Scanning microscope and optical element
View Patent ↗A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a [sic] detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.
1. A scanning microscope comprising:
an objective that defines an illumination beam path and a detection beam path and being arranged in both the illumination beam path and the detection beam path;
an interchangeable module arranged in the illumination beam path and detection beam path that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and that comprises at least a first acoustooptical component; and
an optical compensation element that compensates for a double refraction and a prismatic effect of the acoustooptical component;
wherein the optical compensation element contains a further acoustooptical component; and
wherein the further acoustooptical component and the first acoustooptical component are oriented rotated 180 degrees from one another with reference to the propagation direction of the detected light beam striking the first acoustooptical component.
2. The scanning microscope as defined in claim 1 , wherein the acoustooptical component is an acoustooptical tunable filter (AOTF) or an acoustooptical deflector (AOD).
3. A scanning microscope comprising:
an objective that defines an illumination beam path and a detection beam path and being arranged in both the illumination beam path and the detection beam path;
an interchangeable module arranged in the illumination beam path and detection beam path that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and that comprises at least a first acoustooptical component; and
an optical compensation element that compensates for a double refraction and a prismatic effect of the acoustooptical component;
wherein the optical compensation element contains a further acoustooptical component; and
wherein the spacing of the further acoustooptical component from the first acoustooptical component is so small that a spectral division, caused by the first acoustooptical component, of a detected light bundle propagating along the detection beam path is smaller, at the further acoustooptical component, than half the diameter of the undivided detected light bundle.
4. The scanning microscope as defined in claim 1 , wherein the further acoustooptical component is cemented to the first acoustooptical component.
5. The scanning microscope as defined in claim 1 , wherein the module contains elements for beam guidance and/or beam shaping.
6. The scanning microscope as defined in claim 1 , wherein guide elements and banking elements for positioning the module are provided.
7. The scanning microscope as defined in claim 3 , wherein the acoustooptical component is an acoustooptical tunable filter (AOTF) or an acoustooptical deflector (AOD).
8. The scanning microscope as defined in claim 3 , wherein the further acoustooptical component is cemented to the first acoustooptical component.
9. The scanning microscope as defined in claim 3 , wherein the module contains elements for beam guidance and/or beam shaping.
10. The scanning microscope as defined in claim 3 , wherein guide elements and banking elements for positioning the module are provided.