Semiconductor integrated circuit device

1. A semiconductor integrated circuit device, comprising:

a plurality of sets of output circuits each of which varies an output impedance in accordance with a first impedance code;

a first impedance control circuit which generates the first impedance code in association with a first resistive element connected to a first external terminal and includes an first encoder which coverts the first impedance code to serial data;

a plurality of sets of terminating circuits each of which varies a terminal impedance in accordance with a second impedance code;

a second impedance control circuit which generates the second impedance code in association with a second resistive element connected to a second external terminal and which includes a second encoder which converts the second impedance code to serial data; and

a third external terminal (DQ) which is coupled both of the plurality of sets of output circuits and the plurality of sets of terminating circuits,

wherein each of the plurality of sets of output circuits includes a decoder which reproduces the first impedance code in response to the serial data,

wherein the plurality of sets of terminating circuits respectively include decoders each of which reproduces the second impedance code in response to the serial data,

wherein the each of the plurality of sets of output circuits are enable and the plurality of sets of terminating circuits are disable while output data is outputting, and

wherein the each of the plurality of sets of output circuits are disable and the plurality of sets of terminating circuits are enable while input data is inputting.

2. A semiconductor integrated circuit device according to claim 1 ,

wherein the first impedance control circuit comprises:

a first impedance comparator that includes replica circuits having an impedance equivalent to the first resistive element and each of the output circuits, and which performs an impedance comparison with each of the replica circuits to form a first signal that increases the output impedance and a second signal that decreases the output impedance; and

A first counter which increases a count value in response to the first signal and decreases the count value in response to the second signal to generate the impedance code.

3. A semiconductor integrated circuit device according to claim 2 ,

wherein each of the output circuits is capable of controlling a through rate in accordance with a through rate code.

4. A semiconductor integrated circuit device according to claim 1 ,

wherein the plurality of sets of output circuits include latches respectively, and

wherein capturing of the first impedance code is performed by each of the latches in accordance with a clock pulse, and wherein controls on output impedances of the respective output circuits are performed synchronously with one another.

5. A semiconductor integrated circuit device according to claim 1 ,

wherein, the second impedance control circuit comprises:

a second impedance comparator having replica circuits of an impedance substantially equivalent to the second resistive element and each of the terminating circuits, and which performs an impedance comparison with each of the replica circuits to form a third signal that increases the terminal impedance and a fourth signal that decreases the terminal impedance; and

a second counter which increases a count value in response to the third signal and decreases the count value in response to the fourth signal to generate the second impedance code.

6. A semiconductor integrated circuit device according to claim 1 ,

wherein the plurality of sets of terminating circuits include latches respectively, and capturing of the second impedance code is performed by each of the latches in accordance with a clock pulse, and

wherein controls on impedances of the respective terminating circuits are performed synchronously.