IP Library Granted Patent US 7,294,571
Granted Patent B2
US 7,294,571 · App. 11/098,371 · Granted Nov 13, 2007

Concave pattern formation method and method for forming semiconductor device

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Quick Facts
Patent No.
US 7,294,571
App. No.
11/098,371
Granted
Nov 13, 2007
Kind
B2
Abstract

A pattern formation method includes the steps of forming a flowable film made of a material with flowability; forming at least one of a concave portion and a convex portion provided on a pressing face of a pressing member onto the flowable film by pressing the pressing member against the flowable film; forming a solidified film by solidifying the flowable film, onto which the at least one of a concave portion and a convex portion has been transferred, through annealing at a first temperature with the pressing member pressed against the flowable film; and forming a pattern made of the solidified film burnt by annealing at a second temperature higher than the first temperature.

Claims (24)

1. A method for forming a semiconductor device comprising the steps of:

forming a flowable film made of an insulating material with flowability;

forming a convex portion provided on a pressing face of a pressing member onto said flowable film by pressing said pressing member against said flowable film;

forming a solidified film by solidifying said flowable film, onto which said convex portion has been transferred, through annealing at a first temperature with said pressing member pressed against said flowable film;

forming a pattern having a concave portion in the shape corresponding to said convex portion and made of said solidified film burnt by annealing at a second temperature higher than said first temperature; and

forming at least one of a metal interconnect and a plug by filling said concave portion with a conductive material.

2. The method for forming a semiconductor device of claim 1 ,

wherein said first temperature is approximately 150° C. through approximately 300° C.

3. The method for forming a semiconductor device of claim 1 ,

wherein said second temperature is approximately 350° C. through approximately 450° C.

4. The method for forming a semiconductor device of claim 1 ,

wherein said material with flowability is a photo-setting resin, and

the step of forming a flowable film includes a sub-step of irradiating said flowable film with light.

5. The method for forming a semiconductor device of claim 1 ,

wherein said material with flowability is an organic material, an inorganic material, an organic-inorganic material, a photo-setting resin or a photosensitive resin.

6. The method for forming a semiconductor device of claim 1 ,

wherein in the step of forming a pattern, said solidified film is annealed at said second temperature with said pressing face pressed against said solidified film.

7. The method for forming a semiconductor device of claim 1 ,

wherein in the step of forming a pattern, said solidified film is annealed at said second temperature with said pressing face moved away from said solidified film.

8. The method for forming a semiconductor device of claim 1 ,

wherein said pattern is a porous film.

9. The method for forming a semiconductor device of claim 1 ,

wherein said pattern has a dielectric constant of approximately 4 or less.

10. The method for forming a semiconductor device of claim 1 , further comprising, after the step of forming a pattern and before the step of forming at least one of a metal interconnect and a plug, a step of removing a portion of said pattern remaining on a bottom of said concave portion by etching.

Assignments (2)
CHANGE OF NAME Recorded Nov 20, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021930/0876 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 5, 2005
From: NAKAGAWA, HIDEO; SASAGO, MASARU; HIRAI, YOSHIHIKO
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 016453/0900 →