Photoreceptor abrader for LCM
View Patent ↗A cleaning system for cleaning an imaging surface moving in a process direction, including: an abrading brush for uniformly abrading the imaging surface to remove laterally conductive deposits that lead to lateral charge migration therefrom, the abrading brush includes a core defining a core length and having fibers extending outwardly therefrom, the fibers include abrasive particles attached thereto.
1. A cleaning system for cleaning an imaging surface moving in a process direction, comprising:
an abrading brush for uniformly abrading the imaging surface to remove laterally conductive deposits therefrom, said abrading brush includes a core defining a core length and having fibers extending outwardly therefrom, said fibers include abrasive particles permanently attached to the end or the entire length of said fibers; and
a power supply for biasing said conductive fibers, said power supply applies an AC bias sufficient to generate corona in the brush-imaging surface nip at the ends of the conductive fibers.
2. The cleaning system of claim 1 , wherein said abrading brush includes fibers without abrasive particles attached to the end of said fibers.
3. The cleaning system of claim 2 , wherein said abrading brush includes a first region extending along the core having fibers including attached abrasive particles and a second region extending along the core having fibers without attached abrasive particles.
4. The cleaning system of claim 2 , wherein said first region is a spiral region having a width ranging from 1 mm to 50 mm.
5. The cleaning system of claim 1 , wherein said fibers selected from the group fibers consisting of conductive and insulating synthetic fibers including styrene-acrylate, acrylic, nylon, polyethylene, polypropylene, polyester, polystyrene, rayon, polyethylethylketone (PEEK), polyvinylchloride, carbon fiber and natural fibers including tampico, horsehair, palmetto, and palmyra.
6. The cleaning system of claim 1 , wherein said fibers are between 1 denier per fiber and 30 denier per fiber in diameter and between 3 mm and 20 mm in length.
7. The cleaning system of claim 1 , wherein said abrasive particles selected from the group abrasive particles consisting of silicon carbide, aluminum oxide, cerium oxide, iron oxide, cubic boron nitride, garnet, silica, glass, zirconia.
8. The cleaning system of claim 1 , wherein said abrasive particles are between 0.2 microns and 15 microns in size.
9. The cleaning system of claim 1 , wherein said fibers are conductive fibers.
10. The cleaning system of claim 1 , wherein said primary cleaning device is in a housing separate from said abrading brush.
11. The cleaning system of claim 1 , wherein said abrading brush is rotated between 100 rpm and 4000 rpm.
12. A cleaning system for cleaning an imaging surface moving in a process direction, comprising:
an abrading brush for uniformly abrading the imaging surface to remove laterally conductive deposits therefrom, said abrading brush includes a core defining a core length and having fibers extending outwardly therefrom, said fibers include abrasive particles permanently attached to the end or the entire length of said fibers; and
a power supply for biasing said conductive fibers, said power supply applies an AC bias at a frequency between 100 Hz and 100 kHz and a voltage between 1 kV peak-peak and 5 kV peak-peak.