Duty cycle distortion (DCD) jitter modeling, calibration and generation methods
View Patent ↗A method and system for modeling and calibrating duty cycle distortion (DCD) of a Serializer and Deserializer (SerDes) device, including first generating a clock DCD signal. Once the clock DCD signal is generated, it is calibrating based upon results obtained from a filtering process of the clock DCD signal. Once the clock DCD signal is calibrated, a data DCD signal is generated and calibrated based upon results obtained from a filtering process of the data DCD signal.
1. A method of modeling and calibrating duty cycle distortion (DCD) of a Serializer and Deserializer (SerDes) device, the method comprising the steps of:
generating a clock DCD signal, wherein said clock DCD signal controls a duty cycle distortion of a differential clock signal;
calibrating said clock DCD signal based upon results from filtering said differential clock signal;
generating a data DCD signal, wherein said data DCD signal controls a duty cycle distortion of a differential data signal; and
calibrating said data DCD signal based upon results from filtering said differential data signal.
2. The method of claim 1 , further comprising the step of:
combining said calibrated clock DCD signal and said data DCD signal into a combined DCD signal.
3. The method of claim 2 , further comprising the step of:
calibrating said SerDes device by monitoring said SerDes device's response to said combined DCD signal.
4. The method of claim 3 , wherein said calibrating said SerDes device is incorporated into a set of automatic tests for said SerDes device.
5. The method of claim 4 , wherein said set of automatic tests are performed via an on-board, on-chip, or on-tester testing circuit.
6. The method of claim 1 wherein said two calibration steps are performed independently of each other.
7. The method of claim 1 , wherein said SerDes device is a serial data communication device.
8. An apparatus for modeling and calibrating duty cycle distortion (DCD) of a Serializer and Deserializer (SerDes) device, the apparatus comprising:
a clock source for generating a clock DCD signal, wherein said clock DCD signal controls a duty cycle distortion of a differential clock signal;
a data source for generating a data DCD signal, wherein said data DCD signal controls a duty cycle distortion of a differential data signal; and
a calibration circuit for calibrating both said clock DCD signal based upon results from filtering said differential clock signal and calibrating said data DCD signal based upon results from filtering said differential data signal.
9. The apparatus of claim 8 , further comprising:
a combiner for combining said calibrated clock DCD signal and said data DCD signal into a combined DCD signal.
10. The apparatus of claim 9 , further comprising:
a controller for calibrating said SerDes device by monitoring said SerDes device's response to said combined DCD signal.
11. The apparatus of claim 10 , wherein said apparatus performs said calibrating said SerDes device in a set of automatic tests for said SerDes device.
12. The apparatus of claim 11 , wherein said set of automatic tests are performed via an on-board, on-chip, or on-tester testing circuit.
13. The apparatus of claim 8 wherein said calibration circuit performs calibrating said clock DCD signal and said calibrating said data DCD signal independently of each other.
14. The apparatus of claim 8 , wherein said SerDes device is a serial data communication device.