IP Library Granted Patent US 8,089,713
Granted Patent B2
US 8,089,713 · App. 12/731,381 · Granted Jan 3, 2012

Detection of hard-disc defect regions using soft decisions

Assignee: LSI Corporation
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Quick Facts
Patent No.
US 8,089,713
App. No.
12/731,381
Granted
Jan 3, 2012
Kind
B2
Abstract

In a hard-disc drive, a defect region on the hard disc is detected by generating two statistical measures (e.g., β 1 (k) and β 2 (k)) based on signal values (e.g., x[n] or y[n]) and soft-decision values (e.g., L[n]) corresponding to the signal values. The measures are compared to detect the location of the defect region of the hard drive. Using the soft-decision values reduces fluctuations in a ratio of the statistical measures compared to a ratio formed from statistical measures that are not based on soft-decision values, resulting in a more-reliable test for detecting defect regions.

Claims (55)

1. A machine-implemented method for detecting a defect region on a hard drive, the method comprising:

(a) the machine generating a first measure based on signal values, x[n] y[n] expected signal values corresponding to the signal values, and soft-decision values L[n] corresponding to the signal values;

(b) the machine generating a second measure based on expected signal values and defect-free soft-decision values corresponding to only defect-free regions of the hard drive;

(c) the machine comparing the first and second measures; and

(d) the machine detecting the defect region based on the comparison of step (c).

2. The invention of claim 1 , wherein:

the first measure is based on a moving average of products of (i) the signal values, (ii) the expected signal values, and (iii) magnitudes of the soft-decision values; and

the second measure is based on a moving average of products of (i) squares of the expected signal values and (ii) expectation values of the magnitudes of the defect-free soft-decision values.

3. The invention of claim 2 , wherein:

the first measure β 1 (k) is given by:

β 1 ( k )=Σ i=0 M−1 y[k−i]ŷ[k−i ]abs( L[k−i ])

the second measure β 2 (k) is giving by:

β 2 ( k )=Σ i=0 M−1 ŷ[k−i]ŷ[k−i]E (abs( L ))

wherein:

y[k−i] is the (k−i)th signal value;

ŷ[k−i] is the expected value of the (k−i)th signal value;

L[k−i] is the soft-decision value for the (k−i)th signal value;

E(abs(L)) represents an expectation function applied to an absolute value of the defect-free soft-decision values; and

M is a specified positive integer.

4. The invention of claim 1 , wherein the defect region is associated with either thermal asperity (TA) or media defect (MD).

5. The invention of claim 1 , wherein the signal values are analog-to-digital converter (ADC) output values [n].

6. The invention of claim 1 , wherein the signal values are equalizer input values x[n].

7. The invention of claim 1 , wherein the signal values are equalizer output values y[n].

8. The invention of claim 1 , wherein the comparison determines whether the first measure is less than a specified fraction of the second measure, where the specified fraction is less than one.

9. The invention of claim 1 , wherein the comparison compares a ratio of the first measure and the second measure to a specified threshold.

10. The invention of claim 1 , wherein the expected signal values are mean values of the signal values.

11. The invention of claim 10 , wherein the expected signal values are functions of bit patterns associated with the signal values and one or more adjacent signal values.

12. The invention of claim 1 , wherein the expected signal values are reconstructed from hard-decision values corresponding to the signal values.

13. The invention of claim 12 , wherein the expected signal values are reconstructed by convolving the hard-decision values with a target polynomial.

14. A machine for detecting a defect region on a hard drive, the machine comprising:

(a) means for generating a first measure based on signal values, x[n] y[n] expected signal values corresponding to the signal values, and soft-decision values L[n] corresponding to the signal values;

(b) means for generating a second measure based on expected signal values and defect-free soft-decision values corresponding to only defect-free regions of the hard drive;

(c) means for comparing the first and second measures; and

(d) means for detecting the defect region based on the comparison of means (c).

15. The invention of claim 14 , wherein the machine is a digital signal processor.

16. The invention of claim 14 , wherein the machine is a hard-disc drive.

17. A non-transitory machine-readable storage medium, having encoded thereon program code, wherein, when the program code is executed by a machine, the machine implements a method for detecting a defect region on a hard drive, the method comprising:

(a) generating a first measure based on signal values, x[n] y[n] expected signal values corresponding to the signal values, and soft-decision values L [n] corresponding to the signal values;

(b) generating a second measure based on expected signal values and defect-free soft-decision values corresponding to only defect-free regions of the disk drive;

(c) the machine comparing the first and second measures; and

(d) the machine detecting the defect region based on the comparison of step (c).

18. The invention of claim 14 , wherein:

the first measure is based on a moving average of products of (i) the signal values, (ii) the expected signal values, and (iii) magnitudes of the soft-decision values; and

the second measure is based on a moving average of products of (i) squares of the expected signal values and (ii) expectation values of the magnitudes of the defect-free soft-decision values.

19. The invention of claim 18 , wherein:

the first measure β 1 (k) is given by:

β 1 ( k )=Σ i=0 M−1 y[k−i]ŷ[k−i ]abs( L[k−i ])

the second measure β 2 (k) is giving by:

β 2 ( k )=Σ i=0 M−1 ŷ[k−i]ŷ[k−i]E (abs( L ))

wherein:

y[k−i] is the (k−i)th signal value;

ŷ[k−i] is the expected value of the (k−i)th signal value;

L[k−i] is the soft-decision value for the (k−i)th signal value;

E(abs(L)) represents an expectation function applied to an absolute value of the defect-free soft-decision values; and

M is a specified positive integer.

Assignments (11)
MERGER Recorded Mar 3, 2023
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED; BROADCOM INTERNATIONAL PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 062952/0850 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2020
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
To: BROADCOM INTERNATIONAL PTE. LTD.
Reel/Frame 053771/0901 →
CORRECTIVE ASSIGNMENT TO CORRECT THE PROPERTY NUMBERS PREVIOUSLY RECORDED AT REEL: 47630 FRAME: 344. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 21, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048883/0267 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER TO 9/5/2018 PREVIOUSLY RECORDED AT REEL: 047196 FRAME: 0687. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047630/0344 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047196/0687 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2010
From: YANG, SHAOHUA; TAN, WEIJUN
To: LSI CORPORATION
Reel/Frame 024136/0384 →
Continuity (1)
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