Method and an apparatus for obtaining sample specific signatures

1. A method for obtaining sample specific signatures, the method comprising:

irradiating a sample at a predefined location with an electromagnetic radiation of a specific wavelength to cause electromagnetic radiation to be scattered from the sample;

selectively capturing, a certain component of scattered electromagnetic radiation from at least one of a-various locations around the sample to obtain from a cross section of said radiation a plurality of profiles; and

filtering the profiles to obtain a sample specific signature;

wherein said various locations around the sample include an incident direction of said electromagnetic radiation of a specific wavelength;

wherein each particle in the sample is excited by both said electromagnetic radiation and a resultant field scattered by all other particles in the sample; and

wherein a signal observed at any point of observation is dependent on a cross section of the resultant field and a number density of particles.

2. The method according to claim 1 , wherein the predefined location is at least one position around the sample.

3. The method according to claim 1 , whet the wavelength of the electromagnetic radiation is in the range of 500 nm to 1400 nm.

4. The method according to claim 1 , wherein the component of the scattered electromagnetic radiation is a multiply amplified Raman scattering.

5. The method according to claim 1 , wherein the selective capturing of the scattered electromagnetic radiation is independent of collection angle.

6. The method according to claim 1 , wherein the captured electromagnetic radiation is from an amplified scattering obtained through multiple scattering of the incident electromagnetic radiation.

7. The method according to claim 1 , wherein the sample specific signatures are from a multilayer sample wherein the thickness of the multilayer is at least 5 mm.

8. An apparatus for detection of sample specific signatures, the apparatus comprising:

at least one electromagnetic radiation source;

a first arrangement for directing electromagnetic radiation onto a sample such that said electromagnetic radiation is scattered from the sample;

a second, arrangement for collecting scattered electromagnetic radiation from the sample;

a spectrum analyzer operably coupled to the second arrangement; and

a detector connected to the optical spectrum analyser and being configured to selectively capture a certain component of said scattered electromagnetic radiation from at least one of various locations around the sample to obtain from a cross section of said radiation a plurality of profiles;

wherein said various locations around the sample include an incident direction of said electromagnetic radiation of a specific wavelength;

wherein each particle in the sample is excited by both said electromagnetic radiation and a resultant field scattered by all other particles in the sample; and

wherein a signal observed at any point of observation is dependent on a cross section of the resultant field and a number density of particles.

9. The apparatus according to claim 8 , wherein the first arrangement comprises:

at least one optical fiber wherein each of the at least one optical fiber is connected to each of the at least one electromagnetic radiation, source; and

at least one directing optical element comprising a lens, a mirror or a combination thereof wherein the directing element is positioned to direct, the electromagnetic radiation onto the sample.

10. The apparatus according to claim 8 , wherein the second arrangement is a plurality of optical elements positioned to direct the scattered electromagnetic radiation to the spectrum analyzer.

11. The apparatus according to claim 8 , wherein the positioning of the second arrangement is independent of the orientation and/or position of the arrangement at the sample.

12. The apparatus according to claim 8 , wherein the second arrangement is a plurality of optical fibers positioned at various locations on the sample for collecting the scattered electromagnetic radiation.

13. The apparatus according to claim 8 , wherein the analyser comprises:

a spectrometer;

a filter for selectively capturing the scattered electromagnetic radiation; and

an analysis unit for obtaining a sample specific profile.

14. The apparatus according to claim 8 , wherein the apparatus is configured for providing sample specific signatures at any point-of-need location.