IP Library Granted Patent US 8,330,325
Granted Patent B1
US 8,330,325 · App. 13/161,946 · Granted Dec 11, 2012

Bulk acoustic resonator comprising non-piezoelectric layer

Assignee: Avago Technologies Wireless IP (Singapore) Pte. Ltd.
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Quick Facts
Patent No.
US 8,330,325
App. No.
13/161,946
Granted
Dec 11, 2012
Kind
B1
Abstract

In a representative embodiment, a bulk acoustic wave (BAW) resonator structure comprises: a first electrode disposed over a substrate; a first piezoelectric layer disposed over the first electrode; a second electrode disposed over the first piezoelectric layer, wherein c-axis orientations of crystals of the first piezoelectric layer are substantially aligned with one another; a second piezoelectric layer disposed over the second electrode; a non-piezoelectric layer; and a third electrode disposed over the second piezoelectric layer.

Claims (29)

1. A bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

a piezoelectric layer disposed over the first electrode;

a second electrode disposed over the first piezoelectric layer, wherein c-axis orientations of crystals of the piezoelectric layer are substantially aligned with one another; and

a non-piezoelectric layer disposed over the first electrode and adjacent to the piezoelectric layer, wherein an overlap of the non-piezoelectric layer with the second electrode has a width substantially equal to an integer multiple of one-quarter wavelength of a first propagating eigenmode in the non-piezoelectric layer, or greater than or equal to an inverse of an attenuation constant (1/k) of a first evanescent eigenmode in the non-piezoelectric layer.

2. A BAW resonator structure as claimed in claim 1 , wherein the non-piezoelectric layer is polycrystalline.

3. A BAW resonator structure as claimed in claim 1 , wherein the piezoelectric layer comprises a material, and the non-piezoelectric layer is a non-crystalline form of the material.

4. A BAW resonator structure as claimed in claim 3 , wherein the material is aluminum nitride.

5. A BAW resonator structure as claimed in claim 1 , further comprising an acoustic reflector disposed beneath the first electrode.

6. A BAW resonator structure as claimed in claim 5 , wherein the acoustic reflector comprises a cavity.

7. A BAW resonator structure as claimed in claim 1 , wherein the piezoelectric layer has a piezoelectric coupling coefficient (e 33 ) and the non-piezoelectric layer has a piezoelectric coupling coefficient that is less or equal to 80% of the first piezoelectric coupling coefficient.

8. A bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

a first piezoelectric layer disposed over the first electrode;

a second electrode disposed over the first piezoelectric layer, wherein c-axis orientations of crystals of the first piezoelectric layer are substantially aligned with one another;

a second piezoelectric layer disposed over the second electrode;

a non-piezoelectric layer; and

a third electrode disposed over the second piezoelectric layer.

9. A BAW resonator structure as claimed in claim 8 , wherein the non-piezoelectric layer has a width that is substantially equal to an integer multiple of one-quarter wavelength of a first propagating eigenmode in the non-piezoelectric layer, or greater than or equal to an inverse of an attenuation constant (1/k) of a first evanescent eigenmode in the non-piezoelectric layer.

10. A BAW resonator structure as claimed in claim 8 , wherein the non-piezoelectric layer is disposed over the first electrode and adjacent to the first piezoelectric layer.

11. A BAW resonator structure as claimed in claim 8 , wherein the non-piezoelectric layer is disposed over the second electrode and adjacent to the second piezoelectric layer.

12. A BAW resonator structure as claimed in claim 10 , further comprising a second non-piezoelectric layer disposed over the second electrode and adjacent to the second piezoelectric layer.

13. A BAW resonator as claimed in claim 8 , wherein the non-piezoelectric layer is polycrystalline.

14. A BAW resonator structure as claimed in claim 8 , wherein the first piezoelectric layer comprises a material, and the non-piezoelectric layer is a non-crystalline form of the material.

15. A BAW resonator structure as claimed in claim 14 , wherein the material is aluminum nitride.

16. A BAW resonator structure as claimed in claim 8 , wherein the first piezoelectric layer has a first piezoelectric coupling coefficient (e 33 ) and the non-piezoelectric layer has a piezoelectric coupling coefficient that is less or equal to 80% the first piezoelectric coupling coefficient.

17. A BAW resonator structure as claimed in claim 12 , wherein the second piezoelectric layer comprises a material, and the second non-piezoelectric layer is a non-crystalline form of the material.

18. A BAW resonator structure as claimed in claim 12 , wherein the second piezoelectric layer has a second piezoelectric coupling coefficient (e 33 ) and the second non-piezoelectric layer has a piezoelectric coupling coefficient that is less or equal to 80% of the second piezoelectric coupling coefficient.

19. A BAW resonator structure as claimed in claim 8 , further comprising: an acoustic coupling layer disposed between the second electrode and the second piezoelectric layer; and a fourth electrode disposed above the acoustic coupling layer and beneath the second piezoelectric layer.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER TO 09/05/2018 PREVIOUSLY RECORDED AT REEL: 047230 FRAME: 0133. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047630/0456 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047230/0133 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →
MERGER Recorded May 7, 2013
From: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 030369/0703 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2011
From: BURAK, DARIUSZ; KAITILA, JYRKI; SHIRAKAWA, ALEXANDRE; HANDTMANN, MARTIN; NIKKEL, PHIL
To: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
Reel/Frame 026461/0323 →