Observation system, observation program, and observation method

1. An observation system, comprising:

a microscope optical system;

an image pickup unit configured to take first images of a first field-of-view range of the microscope optical system within an observation range at a first plurality of focal positions and generate first detection images; if the first field-of-view range is smaller than the observation range, take second images of a second field-of-view range within the observation range at a second plurality of focal positions, and generate second detection images;

an image pickup control unit configured to move the microscope optical system from the first field-of-view range to the second field-of-view range and cause the image pickup unit to take the first and second images and generate the first and second detection images at a first magnification;

a detection unit configured to analyze each of the first and second detection images, detect an observation target object from the first and second detection images, supply a three-dimensional position of the observation target object to an observation control unit; and notify the image pickup control unit of the observation range if no observation target object is detected; and

the observation control unit configured to adjust the microscope optical system to a third field-of-view range with a center corresponding to the three-dimensional position and cause the image pickup unit to take an image of the third field-of-view range at a second magnification higher than the first magnification.

2. The observation system according to claim 1 , further comprising an ultraviolet, visible, and infrared light dispersion unit configured to disperse one of ultraviolet light, visible light, and infrared light incident from the microscope optical system, wherein the observation control unit is configured to cause the ultraviolet, visible, and infrared light dispersion unit to scan the third field-of-view range of the microscope optical system.

3. The observation system according to claim 1 , further comprising a Raman scattering dispersion unit configured to disperse Raman scattering light incident from the microscope optical system, wherein the observation control unit is configured to cause the Raman scattering dispersion unit to scan the third field-of-view range of the microscope optical system.

4. The observation system according to claim 1 , wherein the observation target object is a cell seeded to each of a plurality of wells provided in a well plate.

5. The observation system according to claim 4 , wherein the image pickup control unit is configured to register the well, from which the observation target object is detected by the detection unit, as an observation target well along with the three-dimensional position of the observation target object, and exclude the well, from which the observation target object is not detected by the detection unit, from the observation target well.

6. The observation system according to claim 5 , wherein the image pickup control unit is configured to perform a time-lapse image taking for the observation target well.

7. The observation system according to claim 6 , further comprising:

an identifier read unit configured to read an identifier of the well plate from an identification marker provided to the well plate; and

an identifier management unit configured to check the identifier supplied from the identifier read unit against an identifier of a well plate which has been previously observed and supplies observation data of the well plate corresponding to the supplied identifier to the image pickup control unit.

8. A non-transitory computer-readable medium containing a computer program product causing a computer to function as an image pickup control unit configured to cause

an image pickup unit to take first images of a first field-of-view range of a microscope optical system within an observation range at a first plurality of focal positions and generate first detection images at a first magnification; and if the first field-of-view range is smaller than the observation range, take second images of a second field-of-view range within the observation range at a second plurality of focal positions, and generate second detection images at the first magnification,

a detection unit to analyze each of the first and second detection images, detect an observation target object from the first and second detection images, supply a three-dimensional position of the observation target object to an observation control unit and notify the image pickup control unit of the observation range if no observation target object is detected, and

the observation control unit to adjust the microscope optical system to a third field-of-view range with a center corresponding to the three-dimensional position and cause the image pickup unit to take an image of the third field-of-view range at a second magnification higher than the first magnification.

9. An observation method, comprising:

causing, by an image pickup control unit, an image pickup unit to take first images of a first field-of-view range of a microscope optical system within an observation range at a first plurality of focal positions and generate first detection images at a first magnification; and if the first field-of-view range is smaller than the observation range, take second images of a second field-of-view range within the observation range at a second plurality of focal positions, and generate second detection images at the first magnification;

detecting a three-dimensional position of an observation target object from the detection images by a detection unit;

adjusting the microscope optical system to a third field-of-view range with a center corresponding to the three-dimensional position by an observation control unit; and

causing, by the observation control unit, the image pickup unit to take an image of the third field-of-view range of the microscope optical system at a second magnification higher than the first magnification.