IP Library Granted Patent US 7,554,207
Granted Patent B2
US 7,554,207 · App. 11/295,462 · Granted Jun 30, 2009

Method of forming a lamination film pattern and improved lamination film pattern

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Quick Facts
Patent No.
US 7,554,207
App. No.
11/295,462
Granted
Jun 30, 2009
Kind
B2
Abstract

In a method of forming an electrically conductive lamination pattern, an insulating film is formed on a surface of a chromium-containing bottom layer, before an aluminum-containing top layer is formed over the insulating film, so that the insulating film separates the aluminum-containing top layer from the chromium-containing bottom layer. A first selective wet etching process is carried out for selectively etching the aluminum-containing top layer with a first etchant. A second selective wet etching process is carried out for selectively etching the chromium-containing bottom layer with a second etchant in the presence the insulating film which suppresses a hetero-metal-contact-potential-difference between the chromium-containing bottom layer and the aluminum-containing top layer during the second selective wet etching process.

Claims (12)

1. An electrically conductive lamination pattern structure including:

a chromium-containing bottom layer;

an insulating film extending over a surface of said chromium-containing bottom layer; and

an aluminum-containing top layer extending over said insulating film, so that said insulating film separates said aluminum-containing top layer from said chromium-containing bottom layer,

wherein said aluminum-containing top layer is tapered in cross sectional elevation shape.

2. The structure as claimed in claim 1 , wherein edges of said chromium-containing bottom layer and said insulating film are aligned to or positioned inside of a tapered edge of said aluminum-containing top layer.

3. The structure as claimed in claim 1 , wherein said aluminum-containing top layer has a taper angle of at most approximately 60 degrees.

4. The structure as claimed in claim 1 , wherein said insulating film comprises an oxide film formed by an oxidation process to said surface of said chromium-containing bottom layer.

5. The structure as claimed in claim 1 , wherein said insulating film has a thickness in the range of 5 nanometers to 50 nanometers.

6. The structure as claimed in claim 1 , wherein said chromium-containing bottom layer comprises one of a chromium layer and a chromium alloy layer, and said aluminum-containing top layer comprises one of an aluminum layer or an aluminum alloy layer.

7. The structure as claimed in claim 1 , wherein said electrically conductive lamination pattern structure is formed over a substrate for a liquid crystal display panel.

8. The structure as claimed in claim 7 , wherein said substrate is a thin film transistor substrate for said liquid crystal display panel.

Assignments (4)
SECURITY INTEREST Recorded Jul 14, 2022
From: VISTA PEAK VENTURES, LLC
To: GETNER FOUNDATION LLC
Reel/Frame 060654/0430 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2018
From: GETNER FOUNDATION LLC
To: VISTA PEAK VENTURES, LLC
Reel/Frame 045469/0023 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2011
From: NEC CORPORATION
To: GETNER FOUNDATION LLC
Reel/Frame 026254/0381 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2010
From: NEC LCD TECHNOLOGIES, LTD.
To: NEC CORPORATION
Reel/Frame 024492/0176 →