SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
A semiconductor device includes a semiconductor chip; and a scribe line disposed in an adjacent way to and around the semiconductor chip. The scribe line comprises an interlayer insulating film and an accessory. The accessory comprises a first portion with a layer shape formed on the interlayer insulating film and a second portion extending downward from the first portion into the interlayer insulating film in a thickness direction thereof.
1 . A semiconductor device comprising:
a semiconductor chip; and
a scribe line disposed around the semiconductor chip and comprising an interlayer insulating film and an accessory,
wherein the accessory comprises a first portion with a layer shape formed on the interlayer insulating film and a second portion extending downward from the first portion into the interlayer insulating film in a thickness direction thereof.
2 . The semiconductor device according to claim 1 ,
wherein the first portion is made of different material from material of the second portion.
3 . The semiconductor device according to claim 2 ,
wherein the first portion comprises a first underlying layer containing a titanium nitride film and a first metal layer formed sequentially on the interlayer insulating film, and
the second potion comprises a second underlying layer containing a titanium nitride film and formed on an inner wall of an accessory hole, and a second metal layer buried in the accessory hole.
4 . The semiconductor device according to claim 3 ,
wherein the first underlying layer is made of the titanium nitride film or a titanium film/the titanium nitride film,
the first metal layer is made of an Al alloy film or an Al film containing Cu,
the second underlying layer is made of a titanium film/the titanium nitride film/a titanium film, and
the second metal layer is made of a W film, an Al alloy film, an Al film containing Cu, or a Cu film.
5 . The semiconductor device according to claim 1 ,
wherein the first portion is made of the same material as material of the second portion.
6 . The semiconductor device according to claim 5 ,
wherein the accessory comprises:
an underlying layer containing a titanium nitride film and formed continuously on a surface of the interlayer insulating film and an inner wall of an accessory hole; and
a metal film buried in the accessory hole and formed continuously from inside of the accessory hole to over the interlayer insulating film.
7 . The semiconductor device according to claim 6 ,
wherein the underlying layer is made of a titanium film/the titanium nitride film/a titanium film, and
the second metal layer is made of a W film, an Al alloy film, an Al film containing Cu, or a Cu film.
8 . The semiconductor device according to claim 1 ,
wherein the first portion extends in a width direction of the scribe line, and the second portion is disposed beneath one end of the first portion closer to the semiconductor chip in the width direction of the scribe line.
9 . The semiconductor device according to claim 1 ,
wherein the accessory comprises a plurality of the second portions arranged in a width direction of the scribe line.
10 . The semiconductor device according to claim 9 ,
wherein two second portions are arranged on both sides in the width direction of the scribe line.
11 . The semiconductor device according to claim 1 ,
wherein the semiconductor chip comprises:
a MOS transistor;
a first contact plug connected to a source or drain region of the MOS transistor;
a first wire connected to the first contact plug;
a second contact plug connected to the first wire;
a second wire connected to the second contact plug;
a third contact plug connected to the second wire; and
a third wire connected to the third contact plug.
12 . The semiconductor device according to claim 11 ,
wherein the second portion is made of the same material as material of the second contact plug,
the first portion comprises a layer made of the same material as material of the second wire, and
the first and second portions are flush with the second wire and second contact plug, respectively.
13 . The semiconductor device according to claim 11 ,
wherein the second portion is made of the same material as material of the third contact plug,
the first portion comprises a layer made of the same material as material of the third wire, and
the first and second portions are flush with the third wire and third contact plug, respectively.
14 . The semiconductor device according to claim 11 ,
wherein the semiconductor chip further comprises a pad,
the pad comprises a layer made of the same material as material of the third wire, and
the pad is flush with the third wire.
15 . The semiconductor device according to claim 11 ,
wherein the semiconductor chip further comprises a fuse,
the fuse is made of the same material as material of the first wire, and
the fuse is flush with the first wire.
16 . A semiconductor device comprising:
a semiconductor chip; and
a scribe line disposed in an adjacent way to and around the semiconductor chip and comprising an interlayer insulating film and an accessory,
wherein the accessory comprises a second portion buried in the interlayer insulating film and a first portion with a layer shape formed on the interlayer insulating film so as to be in contact with the second portion.
17 . The semiconductor device according to claim 16 ,
wherein the first portion is made of different material from material of the second portion.
18 . The semiconductor device according to claim 16 ,
wherein the first portion is made of the same material as material of the second portion.
19 . The semiconductor device according to claim 16 ,
wherein two second portions are formed on both sides in the width direction of the scribe line.
20 . A semiconductor device comprising:
a semiconductor chip; and
a scribe line disposed in an adjacent way to and around the semiconductor chip and comprising an interlayer insulating film and an accessory,
wherein the accessory comprises:
a first portion formed on the interlayer insulating film and extending in a width direction of the scribe line; and
two protruding second portions buried in the interlayer insulating film from both ends of the first portion in the width direction of the scribe line.