IP Library Granted Patent US 8,338,930
Granted Patent B2
US 8,338,930 · App. 12/210,648 · Granted Dec 25, 2012

Integrated circuit with electromagnetic intrachip communication and methods for use therewith

Assignee: Broadcom Corporation
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,338,930
App. No.
12/210,648
Granted
Dec 25, 2012
Kind
B2
Abstract

An integrated circuit includes a substrate and a first integrated circuit die having a first circuit coupled to the substrate via a first bonding wire, the first circuit having a first intra-chip interface. A second integrated circuit die has a second circuit coupled to the substrate via a second bonding wire, the second circuit having a second intra-chip interface, the second bonding wire electrically isolated from the first bonding wire. The first circuit communicates with the second circuit via the first intra-chip interface and the second intra-chip interface, and wherein the first intra-chip interface and the second intra-chip interface communicate via a first electromagnetic coupling between the first bonding wire and the second bonding wire.

Claims (35)

1. An integrated circuit comprising:

a substrate;

a first integrated circuit die having a first circuit coupled to a first bonding pad on the substrate via a first bonding wire, the first circuit having a first intra-chip interface; and

a second integrated circuit die having a second circuit coupled to a second bonding pad on the substrate via a second bonding wire, the second circuit having a second intra-chip interface, the second bonding wire electrically isolated from the first bonding wire;

wherein the first circuit communicates with the second circuit via the first intra-chip interface and the second intra-chip interface, and wherein the first intra-chip interface and the second intra-chip interface communicate via a first electromagnetic coupling between the first bonding wire and the second bonding wire.

2. The integrated circuit of claim 1 wherein the first electromagnetic coupling includes an inductive coupling between the first bonding wire and the second bonding wire.

3. The integrated circuit of claim 1 wherein the first electromagnetic coupling includes a capacitive coupling between the first bonding wire and the second bonding wire.

4. The integrated circuit of claim 1 wherein the first electromagnetic coupling includes an RF millimeter wave coupling between the first bonding wire and the second bonding wire.

5. The integrated circuit of claim 1 wherein the first intra-chip interface and the second intra-chip interface, in a first mode of operation, communicate via an RF millimeter wave coupling between the first bonding wire and the second bonding wire; and

wherein the first intra-chip interface and the second intra-chip interface, in a second mode of operation, communicate via a capacitive coupling between the first bonding wire and the second bonding wire.

6. The integrated circuit of claim 5 wherein the first electromagnetic coupling includes an RF millimeter wave coupling between the first bonding wire and the second bonding wire and wherein the first intra-chip interface initiates a first trial communication via the first mode of operation and a second trial communication via the second mode of operation and selects one of: the first mode of operation, and the second mode of operation, based on first results of the first trial communication and second results of the second trial communication.

7. The integrated circuit of claim 1 further comprising:

an inductive coupling between the first bonding wire and the second bonding wire;

wherein the first intra-chip interface and the second intra-chip interface, in a first mode of operation, communicate via the inductive coupling between the first bonding wire and the second bonding wire.

8. The integrated circuit of claim 7 a capacitive coupling between the first bonding wire and the second bonding wire;

wherein the first intra-chip interface and the second intra-chip interface, in a second mode of operation, communicate via the capacitive coupling between the first bonding wire and the second bonding wire;

wherein the first intra-chip interface initiates a first trial communication via the first mode of operation and a second trial communication via the second mode of operation and selects one of: the first mode of operation, and the second mode of operation, based on first results of the first trial communication and second results of the second trial communication.

9. The integrated circuit of claim 1 further comprising:

an inductive coupling between the first bonding wire and the second bonding wire; and

wherein the first intra-chip interface and the second intra-chip interface, in a first mode of operation, communicate via an inductive coupling between the first bonding wire and the second bonding wire.

10. The integrated circuit of claim 9 further comprising an RF millimeter wave coupling between the first bonding wire and the second bonding wire;

wherein the first intra-chip interface and the second intra-chip interface, in a second mode of operation, communicate via an RF millimeter wave coupling between the first bonding wire and the second bonding wire;

wherein the first intra-chip interface initiates a first trial communication via the first mode of operation and a second trial communication via the second mode of operation and selects one of: the first mode of operation, and the second mode of operation, based on first results of the first trial communication and second results of the second trial communication.

11. The integrated circuit of claim 1 wherein the substrate includes a first substrate bonding pad and a second substrate bonding pad;

wherein the first circuit includes a first circuit bonding pad;

wherein the second circuit includes a second circuit bonding pad;

wherein the first bonding wire connects the first substrate bonding pad to the first circuit bonding pad; and

wherein the second bonding wire connects the second substrate bonding pad to the second circuit bonding pad.

12. The integrated circuit of claim 1 wherein the first integrated circuit die is stacked on the second integrated circuit die.

13. The integrated circuit of claim 1 wherein the first circuit is further coupled to the substrate via a third bonding wire, and wherein the first circuit includes a third intra-chip interface; and

wherein the second circuit is further coupled to the substrate via a fourth bonding wire, and wherein the second circuit includes a fourth intra-chip interface, the fourth bonding wire electrically isolated from the third bonding wire;

wherein the first circuit further communicates with the second circuit via the third intra-chip interface and the fourth intra-chip interface, and wherein the first intra-chip interface and the second intra-chip interface communicate via a second electromagnetic coupling between the third bonding wire and the fourth bonding wire.

14. The integrated circuit of claim 13 wherein the first electromagnetic coupling is via one of: an inductive coupling, a capacitive coupling, and a millimeter wave RF coupling;

wherein the second electromagnetic coupling is via one of: an inductive coupling, a capacitive coupling, and a millimeter wave RF coupling; and

wherein the first electromagnetic coupling differs from the second electromagnetic coupling.

Assignments (7)
MERGER AND CHANGE OF NAME Recorded May 22, 2017
From: FREESCALE SEMICONDUCTOR, INC.; NXP USA, INC.
To: NXP USA, INC.
Reel/Frame 042525/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ADD OMITTED PAGE 6 OF 22 TO THE ASSIGNMENT AGREEMENT PREVIOUSLY RECORDED AT REEL: 040569 FRAME: 0572. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 28, 2017
From: BROADCOM CORPORATION
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 042108/0597 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2016
From: BROADCOM CORPORATION
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040569/0572 →
RELEASE OF SECURITY INTEREST Recorded Sep 30, 2016
From: BANK OF AMERICA N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 040192/0701 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2008
From: ROFOUGARAN, AHMADREZA (REZA)
To: BROADCOM CORPORATION
Reel/Frame 021544/0778 →
Continuity (3)
Continuation In Part 11648826 · Dec 29, 2006
Continuation In Part 11472205 · Jun 21, 2006
Related Publication 20090015353A1 · Jan 15, 2009