Device for predicting gloss of low gloss coating by wet color measurement

1. A gloss prediction device comprising:

(a) a test substrate mounted on a driver that is mounted on a support frame;

(b) a vessel positioned adjacent to said test substrate such that a coating composition when poured in said vessel can be dispensed as a L 0 layer of substantially uniform thickness on surface of said substrate through an opening provided on said vessel;

(c) an optical measurement mechanism for projecting on said L 0 layer a beam of light of a preset intensity at a preset angle of incidence from a light source;

(d) an optical measurement instrument to measure B 0 reflectance of said beam reflected from said L 0 layer at a preset angle of reflectance;

(e) a gloss meter to measure Y 0 gloss of a C 0 coating at a preset gloss angle resulting from said L 0 layer when dried or cured;

(f) means for configuring computer readable program code devices to cause a computer to store B 0 reflectance of L 0 layer and Y 0 gloss in a computer usable storage medium of the computer;

(g) means for configuring computer readable program code devices to cause said computer to store B 1 to B n reflectance of L 1 to L n layers and Y 1 to Y n gloss of C 1 to C n coatings resulting from coating compositions S 1 to S n respectively comprising F 1 to F n parts by weight of one or more flatting agents based on 100 parts by weight of said coating composition, wherein n ranges from 4 to 20;

(h) means for configuring computer readable program code devices to cause said computer to subtract said B 0 reflectance of said L 0 layer from said B 1 to B n reflectance of said L 1 to L n layers to determine ΔB 1 to ΔB n of said L 1 to L n layers respectively;

(i) means for configuring computer readable program code devices to cause said computer to locate intersecting points on a graph where said ΔB 1 to ΔB n of said L 1 to L n layers lying on X-axis of said graph intersect with said Y 1 to Y n gloss of said C 1 to C n coatings lying on Y-axis of said graph;

(j) means for configuring computer readable program code devices to cause said computer to utilize a curve fitting equation to produce a gloss prediction curve on said graph;

(k) means for configuring computer readable program code devices to cause said computer to store a B T reflectance of an L T layer having said substantially uniform thickness and made of a target coating composition comprising said one or more flatting agents, and wherein said B T reflectance is obtained by having said optical measurement mechanism project a beam of light at said preset intensity and at said preset angle of incidence from said light source;

(l) means for configuring computer readable program code devices to cause said computer to subtract said B 0 reflectance of said L 0 layer from said B T reflectance of L T layer to determine ΔB T of said L T layer;

(m) means for configuring computer readable program code devices to cause said computer to locate said ΔB T of said L T layer on said X-axis of said graph;

(n) means for configuring computer readable program code devices to cause said computer to locate an intersecting point on said gloss prediction curve that intersects with said ΔB T on said X-axis of said graph;

(o) means for configuring computer readable program code devices to cause said computer to predict gloss at said preset gloss angle of a target coating that would result from said target layer when dried or cured by locating Y T gloss on said Y-axis of said graph that intersects with said intersecting point on said gloss prediction curve that intersects with said ΔB T on said X-axis of said graph; and

(p) means for configuring computer readable program code devices to cause said computer to display or print said Y T gloss.

2. The device of claim 1 wherein said optical measurement instrument is a spectrophotometer.

3. The device of claim 1 wherein said optical measurement instrument is in communication with said computer.

4. The device of claim 1 wherein said gloss meter is in communication with said computer.

5. The device of claim 1 wherein said opening is a slot adjacent to said test substrate such that a resulting gap between said slot and said test substrate controls the thickness of said L 0 and said L 1 to L n layers.

6. The device of claim 1 wherein said L 0 and said L 1 to L n layers are of the same thickness ranging from 6 micrometers to 2300 micrometers.

7. The device of claim 1 wherein said test substrate is a disc positioned vertically on a support frame of said gloss prediction device.

8. The device of claim 1 wherein said curve fitting equation is a second degree polynomial equation.

9. The device of claim 8 wherein said second degree polynomial equation is of the formula:

Gloss Y=a (Δ B n ) 2 +b (Δ B n )+ c

R 2 =Z

wherein said constants a, b, c and Z are determined by a curve fitting process.

10. The device of claim 1 wherein said predicted gloss of said target coating is displayed on a CRT monitor.

11. The device of claim 1 wherein said coating composition is an automotive OEM or refinish paint.

12. The device of claim 11 wherein said flatting agent is talc, silica, or barium sulfate.

13. The device of claim 12 wherein said F 1 is 10 parts and said F n is 90 parts by weight of one or more flatting agents based on 100 parts by weight of said coating composition.