Heat sink apparatus and method for power semiconductor device module
A heat sink has a base plate that has a first central portion, a second central portion, and a periphery, a first plurality of heat pipes embedded in the base plate that are arranged to convey heat away from the first central portion, and a second plurality of the heat pipes embedded in the base plate that are arranged to convey heat away from the second central portion, each of the heat pipes of the first and second pluralities having a hot end for receiving heat flow and a cool end for releasing heat flow. A switch package comprises an inner casing half mounted to a module facing surface of the heat sink base plate, a semiconductor module mounted to the module facing surface of the heat sink within the inner casing half, and an outer casing half that encloses the heat sink.
1. An apparatus comprising:
a base plate having a first central portion, a second central portion, a periphery, a module facing surface, a coolant facing surface, and fins connected to the coolant facing surface;
a first plurality of heat pipes embedded in the base plate that are arranged to convey heat away from the first central portion; and
a second plurality of heat pipes embedded in the base plate that are arranged to convey heat away from the second central portion, each of the heat pipes of the first and second pluralities having a respective hot end for receiving heat flow and a respective cool end for releasing heat flow, wherein the first plurality of heat pipes and the second plurality of heat pipes are embedded in between the module facing surface and the coolant facing surface, the first plurality of heat pipes arranged to convey heat from the first central portion of the base plate to the second central portion of the base plate, and the second plurality of heat pipes arranged to convey heat away from the second central portion of the base plate to the periphery of the base plate;
an inner casing half that defines an opening, the module facing surface of the heat sink being fastened to an outer surface of the inner casing half;
a semiconductor module mounted to the module facing surface of the heat sink, and received in the opening of the inner casing half; and
an outer casing half having interior partitions, which define at least one coolant inlet channel and a trough connected with the coolant inlet channel, the outer casing half being fastened to the outer surface of the inner casing half, wherein the fins of the heat sink are enclosed in the trough.
2. The apparatus of claim 1 , wherein each of the first plurality of the heat pipes has substantially a same normalized length as each other of the first plurality of the heat pipes.
3. The apparatus of claim 1 , wherein each of the first plurality of heat pipes has at least a portion of its cool end extending alongside at least a portion of a hot end of one of the second plurality of heat pipes.
4. The apparatus of claim 1 , wherein each of the first plurality of heat pipes extends substantially parallel to the hot ends of the second plurality of heat pipes.
5. The apparatus of claim 1 , wherein the second plurality of the heat pipes comprises a fourth grouping and a fifth grouping of the heat pipes arranged to convey heat from the second central portion to opposite p arts of the periphery.
6. The apparatus of claim 5 , wherein each of the fifth grouping of the heat pipes has a shorter normalized length than any of the fourth grouping of the heat pipes.
7. The apparatus of claim 1 , wherein each of the second plurality of the heat pipes has substantially a same normalized length as each other of the second plurality of the heat pipes.
8. The apparatus of claim 1 , wherein at least one of the first plurality of the heat pipes has its cool end extending alongside the hot end of at least one of the second plurality of the heat pipes.
9. The apparatus of claim 1 , further comprising a driver module electrically connected with the semiconductor module and configured to operate the semiconductor module such that a first heat-generating region of the semiconductor module is overlying the first central portion of the module facing surface while a second heat-generating region of the semiconductor module is overlying the second central portion of the module facing surface, the first and second heat-generating regions generating heat at respective first and second different rates.
10. The apparatus of claim 9 , wherein the second rate is less than the first rate.
11. The apparatus of claim 1 , wherein:
the base plate defines a heat receiving surface and a heat rejecting surface opposing the heat receiving surface, and wherein the first plurality of heat pipes and the second plurality of heat pipes are embedded in the base plate between the heat receiving surface and the heat rejecting surface;
the heat receiving surface comprises a plurality of thermal regions, of which a first region receives a first heat flow, a second region adjacent the first region receives a second heat flow smaller than the first heat flow, and a plurality of additional regions do not receive heat flow or receive heat flows smaller than the second heat flow; and
the first plurality of heat pipes are configured to convey heat from the first region to the second region and the second plurality of heat pipes are configured to convey heat from the second region to one or more of the additional regions, and the cool ends of at least some of the first plurality of heat pipes extend alongside the hot ends of at least some of the second plurality of heat pipes.
12. The apparatus of claim 11 , wherein the cool ends of the first plurality of heat pipes extend substantially in parallel with the hot ends of the second plurality of heat pipes.
13. The apparatus of claim 11 , wherein the first plurality of heat pipes extend substantially in parallel with the hot ends of the second plurality of heat pipes.
14. The apparatus of claim 11 , wherein the first plurality of heat pipes are spaced more closely than are the second plurality of heat pipes.
15. The apparatus of claim 11 , wherein the heat rejecting surface comprises a finned array and the heat pipes provide heat to at least one portion of the finned array that opposes at least one of the additional regions of the heat receiving surface.
16. The apparatus of claim 11 , wherein the heat pipes are distributed to maintain uniform temperature distribution among the regions of the heat receiving surface.
17. The apparatus of claim 11 , wherein the first and second plurality of heat pipes are distributed to maintain uniform temperature distribution across the heat rejecting surface.
18. A method for a semiconductor switch module, comprising:
during operation of the semiconductor switch module, transferring heat from a first central portion of the module to a second region of a heat sink and from the second region of the heat sink to a third region of the heat sink, such that the first central portion of the module and a second portion of the module remain at uniform and equal temperatures under load,
wherein the module is mounted on the heat sink, the heat sink comprising a base plate, the base plate having a module facing surface to which the module is mounted, a coolant facing surface opposite the module facing surface, and a plurality of heat pipes embedded between the module facing surface and the coolant facing surface, the plurality of heat pipes arranged to transfer heat from a first region of the heat sink to the second region of the heat sink and to the third region of the heat sink, and
wherein the module is configured such that the first central portion of the module, disposed adjacent the first region of the heat sink, will be hard switched under load to generate heat at a first rate, while the second portion of the module, disposed adjacent the second region of the heat sink, will be soft switched under load to generate heat at a second rate lower than the first rate.