Charge injection noise reduction in sample-and-hold circuit

1. A sample-and-hold circuit, comprising:

a first transistor;

a second transistor disposed between a gate and a drain of the first transistor;

a sampling capacitor, an electrode of the sampling capacitor being connected to the gate of the first transistor;

a first current source connected to the drain of the first transistor; and

a gate control circuit configured to provide a gate control signal to a gate of the second transistor,

wherein the gate control circuit includes a third transistor, a fourth transistor connected to the third transistor in series, a second current source, and an inverter configured to receive a supply voltage and an inverter control signal and output the gate control signal.

2. The sample-and-hold circuit according to claim 1 , wherein a minimum voltage of the gate control signal is V th2 +V sat2 +V th1 +V sat1 , wherein V th1 is a threshold voltage of the first transistor, V sat1 is a saturation voltage of the first transistor, V th2 is a threshold voltage of the second transistor, and V sat2 is a saturation voltage of the second transistor.

3. The sample-and-hold circuit according to claim 1 , wherein the third transistor, the fourth transistor, and the second current source provide the supply voltage to the inverter.

4. The sample-and-hold circuit according to claim 1 , wherein

the first transistor and the third transistor are matched so as to have the same transistor characteristics as one another,

the second transistor and the fourth transistor are matched so as to have the same transistor characteristics as one another, and

the first current source and the second current source are configured to output the same current as one another.

5. The sample-and-hold circuit according to claim 1 , wherein a gate and a drain of the third transistor are connected to one another, and a gate and a drain of the fourth transistor are connected to one another.

6. The sample-and-hold circuit according to claim 1 , wherein

in a case where the inverter control signal is at a higher level of two voltage levels, the inverter is configured to output a first state voltage, and

in a case where the inverter control signal is at a lower level of the two voltage levels, the inverter is configured to output a second state voltage.

7. The sample-and-hold circuit according to claim 6 , wherein the second state voltage is the supply voltage, and the first state voltage is lower than the supply voltage.

8. The sample-and-hold circuit according to claim 1 , wherein the first transistor and the second transistor are NMOS transistors.

9. The sample-and-hold circuit according to claim 1 , wherein the first transistor and the second transistor are PMOS transistors.

10. The gate control circuit according claim 1 , wherein the third transistor, the fourth transistor, and the second current source provide the supply voltage to the inverter.

11. The gate control circuit according to claim 1 , wherein a gate and a drain of the third transistor are connected to one another, and a gate and a drain of the fourth transistor are connected to one another.

12. The gate control circuit according to claim 1 , wherein

in a case where the inverter control signal is at a higher level of two voltage levels, the inverter is configured to output a first state voltage, and

in a case where the inverter control signal is at a lower level of the two voltage levels, the inverter is configured to output a second state voltage.

13. The gate control circuit according to claim 12 , wherein the second state voltage is the supply voltage, and the first state voltage is lower than the supply voltage.

14. The gate control circuit according to claim 1 , wherein the third transistor and the fourth transistor are NMOS transistors.

15. The gate control circuit according to claim 1 , wherein the third transistor and the fourth transistor are PMOS transistors.