 18 , wherein

the second nonvolatile memory is a magnetic memory.

20. The method according to claim 14 , wherein

the first number is equal to or greater than two, and the second number is one.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 19, 2015
From: NAKAO, KAORI; HIDAKA, FUMITOSHI; AOKI, MASATOSHI; KAKIKI, ITARU; YOKOYAMA, TOMOKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 035673/0349 →
Priority Claims (1)
JP 2014-123676 · Jun 16, 2014 · national
Continuity (1)
Related Publication 20150363105A1 · Dec 17, 2015