IP Library › Granted Patent US 7,426,663
Granted Patent Utility
US 7,426,663 · Confirmation No. 1734

SEMICONDUCTOR INTEGRATED CIRCUIT AND TESTING METHOD THEREOF

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2008-06-20 BIB Bibliographic Data Sheet 1 View
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2008-04-28 DISQ Terminal Disclaimer review decision 1 View
2008-03-28 A... Amendment/Request for Reconsideration-After Non-Final Rejection 1 View
2008-03-28 CLM Claims 2 View
2008-03-28 REM Applicant Arguments/Remarks Made in an Amendment 2 View
2008-03-28 DIST Terminal Disclaimer Filed 2 View
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2007-11-01 CTNF Non-Final Rejection 6 View
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2007-10-29 SRNT Examiner's search strategy and results 5 View
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2007-04-16 WFEE Fee Worksheet (SB06) 1 View
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2007-04-16 SPEC Specification 52 View
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Quick Facts
Patent No.
US 7,426,663
App. No.
11/785,213
Filed
2007-04-16
Granted
2008-09-16
Pub. No.
US20070198880A1
Art Unit
2117
PTA
-56 days