IP Library Patent Application 12508140
Patent Application
App. No. 12/508,140

LASER CLEANING APPARATUS AND LASER CLEANING METHOD

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Quick Facts
Patent No.
US None
App. No.
12/508,140
Abstract

A probe cleaning apparatus includes a cleaning-conditions database. The probe cleaning apparatus removes contamination from a probe by irradiating the probe by a laser beam, refers to the cleaning-conditions database based on information about the probe, such as material and shape, and controls properties of the laser beam, such as output intensity, pulse interval, wavelength, and pulse width, so that the probe cleaning apparatus removes the contamination from the probe without damaging the probe by heat.

Claims (19)

1 . A laser cleaning apparatus comprising:

a laser-beam emitting unit that emits a laser beam to irradiate an object so that contamination is removed from a surface of the object; and

an irradiation control unit that controls irradiation by the laser beam based on information about the object so that an effect of the irradiation on the object is limited.

2 . The laser cleaning apparatus according to claim 1 , wherein

the laser-beam emitting unit repeatedly emits a pulsed laser beam; and

the irradiation control unit controls at least one of pulse width, output intensity, wavelength, number of pulses, and pulse interval of the laser beam.

3 . The laser cleaning apparatus according to claim 2 , wherein the irradiation control unit sets the pulse width less than 10 nanoseconds.

4 . The laser cleaning apparatus according to claim 2 , wherein the irradiation control unit gradually increases the pulse interval.

5 . The laser cleaning apparatus according to claim 1 , wherein the irradiation control unit controls the irradiation by the laser beam in such a manner that temperature of the object is maintained below a melting point.

6 . The laser cleaning apparatus according to claim 1 , further comprising a checking unit that checks a result of the irradiation by the laser beam, wherein

the irradiation control unit controls the irradiation by the laser beam based on a result of checking by the check unit.

7 . The laser cleaning apparatus according to claim 1 , wherein the irradiation control unit controls the irradiation by the laser beam based on material and shape of the object.

8 . The laser cleaning apparatus according to claim 1 , wherein the irradiation control unit controls the irradiation by the laser beam based on information about the contamination.

9 . The laser cleaning apparatus according to claim 1 , further comprising a cooling unit that cools the object.

10 . The laser cleaning apparatus according to claim 1 , wherein the object is a needle-shaped test probe that is used in a test for electrical characteristics of a test object, wherein a tip of the test probe is in contact with the test object in the test.

11 . A laser cleaning method for removing contamination from a surface of an object by irradiating the object with a laser beam, the laser cleaning method comprising:

acquiring information about the object;

controlling irradiation of the laser beam based on the acquired information about the object so that an effect of laser cleaning on the object is limited; and

irradiating the object using the laser beam based on the controlled irradiation by the controlling.

Assignments (2)
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2009
From: TOKURA, FUMIHIKO; KIKUCHI, KATSUHIKO; AKASAKI, YUJI
To: FUJITSU LIMITED; FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 023002/0593 →