Delay-locked loop and a method of testing a delay-locked loop
View Patent ↗A delay-locked loop (DLL) of an integrated circuit (IC) with testing circuitry and a method for testing a DLL. During test mode, a phase comparator of the DLL receives a test clock in place of the reference clock and determines the phase difference between the test clock and the clock fed back to the DLL from a clock buffer tree. A variable delay element of the DLL then shifts the reference clock in time by an amount that depends on that phase difference. The variable delay element can be exercised by varying the phase of the test clock with respect to the reference clock by a known phase offset to cause the variable delay element to produce a range of delays. Whether the variable delay element is functioning properly can be determined by checking whether the phase of the test clock is aligned with the phase of the feedback clock.
1. A delay-locked loop (DLL) circuit comprising:
a first DLL; and
a second DLL, wherein the first DLL comprises:
a first phase comparator configured to compare a phase of a first feedback clock with a phase of a second reference clock of the second DLL to determine a first phase difference; and
a first variable delay element configured to receive input relating to the first phase difference determined by the first phase comparator and to delay a first reference clock by an amount that depends on the determined first phase difference;
and wherein the second DLL comprises:
a second phase comparator configured to compare a phase of a second feedback clock with a phase of the first reference clock of the first DLL to determine a second phase difference; and
a second variable delay element configured to receive input relating to the second phase difference determined by the second phase comparator and to delay said second reference clock by an amount that depends on the determined second phase difference.
2. The DLL circuit of claim 1 , wherein the first reference clock has an end coupled to an input/output (I/O) pad of the IC.
3. The DLL circuit of claim 2 , wherein the second reference clock has an end coupled to an input/output (I/O) pad of the IC.
4. The DLL circuit of claim 1 , further comprising:
a first selector switch having a first input that receives the first reference clock, a second input that receives the second reference clock and an output coupled to a first input of the first variable phase comparator; and
a second selector switch having a first input that receives the second reference clock, a second input that receives the first reference clock and an output coupled to a first input of the second variable phase comparator.
5. The DLL circuit of claim 4 , wherein the first phase comparator has a second input that receives a first feedback clock, and wherein during a normal operation mode, the first selector switch selects the first reference clock and the first phase comparator compares the first reference clock with the first feedback clock and determines a third phase difference between the first reference clock and the first feedback clock, and wherein during a test mode, the first selector switch selects the second reference clock and the first phase comparator compares the second reference clock with the first feedback dock and determines said first phase difference, and wherein during the normal operation mode, the first variable delay element delays the first reference clock by an amount that depends on said third phase difference, and wherein during the test mode, the first variable delay element delays the first reference clock by an amount that depends on said first phase difference.
6. The DLL circuit of claim 4 , wherein the second phase comparator has a second input that receives a second feedback clock, and wherein during a normal operation mode, the second selector switch selects the second reference clock and the second phase comparator compares the second reference clock with the second feedback clock and determines a fourth phase difference between the second reference clock and the second feedback clock, and wherein during a test mode, the second selector switch selects the first reference clock and the second phase comparator compares the first reference clock with the second feedback clock and determines said second phase difference, and wherein during the normal operation mode, the second variable delay element delays the second reference clock by an amount that depends on said fourth phase difference, and wherein during the test mode, the second variable delay element delays the second reference clock by an amount that depends on said second phase difference.