IP Library Patent Application 10898770
Patent Application
App. No. 10/898,770

Scanning microscope and method for scanning microscopy

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Patent No.
US None
App. No.
10/898,770
Abstract

A scanning microscope has a detector for detecting the detected light proceeding from a sample. A bandpass filter, containing a combination of a short-pass filter and at least one long-pass filter, is arranged in the light path of the detected light. The detector is a non-descan detector.

Claims (22)

1 . A scanning microscope comprising: a non-descan detector for detecting the detected light proceeding from a sample, a bandpass filter, which comprises a combination of at least one short-pass filter and at least one long-pass filter and which is arranged in the light path of the detected light.

2 . The scanning microscope as defined in claim 1 , wherein the short-pass filter and/or the long-pass filter comprises a spectral gradient filter and/or of a dielectric filter and/or of a gradient interference filter.

3 . The scanning microscope as defined in claim 1 , wherein the short-pass filter and/or the long-pass filter comprises a spectral gradient filter and/or a gradient interference filter and at least one moveable beam stop whereby the spectral stopband of the short-pass filter and/or the one long-pass filter is defined by the relative position of the at least one beam stop to the gradient interference filter and or the spectral gradient filter.

4 . The scanning microscope as defined in claim 1 , wherein the short-pass filter and/or the long-pass filter are rotatable and/or displaceable relative to one another.

5 . The scanning microscope as defined in claim 1 , wherein generation of the detected light in the sample encompasses a second-harmonic generation (SHG) process and/or a multi-photon process.

6 . The scanning microscope as defined in claim 5 , further comprising a pulsed light source, in particular a pulsed laser, for generating the illuminating light.

7 . The scanning microscope as defined in claim 1 , wherein the light path of the detected light encompasses several detection channels.

8 . The scanning microscope as defined in claim 1 , wherein the scanning microscope is a confocal scanning microscope.

9 . A method for scanning microscopy on a sample, comprising the steps of:

ascertaining an illuminating light frequency at which detected light having the frequency of a harmonic of the illuminating light frequency can be generated in the sample;

illuminating the sample with illuminating light of the ascertained illuminating light frequency;

blocking out from the detected light proceeding from the sample those light components that have the frequency of the illuminating light and/or the frequency of autofluorescence light, using a bandpass filter that comprises a combination of a short-pass and at least one long-pass filter and is arranged in the light path of the detected light; and

detecting the filtered detected light using a non-descan detector.

10 . The method as defined in claim 9 , wherein the short-pass filter and/or the long-pass filter comprises a spectral gradient filter and/or of a dielectric filter and/or of a gradient interference filter.

11 . The method as defined in claim 9 , wherein the short-pass filter and/or the long-pass filter comprises a spectral gradient filter and/or a gradient interference filter and at least one moveable beam stop whereby the spectral stopband of the short-pass filter and/or the one long-pass filter is defined by the relative position of the at least one beam stop to the gradient interference filter and or the spectral gradient filter.

12 . The method as defined in claim 9 , wherein the short-pass filter and/or the long-pass filter are rotatable and/or displaceable relative to one another.

13 . The method as defined in claim 9 , wherein generation of the detected light in the sample encompasses a second-harmonic generation (SHG) process and/or a multi-photon process.

14 . The method as defined in claim 13 , further comprising a pulsed light source, in particular a pulsed laser, for generating the illuminating light.

15 . The method as defined in claim 9 , wherein the light path of the detected light encompasses several detection channels.

16 . The method as defined in claim 15 , wherein bandpass filters are provided in several detection channels.

17 . The method as defined in claim 15 , wherein the bandpass filter causes splitting of the detection channels.

18 . The method as defined in claim 9 , wherein a confocal scanning microscope is used to carry it out.

Assignments (2)
CHANGE OF NAME Recorded Jul 27, 2006
From: LEICA MICROSYSTEMS HEIDELBERG GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 017996/0809 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2004
From: ULRICH, HEINRICH; KNEBEL, WERNER
To: LEICA MICROSYSTEMS HEIDELBERG GMBH
Reel/Frame 015628/0959 →