Method of manufacturing semiconductor device

1. A method of manufacturing a semiconductor memory device, comprising:

preparing a semiconductor substrate having a gate insulation film and a gate electrode, the gate insulation film being formed on a predetermined active region in the semiconductor substrate, and the gate electrode being formed on the gate insulation film;

forming a first insulation film covering the gate electrode and at least a part of the semiconductor substrate;

charging the first insulation film; and

forming a second insulation film for charge storage on the first insulation film.

2. The method of manufacturing a semiconductor memory device according to claim 1 , wherein

the first insulation film is charged by doping nitrogen atoms therein.

3. The method of manufacturing a semiconductor memory device according to claim 1 , wherein

the first insulation film is charged by doping nitrogen atoms therein by plasma nitridation or annealing in a presence of oxidized nitrogen.

4. The method of manufacturing a semiconductor memory device according to claim 1 , further comprising:

forming a third insulation film on the second insulation film; and

forming sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to third insulation films.

5. A method of manufacturing a semiconductor memory device, comprising:

preparing a semiconductor substrate having a gate insulation film and a gate electrode, the gate insulation film being formed on a predetermined active region in the semiconductor substrate, and the gate electrode being formed on the gate insulation film;

forming a first insulation film covering the gate electrode and at least a part of the semiconductor substrate;

forming a second insulation film for charge storage on the first insulation film;

forming a third insulation film on the second insulation film; and

charging the third insulation film.

6. The method of manufacturing a semiconductor memory device according to claim 5 , wherein

the third insulation film is charged by implanting predetermined ions therein.

7. The method of manufacturing a semiconductor memory device according to claim 6 , wherein

the predetermined ions are argon ions.

8. The method of manufacturing a semiconductor memory device according to claim 5 , further comprising:

forming a sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to third insulation films; and

forming a fourth insulation film covering the gate electrode, the sidewall spacers and at least a part of the semiconductor substrate.

9. The method of manufacturing a semiconductor memory device according to claim 6 , further comprising:

forming a sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to third insulation films; and

forming a fourth insulation film covering the gate electrode, the sidewall spacers and at least a part of the semiconductor substrate.

10. The method of manufacturing a semiconductor memory device according to claim 7 , further comprising:

forming a sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to third insulation films; and

forming a fourth insulation film covering the gate electrode, the sidewall spacers and at least a part of the semiconductor substrate.

11. The method of manufacturing a semiconductor memory device according to claim 5 , wherein

the third insulation film is formed only on flat parts of the second insulation film, the flat parts being parallel with the surface of the semiconductor substrate.

12. The method of manufacturing a semiconductor memory device according to claim 6 , wherein

the third insulation film is formed only on flat parts of the second insulation film, the flat parts being parallel with the surface of the semiconductor substrate.

13. The method of manufacturing a semiconductor memory device according to claim 7 , wherein

the third insulation film is formed only on flat parts of the second insulation film, the flat parts being parallel with the surface of the semiconductor substrate.

14. The method of manufacturing a semiconductor memory device according to claim 11 , further comprising:

forming a fourth insulation film covering the first to third insulation films; and

forming sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to fourth insulation films.

15. The method of manufacturing a semiconductor memory device according to claim 12 , further comprising:

forming a fourth insulation film covering the first to third insulation films; and

forming sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to fourth insulation films.

16. The method of manufacturing a semiconductor memory device according to claim 13 , further comprising:

forming a fourth insulation film covering the first to third insulation films; and

forming sidewall spacers on parts of the semiconductor substrate and continuously on the sides of the gate electrode, respectively, by etching the first to fourth insulation films.