Patent Application
Utility
App. No. 11/623,343
· Confirmation No. 4679
FABRICATION METHOD OF SEMICONDUCTOR DEVICE
Inventor:
Hiroshi Tanaka
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
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| 2010-02-26 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2008-10-01 | ISSUE.NTF |
Issue Notification | 1 | View | |
| 2008-09-10 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2008-09-10 | WFEE |
Fee Worksheet (SB06) | 2 | View | |
| 2008-09-10 | N417 |
Electronic Filing System Acknowledgment Receipt | 2 | View | |
| 2008-07-16 | INTRVIEW.APP |
Applicant summary of interview with examiner | 2 | View | |
| 2008-07-16 | N417 |
Electronic Filing System Acknowledgment Receipt | 2 | View | |
| 2008-06-16 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2008-06-16 | EXIN |
Examiner Interview Summary Record (PTOL - 413) | 1 | View | |
| 2008-06-16 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2008-06-16 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2008-06-16 | BIB |
Bibliographic Data Sheet | 1 | View | |
| 2008-06-16 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2008-06-16 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2008-04-30 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2008-04-30 | CLM |
Claims | 2 | View | |
| 2008-04-30 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2008-04-30 | N417 |
Electronic Filing System Acknowledgment Receipt | 2 | View | |
| 2008-04-30 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2008-01-30 | CTNF |
Non-Final Rejection | 10 | View | |
| 2008-01-30 | 892 |
List of references cited by examiner | 1 | View | |
| 2008-01-30 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2008-01-30 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2008-01-30 | BIB |
Bibliographic Data Sheet | 1 | View | |
| 2008-01-24 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2007-07-19 | NTC.PUB |
Notice of Publication | 1 | View | |
| 2007-02-08 | APP.FILE.REC |
Filing Receipt | 3 | View | |
| 2007-02-01 | FRPR |
Certified Copy of Foreign Priority Application | 73 | View | |
| 2007-01-16 | TRNA |
Transmittal of New Application | 2 | View | |
| 2007-01-16 | SPEC |
Specification | 132 | View | |
| 2007-01-16 | CLM |
Claims | 8 | View | |
| 2007-01-16 | ABST |
Abstract | 1 | View | |
| 2007-01-16 | DRW |
Drawings-only black and white line drawings | 25 | View | |
| 2007-01-16 | OATH |
Oath or Declaration filed | 3 | View | |
| 2007-01-16 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2007-01-16 | FOR |
Foreign Reference | 8 | View | |
| 2007-01-16 | FOR |
Foreign Reference | 11 | View | |
| 2007-01-16 | FOR |
Foreign Reference | 17 | View | |
| 2007-01-16 | FOR |
Foreign Reference | 9 | View | |
| 2007-01-16 | WFEE |
Fee Worksheet (SB06) | 2 | View | |
| 2007-01-16 | N417 |
Electronic Filing System Acknowledgment Receipt | 3 | View | |
| 2007-01-16 | 136A |
Authorization for Extension of Time all replies | 2 | View | |
| 2007-01-16 | WFEE |
Fee Worksheet (SB06) | 1 | View |
Inventors
Hiroshi Tanaka
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/756
H10P10/00
H10P50/283
H10D64/021
H10P50/00
Prosecution
Foreign Priority
2006-7667
·
2006-01-16
·
JAPAN
Publication
- Pub. No.
- US20070167012A1
- Pub. Date
- 2007-07-19
Patent Term Adjustment
0days
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