IP Library Granted Patent US 8,014,975
Granted Patent B2
US 8,014,975 · App. 11/904,640 · Granted Sep 6, 2011

FTIR and EDX spectrum library of contaminants found on a HDD and their potential sources

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Quick Facts
Patent No.
US 8,014,975
App. No.
11/904,640
Granted
Sep 6, 2011
Kind
B2
Abstract

A data collection for utilization in failure analysis. The data collection includes a material data set including information associated with materials used in a component subject to a failure analysis process. The data collection also includes a source data set including information associated with the sources of the materials. The data collection further includes an image data set including graphical representations of the materials. The data collection is for providing identification of the composition of the contaminant and source of the contaminant.

Claims (44)

1. A computer-implemented data collection for utilization in a physical contaminant failure analysis, said computer-implemented data collection comprising:

a material data set comprising information, stored in a data storage device of a computer system, associated with materials used in a component subject to a physical contaminant failure analysis process;

a source data set comprising information, stored in said data storage device of said computer system, associated with sources of said materials; and

an image data set, stored in said data storage device of said computer system, said image data set comprising graphical representations of said materials, said computer-implemented data collection for providing identification of said physical contaminant and a source of said physical contaminant.

2. The data collection as recited in claim 1 wherein said material data set further comprises an identifier for each material in said materials.

3. The data collection as recited in claim 1 wherein said material data set further comprises a description for each material in said materials.

4. The data collection as recited in claim 1 wherein said source data set further comprises process categorization and process information related to each material in said materials.

5. The data collection as recited in claim 1 wherein said graphical representations further comprise:

a transformed waveshape representing composition of each material in said materials.

6. The data collection as recited in claim 5 wherein said transformed waveshape comprises a Fourier Transformation performed on absorbed light applied on each material in said materials.

7. The data collection as recited in claim 5 wherein said transformed waveshape comprises an energy dispersive x-ray performed on absorbed light applied on each material in said materials.

8. A system for identification of a source of a physical contaminant, said system comprising:

means for transforming a generated image into a waveshape representative of composition of said physical contaminant;

means for accessing a material data set, said material data set comprising information associated with materials used in said component subject to a failure analysis process;

means for accessing a source data set, said source data set comprising information associated with sources of said materials;

means for comparing said waveshape with said information of said stored data collection;

means for identifying a source of said physical contaminant from said information of said data collection; and

means for storing said material data set and said source data set in a data storage device.

9. The system as recited in claim 8 wherein said means for accessing a stored data collection further comprises;

means for accessing an image data set, said image data set comprising waveshape representations of said materials.

10. The system as recited in claim 8 further comprising:

means for generating a transformed waveshape image representing each material associated with said component.

11. The system as recited in claim 10 wherein said means for generating a transformed waveshape further comprises:

means for performing a Fourier Transformation to achieve said transformed waveshape.

12. The system as recited in claim 10 wherein said means for generating a transformed waveshape further comprises:

means for performing an energy dispersive x-ray to achieve said transformed waveshape.

13. A computer-implemented method for physical contaminant source determination, said computer-implemented method comprising:

generating, using a computer system, a waveshape image representing a physical contaminant associated with a component in a failure analysis process;

comparing, using a computer system, said waveshape image with a computer-implemented data collection, said computer-implemented data collection comprising:

a material data set comprising information, stored in a data storage device of a computer system, associated with materials used in said component subject to said failure analysis process;

a source data set comprising information, stored in a data storage device of a computer system, associated with sources of said materials;

an image data set comprising transformed waveshape representations, stored in a data storage device of a computer system, of said materials associated with implementation of said component;

determining, using a computer system, a composition of said physical contaminant; and

determining, using a computer system, a source of said physical contaminant.

14. The method as recited in claim 13 further comprising:

performing a spectroscopic transformation of a generated image to achieve said waveshape image and said transformed waveshape representations.

15. The method as recited in claim 14 wherein said performing a spectroscopic transformation further comprises:

performing a Fourier Transformation to achieve said analyzable waveshape image and said transformed waveshape representation.

16. The method as recited in claim 14 wherein said performing a spectroscopic transformation further comprises:

performing an energy dispersive x-ray transformation to achieve said analyzable waveshape image and said transformed waveshape representation.

17. The method as recited in claim 13 further comprising;

matching said waveshape image to a transformed waveshape representation of said transformed waveshape representations to identify composition of said physical contaminant.

18. The method as recited in claim 13 further comprising:

adding said waveshape image to said transformed waveshape representations upon determination of said waveshape image not matching a transformed waveshape representation of said transformed waveshape representations.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040821/0550 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2007
From: ATIENZA, GENEVIEVE R.; CABALO, MICHELE; CAPUYAN-AGTINA, SHARON; DE GUZMAN-AGUIRRE, MAY A.; DEL ROSARIO, SHARON; VELACION, JAMIE
To: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
Reel/Frame 020068/0766 →