ESD trigger for system level ESD events

1. A circuit, comprising:

an ESD diode coupled to a protected circuit, the ESD diode to divert current away from the protected circuit to a first logic and a second logic in an electrostatic discharge (ESD) event;

the first logic to generate a first trigger signal suitable to activate an ESD clamp in response to an ESD event having a first severity or a second severity higher than the first severity; and

the second logic to generate a second trigger signal suitable to activate the ESD clamp in response to the ESD event having the second severity, the second trigger signal fed-forward and placed concurrently with the first trigger signal on the input of the ESD clamp.

2. The circuit of claim 1 , further comprising:

the second logic comprising an RC derivator configured to set the output current for a PFET.

3. The circuit of claim 1 , further comprising:

the second logic adapted to generate the second trigger signal in response to an input signal slew rate that is 5-15 times faster than an input slew rate that will cause the first logic to generate the first trigger signal.

4. The circuit of claim 1 , further comprising:

the second logic comprising an RC derivator coupled with a common source amplifier.

5. The circuit of claim 4 , further comprising:

the common source amplifier configured to set the output current of a pFET.

6. The circuit of claim 1 , further comprising:

the second logic comprising an RC derivator coupled with a common source amplifier, which is coupled with an nPET configured as a source follower.

7. The circuit of claim 1 , further comprising:

the second logic adapted to utilize a parasitic capacitance of one or more ESD clamps in substitution of a discrete capacitive element to set a duration of activation of the ESD clamp by the second trigger signal.

8. The circuit of claim 1 , further comprising:

the second logic adapted to cause the second trigger signal to be suitable to activate the ESD clamp between 0.1 ns and 0.3 ns of the occurrence of the ESD event when the ESD event is of the second severity; and

the first logic adapted to cause the first trigger signal to be suitable to activate the ESD clamp between 1 and 3 ns of the occurrence of the ESD event when the ESD event is of the second severity.

9. The circuit of claim 1 , further comprising:

a grid structure to propagate the first and second trigger signals to activation inputs of multiple ESD clamps;

the first and second logic centrally located among the ESD clamps.

10. The circuit of claim 1 , wherein:

the second trigger signal comprising charge from the ESD event fed forward through the second logic; and

the first severity is the severity of a human body model ESD event, and the second severity is the severity of a system level ESD event.

11. A circuit comprising:

an electrostatic discharge (ESD) diode comprising an input terminal, the ESD diode capable of diverting ESD current away from a protected circuit;

first logic, the first logic coupled to the ESD diode, and adapted to generate a first trigger signal suitable to activate an ESD clamp in response to an ESD event at the input terminal of a first severity or a second severity higher than the first severity;

second logic, the second logic coupled to the ESD diode, and adapted to generate a second trigger signal suitable to activate the ESD clamp in response to the ESD event at the input terminal, the second trigger signal fed-forward and placed concurrently with the first trigger signal on the input of the ESD clamp,

wherein the ESD diode, in response to an ESD event, places the ESD current on the first logic and the second logic.

12. The circuit of claim 11 , further comprising:

the second logic adapted to generate the second trigger signal in response to an input signal slew rate that is 5-15 times faster than an input slew rate that will cause the first logic to generate the first trigger signal.

13. The circuit of claim 11 , further comprising:

a grid structure to propagate the first and second trigger signals to activation inputs of multiple ESD clamps;

the first and second logic centrally located among the ESD clamps.

14. The circuit of claim 11 , wherein:

the second trigger signal comprising charge from the ESD event fed forward through the second logic; and

the first severity is the severity of a human body model ESD event, and the second severity is the severity of a system level ESD event.

15. The circuit of claim 11 , further comprising:

the second logic adapted to cause the second trigger signal to be suitable to activate the ESD clamp between 0.1 ns and 0.3 ns of the occurrence of the ESD event when the ESD event is of the second severity; and

the first logic adapted to cause the first trigger signal to be suitable to activate the ESD clamp between 1 and 3 ns of the occurrence of the ESD event when the ESD event is of the second severity.

16. A method comprising:

detecting an electrostatic discharge (ESD) event comprising an ESD charge;

diverting the ESD charge away from a protected circuit directly to a first trigger circuit and a second trigger circuit;

generating a first trigger signal by the first trigger circuit suitable to activate an ESD clamp in response to an ESD event at the input terminal of a circuit, the ESD event having first severity or a second severity higher than the first severity; and

generating a second trigger signal by the second trigger circuit suitable to activate the ESD clamp in response to the ESD event at the input terminal, the second trigger signal is placed concurrently with the first trigger signal on the input of the ESD clamp.

17. The method of claim 16 , further comprising:

generating the second trigger signal in response to an input signal slew rate that is 5-15 times faster than an input slew rate that will cause generation of the first trigger signal.

18. The method of claim 16 , further comprising:

propagating the first and second trigger signals along a grid structure to inputs of multiple ESD clamps, from a location central among the ESD clamps.

19. The method of claim 16 , further comprising:

feeding charge from the ESD event forward through a trigger circuit to the ESD clamp, wherein the first severity is the severity of a human body model ESD event, and the second severity is the severity of a system level ESD event.

20. The method of claim 16 , further comprising:

the second trigger signal activating the ESD clamp between 0.1 ns and 0.3 ns of the occurrence of the ESD event when the ESD event is of the second severity; and

the first trigger signal activating the ESD clamp between 1 and 3 ns of the occurrence of the ESD event when the ESD event is of the second severity.