IP Library Granted Patent US 7,359,066
Granted Patent B2
US 7,359,066 · App. 11/073,295 · Granted Apr 15, 2008

Electro-optical measurement of hysteresis in interferometric modulators

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Quick Facts
Patent No.
US 7,359,066
App. No.
11/073,295
Granted
Apr 15, 2008
Kind
B2
Abstract

Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

Claims (12)

1. A method of testing a plurality of interferometric modulators, comprising:

applying a triangular voltage waveform to the interferometric modulators; and

detecting reflectivity of light from the interferometric modulators, wherein the detecting includes measuring reflectivity through a diffuser positioned between a light detector and the interferometric modulators.

2. The method of claim 1 , wherein the step of applying a triangular waveform causes the interferometric modulators to vary between an actuated and a non-actuated state.

3. The method of claim 1 , wherein the triangular waveform has a frequency of less than about 20 Hz.

4. The method of claim 3 , wherein the triangular waveform has a frequency from about 1 Hz to about 15 Hz.

5. The method of claim 1 , wherein the amplitude of the triangular waveform is greater than the voltage necessary to cause a positive or negative going actuation of the interferometric modulators.

6. The method of claim 5 , wherein the amplitude of the triangular waveform is less than about 1.5 times the voltage necessary to cause a positive or negative going actuation of the interferometric modulators.

7. The method of claim 1 , wherein the triangular voltage waveform is simultaneously applied to all interferometric modulators in a reflective display.

8. The method of claim 1 , wherein the detecting step includes detecting reflectivity from less than all interferometric modulators in a reflective display.

9. The method of claim 1 , wherein the detecting step includes measuring reflectivity with a photodetector.

10. The method of claim 1 , wherein the detecting step includes measuring reflectivity at an angle that is substantially perpendicular to the interferometric modulators.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2016
From: QUALCOMM MEMS TECHNOLOGIES, INC.
To: SNAPTRACK, INC.
Reel/Frame 039891/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2009
From: IDC,LLC
To: QUALCOMM MEMS TECHNOLOGIES, INC.
Reel/Frame 023449/0614 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 4, 2006
From: CUMMINGS, WILLIAM J.; GALLY, BRIAN
To: IDC, LLC
Reel/Frame 018067/0942 →