IP Library Granted Patent US 7,902,656
Granted Patent B2
US 7,902,656 · App. 12/769,207 · Granted Mar 8, 2011

Hybrid integrated circuit device, and method for fabricating the same, and electronic device

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Quick Facts
Patent No.
US 7,902,656
App. No.
12/769,207
Granted
Mar 8, 2011
Kind
B2
Abstract

A hybrid integrated circuit device having high mount reliability comprises a module substrate which is a ceramic wiring substrate, a plurality of electronic component parts laid out on the main surface of the module substrate, a plurality of electrode terminals laid out on the rear surface of the module substrate, and a cap which is fixed to the module substrate to cover the main surface of the module substrate. The electrode terminals include a plurality of electrode terminals which are aligned along the edges of the module substrate and power voltage supply terminals which are located inner than these electrode terminals. The electrode terminals aligned along the substrate edges are coated, at least in their portions close to the substrate edge, with a protection film having a thickness of several tens micrometers or less. Connection reinforcing terminals consist of a plurality of divided terminals which are independent of each other, and are ground terminals.

Claims (28)

1. A semiconductor device including a first power amplifying system (e) and a second power amplifying system (f), comprising:

(a) a wiring substrate having a main surface and a back surface which is opposite to the main surface,

a mount pad being disposed over the main surface,

the back surface having two pairs of sides in a plan view;

(b) a semiconductor chip including a first transistor and a second transistor, mounted over the mount pad,

the first power amplifying system being comprised of the first transistor,

the second power amplifying system being comprised of the second transistor;

(c) a plurality of first electrode terminals disposed over the back surface of the wiring substrate,

the plurality of first electrode terminals being arranged along each of the two pairs of sides,

the plurality of the first electrode terminals including a first input terminal, a first output terminal, a second input terminal and a second output terminal,

the first input terminal and the first output terminal being used for inputting and outputting of signals for the first power amplifying system, respectively,

the second input terminal and the second output terminal being used for inputting and outputting of signals for the second power amplifying system, respectively; and

(d) a plurality of second electrode terminals disposed over the back surface of the wiring substrate,

the plurality of second electrode terminals being disposed inside the plurality of the first electrode terminals in a plan view,

the plurality of the second electrode terminals being used for ground potential supply to the first and second power amplifying systems,

the first and second electrode terminals comprising a land grid array structure; and

(e) a via hole in which a conductor film is filled formed under the mount pad and inside the wiring substrate,

one of the second electrode terminals being coupled to the mount pad via the conductor film filled in the via hole.

2. A semiconductor device according to claim 1 , wherein an area of each of the first electrode terminals being smaller than that of each of the second electrode terminals.

3. A semiconductor device according to claim 1 , wherein the first amplifying system is for GSM.

4. A semiconductor device according to claim 1 , wherein the plurality of first electrode terminals include a first power voltage terminal for the first power amplifying system and a second power voltage terminal for the second power amplifying system.

5. A semiconductor device according to claim 1 , wherein the plurality of first electrode terminals include non-contact terminals.

6. A semiconductor device according to claim 1 , wherein the first and second transistors are Hetero Junction Bipolar Transistors.

7. A semiconductor device according to claim 1 , wherein a chip capacitor is mounted over the main surface of the wiring substrate.

8. A semiconductor device according to claim 1 , wherein a chip resistor is mounted over the main surface of the wiring substrate.

9. A semiconductor device according to claim 1 , wherein the semiconductor device has at least four second electrode terminals.

10. A semiconductor device according to claim 1 , wherein the plurality of first and second electrode terminals are adaptable for forming solder, and

the semiconductor device is mountable over a mounting substrate via the solder.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
MERGER AND CHANGE OF NAME Recorded Jul 29, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024755/0338 →