Method for spectral analysis, and scanning microscope

1. A method for spectral analysis of the light proceeding from a specimen using a multi-band detector comprising the steps of:

a) defining an overall spectral region;

b) defining a first spectral subregion and defining at least a second spectral subregion;

wherein the first spectral subregion and the second spectral subregion are in the overall spectral region;

c) scanning the specimen with illuminating light using a scanning microscope;

d) simultaneously detecting detection light proceeding from the specimen in the first and the second spectral subregion, and generating detection values;

e) displacing the first spectral subregion and displacing the second spectral subregion within the overall spectral region; and

f) repeating steps d) and e) until the detection light has been detected over the entire overall spectral region.

2. The method as defined in claim 1 , comprising the further steps of:

generating a detected spectrum from the detection values; and

displaying the detected spectrum.

3. The method as defined in claim 2 , wherein the displaying of the detected spectrum contains a false-color depiction.

4. The method as defined in claim 1 , wherein the displacing the first and second spectral subregions is performed so as to simultaneously displace the first and second spectral subregions.

5. The method as defined in claim 1 , wherein the light derives from a single scan point or a line or an area of the specimen.

6. The method as defined in claim 1 , wherein the detection light proceeding from the specimen is fluorescent light.

7. The method as defined in claim 1 , wherein spectral portions of the illuminating light are blocked out during detection.

8. The method as defined in claim 6 , wherein spectral portions of the illuminating light are blocked out during detection.

9. The method as defined in claim 1 , wherein definition of the spectral regions is accomplished automatically.

10. A scanning microscope comprising:

an illuminating light source configured to illuminate a specimen;

a scanning device configured to scan the specimen with the illuminating light;

a multi-band detector configured to simultaneously detect detection light proceeding from the specimen in at least a first and a second spectral subregion; and

a spectral subregion defining device configured to displace the first and second spectral subregions.

11. The scanning microscope as defined in claim 10 , wherein the spectral subregion defining device is configured to displace the first and second spectral subregions so as to detect the detection light over an overall spectral region.

12. The scanning microscope as defined in claim 10 , wherein the spectral subregion defining device is configured to define the first and second spectral subregions from an overall spectral region.

13. The scanning microscope as defined in claim 10 , wherein the spectral subregion defining device is configured to operate automatically.

14. The scanning microscope as defined in claim 10 , wherein the spectral subregion defining device is configured to continuously displace the first and second spectral regions.

15. The scanning microscope as defined in claim 10 , wherein the multi-band detector comprises at least one movable mirror stop.

16. The scanning microscope as defined in claim 10 , wherein the scanning microscope has an excitation beam path and a detection beam path, an acoustooptical component being provided for separation of the excitation and detection beam paths.

17. The scanning microscope as defined in claim 10 , wherein the spectral subregion defining device is configured to simultaneously displace the first and second spectral subregions.