Scanning microscope and methods for wavelength-dependent detection
View Patent ↗A scanning microscope for examination of a sample ( 31 ), having at least one optical component ( 89 ) that exhibits a wavelength-dependent characteristic and having an apparatus for wavelength-dependent detection that acquires measured values in at least two wavelength regions each characterized by a spectral width and a spectral position, is disclosed. The scanning microscope is characterized in that the wavelength-dependent characteristic of the at least one optical component ( 89 ) can be ascertained, can be at least temporarily stored in the form of a data set in a memory ( 49, 81 ), and can be considered upon acquisition and/or upon utilization of the measured values.
1. A scanning microscope for examination of a sample comprising:
at least one optical component that exhibits a wavelength-dependent characteristic,
apparatus for wavelength-dependent detection that acquires measured values in at least two wavelength regions each characterized by a spectral width and a spectral position, wherein the wavelength-dependent characteristic of the at least one optical component can be ascertained, can be at least temporarily stored in the form of a data set in a memory, and can be considered upon acquisition and/or upon utilization of the measured values.
2. The scanning microscope as defined in claim 1 , wherein the wavelength-dependent characteristic is a property of a spectrally selective element.
3. The scanning microscope as defined in claim 2 , wherein the spectrally selective element is a prism, a grating, or a hologram.
4. The scanning microscope as defined in claim 1 , wherein the apparatus for wavelength-dependent detection comprises at least one detector, and the wavelength-dependent characteristic is a property of the detector.
5. The scanning microscope as defined in claim 4 further comprising a detector, wherein the wavelength-dependent characteristic is the spectral sensitivity of said detector.
6. The scanning microscope as defined in claim 4 , wherein the detector is a photomultiplier and wherein a voltage applied to the photomultiplier is modifiable as a function of the spectral position of the wavelength regions.
7. The scanning microscope as defined in claim 1 further comprising a detection diaphragm having an opening width, wherein the wavelength-dependent characteristic is a property of the detection diaphragm and wherein the opening width of the detection diaphragm is modifiable as a function of the spectral position of the wavelength regions.
8. The scanning microscope as defined in claim 1 further comprising a beam splitter, wherein the wavelength-dependent characteristic is a property of said beam splitter.
9. The scanning microscope as defined in claim 1 , wherein the spectral width of the wavelength regions is modifiable as a function of the spectral position of the wavelength regions.
10. The scanning microscope as defined in claim 9 , wherein the spectral width of the wavelength regions is independent of the spectral position of the wavelength regions.
11. The scanning microscope as defined in claim 1 , wherein the apparatus for wavelength-dependent detection comprises a multi-band detector having a slit diaphragm arrangement, the width of the slits being modifiable as a function of the spectral position of the wavelength regions.
12. The scanning microscope as defined in claim 1 further comprising a processing unit for correcting the measured values.
13. A method for wavelength-dependent detection, with a scanning microscope, of the detected light proceeding from a sample, characterized by the following steps:
ascertaining at least one wavelength-dependent characteristic of at least one optical component of the scanning microscope;
storing the ascertained wavelength-dependent characteristic of the component of the scanning microscope in the form of a data set in a memory;
acquiring measured values and utilizing the measured values, with consideration of the wavelength-dependent characteristic of the optical component of the scanning microscope upon acquisition and/or upon utilization.
14. The method as defined in claim 13 , wherein the wavelength-dependent characteristic is a property of a spectrally selective element.
15. The method as defined in claim 13 , wherein the apparatus for wavelength-dependent detection comprises at least one detector, and the wavelength-dependent characteristic is a property of the detector.
16. The method as defined in claim 15 , wherein the wavelength-dependent characteristic is the spectral sensitivity of the detector.
17. The method as defined in claim 16 , wherein the detector is a photomultiplier and wherein a voltage applied to the photomultiplier is modified as a function of the spectral position of the wavelength regions.
18. The method as defined in claim 13 , wherein the wavelength-dependent characteristic is a property of a detection diaphragm that has an opening width and wherein the opening width of the detection diaphragm is modified as a function of the spectral position of the wavelength regions.
19. The method as defined in claim 13 , wherein the spectral width of the wavelength regions is modified as a function of the spectral position of the wavelength regions.
20. The method as defined in claim 13 , wherein the apparatus for wavelength-dependent detection comprises a multi-band detector having a slit diaphragm arrangement, the width of the slit being modified as a function of the spectral position of the wavelength regions.
21. The method as defined in claim 13 further comprising the step of generating of image data from the measured values.
22. The method as defined in claim 13 further comprising the step of correcting of the measured values.
23. The method as defined in claim 13 further comprising the Step of calibrating of the apparatus for wavelength-dependent detection on the basis of the ascertained wavelength-dependent characteristic.