IP Library Granted Patent US 6,867,919
Granted Patent B2
US 6,867,919 · App. 10/681,016 · Granted Mar 15, 2005

Optical arrangement and microscope

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Quick Facts
Patent No.
US 6,867,919
App. No.
10/681,016
Granted
Mar 15, 2005
Kind
B2
Abstract

An optical arrangement for directing illumination light to a sample and for directing the detection light proceeding from the sample to a detector has a spectrally selective influencing means in the beam path of the detection light, which influences the polarization properties of the illumination light reflected or scattered from the sample in such a way that a polarizing beam splitter splits the illumination light reflected or scattered from the sample out of the detection light.

Claims (13)

1. An optical arrangement for directing illumination light to a sample and for directing the detection light proceeding from the sample to a detector comprising: a polarizing beam splitter and at least one spectrally selective influencing means arranged in the beam path of the detection light that influences the polarization properties of the illumination light reflected or scattered from the sample in such a way that the polarizing beam splitter splits the illumination light reflected or scattered from the sample out of the detection light.

2. The optical arrangement as defined in claim 1 , wherein the spectrally selective influencing means contains at least one prism or one grating.

3. The optical arrangement as defined in claim 1 , wherein the spectrally selective influencing means contains an LCD element.

4. The optical arrangement as defined in claim 1 , wherein the spectrally selective influencing means contains a phase-shifting liquid crystal display mirror-coated on the back side.

5. The optical arrangement as defined in claim 1 , further comprising a further polarizing beam splitter that distributes the detection light onto two light paths which the polarizing beam splitter recombines.

6. A microscope with an optical arrangement for directing illumination light to a sample and for directing the detection light proceeding from the sample to a detector comprising: a polarizing beam splitter and at least one spectrally selective influencing means arranged in the beam path of the detection light that influences the polarization properties of the illumination light reflected or scattered from the sample in such a way that the polarizing beam splitter splits the illumination light reflected or scattered from the sample out of the detection light.

7. The microscope as defined in claim 6 , wherein the spectrally selective influencing means contains at least one prism or one grating.

8. The microscope as defined in claim 6 , wherein the spectrally selective influencing means contains an LCD element.

9. The microscope as defined in claim 6 , wherein the spectrally selective influencing means contains a phase-shifting liquid crystal display mirror-coated on the back side.

10. The microscope as defined in claim 6 , wherein a further polarizing beam splitter is provided that distributes the detection light onto two light paths which the polarizing beam splitter recombines.

11. The microscope as defined in claim 6 , wherein the microscope is a scanning microscope, in particular a confocal scanning microscope.

12. The microscope as defined in claim 6 , wherein the microscope is a Nipkow scanner.

13. The microscope as defined in claim 6 , wherein the microscope is a line scanner.

Assignments (2)
CHANGE OF NAME Recorded Jul 27, 2006
From: LEICA MICROSYSTEMS HEIDELBERG GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 017996/0809 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2003
From: SEYFRIED, VOLKER
To: LEICA MICROSYSTEMS HEIDELBERG GMBH
Reel/Frame 014597/0001 →