INTEGRATED CIRCUIT WITH A TRUE RANDOM NUMBER GENERATOR
An integrated circuit ( 1 . . . 1′″, 1 a . . . I c) with a true random number generator ( 2 . . . 2 ′″), which true random number generator ( 2 . . . 2 ″) comprises at least one instable physically uncloneable function ( 3 . . . 3′″, 3 a, 3 a ′) for generating true random numbers ( 8 ). Hence, each device of a group of devices can be provided with a unique true random generator, so that each device of the group is provided with different true random numbers even when said devices are applied to identical environmental conditions. Such a random number generator ( 2 . . . 2 ′″) may be part of a smart card as well as of a module for near field communication, for example.
1 . An integrated circuit with a true random number generator which true random number generator comprises at least one instable physically uncloneable function for generating true random numbers
2 . An integrated circuit as claimed in claim 1 , wherein the integrated circuit comprises means for measuring a physical property of the physically uncloneable function.
3 . An integrated circuit as claimed in claim 1 , wherein the integrated circuit comprises a signal generator connected with the physically uncloneable function for challenging the physically uncloneable function with an input signal
4 . An integrated circuit as claimed in claim 1 , wherein the integrated circuit comprises a pseudo random number generator cooperating with the physically uncloneable function in such a way that an output signal of the physically uncloneable function or values measured by means of the measurement means are used as a seed for the pseudo random number generator
5 . An integrated circuit as claimed in claim 1 , wherein the physically uncloneable function is realized by means of a porous dielectric material which is arranged between at least two electrodes
6 . An integrated circuit as claimed in claim 1 , wherein the physically uncloneable function is realized by means of a photosensitive semiconductor material.
7 . An integrated circuit as claimed in claim 1 , wherein the physically uncloneable function is realized by means of a metal with an electric resistance depending on temperature.
8 . An integrated circuit as claimed in claim 2 , wherein the measurement means are arranged to measure an inductance and/or capacitance of the physically uncloneable function
9 . An integrated circuit as claimed in claim 2 ,
wherein the physically uncloneable function is realized by means of at least one electric circuit and the measurement means are arranged to measure a runtime delay of signals of the at least one electric circuit.
10 . An integrated circuit as claimed in claim 3 wherein the signal generator is capable of applying a first mechanical vibration as the input signal for the physically uncloneable function so as to cause a second mechanical vibration as the output signal of the physically uncloneable function.
11 . Use of an instable physically uncloneable function embedded in an integrated circuit to generate a random number