Apparatus and method for improving the accuracy of measurements taken with a capacitance-type sensor

1. A method for improving the accuracy of measurements taken with a capacitance-type sensor, the method comprising:

charging the capacitance-type sensor by connecting it to a measurement circuit and collecting measured sensor data correlating to the capacitance of the capacitance-type sensor when the capacitance-type sensor is charged;

charging a calibration capacitor, which has a known and fixed capacitance by connecting it to the measurement circuit and collecting measured calibration data correlating to the capacitance of the calibration capacitor when the calibration capacitor is charged;

calculating an error between the measured calibration data and predefined calibration data that correlates to the known capacitance of the calibration capacitor;

calculating a correction value for the measured sensor data based on the calculated error alone or the calculated error in combination with the measured sensor data; and

calculating a corrected sensor measurement by applying the correction value to the measured sensor data;

wherein the calibration capacitor is one of a plurality of calibration capacitors, each with a different known and fixed capacitance, and the method further comprises for each sensor measurement, connecting at least two calibration capacitors to the measurement circuit one at a time, measuring the calibration voltage when the respective calibration capacitor is charged and for each of the connected calibration capacitors, calculating a voltage error as the difference between the measured calibration voltage and a predefined calibration voltage correlating to the known capacitance for each calibration capacitor, and extrapolating between measured calibration voltages and predefined calibration voltages to calculate the correction value for the sensor voltage, and then applying the correction value to the sensor voltage to calculate a corrected sensor voltage and the corrected sensor measurement.

2. The method of claim 1 wherein the measured sensor data and the measured calibration data are the respective voltages measured by the measurement circuit when the respective capacitance-type sensor and the calibration capacitor are charged.

3. The method of claim 1 wherein each time a sensor measurement is taken the method further comprises charging the capacitance-type sensor before any of the calibration capacitors and then charging, in turn, a predetermined number of calibration capacitors that have respective predefined calibration voltages that are closest to the measured sensor voltage.

4. The method of claim 1 wherein the capacitance-type sensor is a liquid level sensor and the method further comprises measuring the liquid level in a storage vessel for holding a liquid at cryogenic temperatures.

5. The method of claim 4 wherein the storage vessel is one of a plurality of storage vessels and the capacitance-type level sensor is one of a plurality of capacitance-type level sensors, each disposed in a different one of the storage vessels, and the method further comprises charging the calibration capacitor and correcting the measured sensor data when a liquid level measurement is taken.

6. The method of claim 1 wherein calibration steps comprising charging the calibration capacitor, calculating the error, calculating the correction value and calculating the corrected sensor measurement, are only done when a predetermined criteria is met.

7. The method of claim 6 wherein the predetermined criteria is the passing of a predetermined time since the previous time when the calibration steps were done.

8. The method of claim 6 wherein the predetermined criteria is met when the measured sensor data has changed from a previous value by more than a predetermined amount.