IP Library Granted Patent US 8,344,740
Granted Patent B2
US 8,344,740 · App. 11/718,218 · Granted Jan 1, 2013

System for diagnosing impedances having accurate current source and accurate voltage level-shift

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Quick Facts
Patent No.
US 8,344,740
App. No.
11/718,218
Granted
Jan 1, 2013
Kind
B2
Abstract

The present invention relates to a system for measuring a capacitor (C). A current source ( 12 ) is connected in parallel to the capacitor (C) between a supply plane (Vc) and ground (VGND) for providing a current to the capacitor (C). A voltage level-shift is connected between the supply plane (Vc) and the ground (VGND) in parallel to the capacitor (C) and in parallel to the current source (I 2 ). The voltage level-shift senses a voltage across the electronic component (C) and provides a level-shifted output voltage V out in dependence thereupon. The voltage level-shift comprises a resistor (R I ) connected in series with a current source (II) and an output port interposed between the resistor (RI) and the current source (II). The current sources (I,) and ( 12 ) have opposite temperature coefficients such that the current provided to the electronic component is substantially constant.

Claims (52)

1. A system for measuring impedance of an electronic component comprising:

a temperature compensated current source (I) connected in parallel to the electronic component (C) between a supply plane (V C ) and ground (V GND ) for providing a predetermined substantially constant current to the electronic component (C); and,

a temperature compensated voltage level-shift connected between the supply plane (V C ) and the ground (V GND ) in parallel to the electronic component for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V out in dependence thereupon;

wherein the temperature compensated voltage level-shift comprises at least a resistor (R 1 ) connected in series with a current source (I 1 ) and an output port interposed between the at least a resistor (R 1 ) and the current source (I 1 ); and

wherein the at least a resistor (R 1 ) comprises two resistors having opposite temperature coefficients.

2. A system for measuring impedance of an electronic component as defined in claim 1 wherein the temperature compensated current source (I) and the temperature compensated voltage level-shift are connected in series.

3. A system for measuring impedance of an electronic component as defined in claim 1 , wherein the electronic component (C) comprises a capacitor.

4. A system for measuring impedance of an electronic component as defined in claim 1 , wherein the electronic component (C) comprises a storage capacitor of an airbag system.

5. A system for measuring impedance of an electronic component as defined in claim 1 , comprising compensation circuitry connected in parallel to the temperature compensated voltage level-shift for providing a current being a difference between the currents provided by the current sources (I) and (I 1 ).

6. A system for measuring impedance of an electronic component as defined in claim 5 , wherein the compensation circuitry comprises a cascode.

7. A system for measuring impedance of an electronic component comprising:

a current source (I 2 ) connected in parallel to the electronic component (C) between a supply plane (V C ) and ground (V GND ) for providing a current to the electronic component (C); and,

a voltage level-shift connected between the supply plane (V C ) and the ground (V GND ) in parallel to the electronic component (C) and in parallel to the current source (I 2 ), the voltage level-shift for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V out in dependence thereupon, the voltage level-shift comprising:

at least a resistor (R 1 ) connected in series with a current source (I 1 ) and

an output port interposed between the at least a resistor (R 1 ) and the current source (I 1 ), the current sources (I 1 ) and (I 2 ) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant;

wherein the voltage level-shift comprises a V-I converter for providing a current in dependence upon a resistance of a reference resistor (R REF1 ) and a reference voltage V REF1 across the reference resistor (R REF1 ).

8. A system for measuring impedance of an electronic component as defined in claim 7 wherein the V-I converter comprises a transistor and an amplifier connected to the base of the transistor.

9. A system for measuring impedance of an electronic component as defined in claim 7 , wherein the current source (I 2 ) comprises a V-I converter.

10. A system for measuring impedance of an electronic component as defined in claim 7 , wherein the current source (I 2 ) comprises a PTAT current source.

11. A system for measuring impedance of an electronic component as defined in claim 7 , wherein the electronic component (C) comprises a capacitor.

12. A system for measuring impedance of an electronic component as defined in claim 7 , wherein the electronic component (C) comprises a storage capacitor of an airbag system.

13. A system for measuring impedance of an electronic component as defined in claim 7 , further comprising:

a start comparator (CO 1 ) in communication with the output port,

a start reference voltage source (V REF3 ), and

a counter, for comparing the output voltage V out with the start reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter; and,

a stop comparator (CO 2 ) in communication with the output port,

a stop reference voltage source (V REF4 ), and the counter, for comparing the output voltage V out with the stop reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter.

14. A system for measuring impedance of an electronic component as defined in claim 13 comprising a digital clock in communication with the counter for determining a time interval between start and stop of the counter.

15. A system for measuring impedance of an electronic component comprising:

a current source (I 2 ) connected in parallel to the electronic component (C) between a supply plane (V C ) and ground (V GND ) for providing a current to the electronic component (C); and,

a voltage level-shift connected between the supply plane (V C ) and the ground (V GND ) in parallel to the electronic component (C) and in parallel to the current source (I 2 ), the voltage level-shift for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V out in dependence thereupon, the voltage level-shift comprising:

at least a resistor (R 1 ) connected in series with a current source (I 1 ) and

an output port interposed between the at least a resistor (R 1 ) and the current source (I 1 ), the current sources (I 1 ) and (I 2 ) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant;

wherein the current source (I 2 ) comprises a V-I converter.

16. A system for measuring impedance of an electronic component comprising:

a current source (I 2 ) connected in parallel to the electronic component (C) between a supply plane (V C ) and ground (V GND ) for providing a current to the electronic component (C); and,

a voltage level-shift connected between the supply plane (V C ) and the ground (V GND ) in parallel to the electronic component (C) and in parallel to the current source (I 2 ), the voltage level-shift for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V out in dependence thereupon, the voltage level-shift comprising:

at least a resistor (R 1 ) connected in series with a current source (I 1 ) and

an output port interposed between the at least a resistor (R 1 ) and the current source (I 1 ), the current sources (I 1 ) and (I 2 ) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant;

further comprising:

a start comparator (CO 1 ) in communication with the output port,

a start reference voltage source (V REF3 ), and

a counter, for comparing the output voltage V out with the start reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter; and,

a stop comparator (CO 2 ) in communication with the output port,

a stop reference voltage source (V REF4 ), and the counter, for comparing the output voltage V out with the stop reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter.

17. A system for measuring impedance of an electronic component as defined in claim 16 comprising a digital clock in communication with the counter for determining a time interval between start and stop of the counter.

18. A system for measuring impedance of an electronic component comprising:

a current source (I 2 ) connected in parallel to the electronic component (C) between a supply plane (V C ) and ground (V GND ) for providing a current to the electronic component (C); and,

a voltage level-shift connected between the supply plane (V C ) and the ground (V GND ) in parallel to the electronic component (C) and in parallel to the current source (I 2 ), the voltage level-shift for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V out in dependence thereupon, the voltage level-shift comprising:

at least a resistor (R 1 ) connected in series with a current source (I 1 ) and

an output port interposed between the at least a resistor (R 1 ) and the current source (I 1 ), the current sources (I 1 ) and (I 2 ) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant;

wherein the current source (I 2 ) comprises a PTAT current source.

Assignments (12)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY DATA NXP, B.V. HIGH TECH CAMPUS 60 EINDHOVEN, NL 56546 AG PREVIOUSLY RECORDED ON REEL 022393 FRAME 0168. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNEE: KONINKLIJKE PHILIPS ELECTRONICS N.V. GROENEWOUDSEWEG 1, 5621 BA EINDHOVEN, NL IS THE PROPER ASSIGNEE. Recorded Nov 21, 2012
From: DE LANGEN, KLAAS-JAN; WITTE, JOHAN
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 029341/0464 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 13, 2009
From: DE LANGEN, KLAAS-JAN; WITTE, JOHAN
To: NXP B.V.
Reel/Frame 022393/0168 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2007
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 019719/0843 →