Wear leveling technique for storage devices

1. A method for managing wear levels in a storage device having a plurality of data blocks, the method comprising:

copying data from a data block having a first erasure count to a data block having a higher erasure count than the first erasure count;

erasing the data from the data block having the first erasure count; and

allocating the erased data block for a subsequent write operation, wherein the copying, erasing, and allocating is performed using a constraint on static wear levelness of the plurality of data blocks that is a function of one or more life parameters of the plurality of data blocks.

2. The method of claim 1 , wherein the one or more life parameters of the plurality of data blocks comprise one more of erasure counts of the plurality of data blocks, error rates of the plurality of data blocks, times for performing read operations, times for performing write operations, and times for performing erasure operations.

3. The method of claim 1 , further comprising:

determining a constraint parameter based at least in part on a maximum erasure count of the plurality of data blocks; and

determining a constraint threshold based at least in part on a minimum erasure count of the plurality of data blocks, wherein the copying, erasing, and allocating is performed in a manner that maintains the constraint parameter bounded by the constraint threshold.

4. The method of claim 3 , wherein the constraint threshold is defined by a substantially linear function of the minimum erasure count and the maximum erasure count.

5. The method of claim 3 , wherein the constraint threshold is defined by a substantially exponential function of the minimum erasure count and the maximum erasure count.

6. The method of claim 3 , further comprising repeating the copying, erasing and allocating, wherein the repeating comprises:

updating the minimum erasure count;

updating the maximum erasure count;

updating the constraint parameter based at least in part on the updated maximum erasure count; and

updating the constraint threshold based at least in part on the updated minimum erasure count.

7. A memory controller, comprising:

a memory device having a plurality of data blocks; and

a processor configured to:

copy data from a data block having a first erasure count to a data block having a higher erasure count than the first erasure count;

erase the data from the data block having the first erasure count; and

allocate the erased data block for a subsequent write operation, wherein the copying, erasing, and allocating is performed using a constraint on static wear levelness of the plurality of data blocks, the constraint being a function of one or more life parameters of the plurality of data blocks.

8. The device of claim 7 , wherein the one or more life parameters of the plurality of data blocks comprise one or both of erasure counts of the plurality of data blocks and error rates of the plurality of data blocks.

9. The device of claim 7 , wherein the processor is further configured to:

determine a constraint parameter based at least in part on a maximum erasure count of the plurality of data blocks; and

determine a constraint threshold based at least in part on a minimum erasure count of the plurality of data blocks, wherein the data is copied in a manner that maintains the constraint parameter bounded by the constraint threshold.

10. The device of claim 9 , wherein the processor is further configured to:

update the minimum erasure count;

update the maximum erasure count;

update the constraint parameter based at least in part on the updated maximum erasure count; and

update the constraint threshold based at least in part on the updated minimum erasure count.

11. The device of claim 7 , wherein the constraint on static wear levelness restricts the copying of the data until the maximum erasure count of the plurality of data blocks is at least about 25% of an end-of-life erasure count.

12. The device of claim 11 , wherein the constraint on static wear levelness restricts the copying of the data until the maximum erasure count of the plurality of data blocks is at least about 50% of the end-of-life erasure count.

13. A memory controller, comprising:

a memory device having a plurality of data blocks; and

a processor configured to:

determine an erasure count for each of the plurality of data blocks;

determine a constraint parameter using at least a maximum erasure count of the determined erasure counts;

determine a constraint threshold that defines a constraint on static wear levelness that varies over the lives of the plurality of data blocks; and

move data from a first data block having a first erasure count to a second data block having an erasure count higher than the first erasure count in a manner that maintains the parameter bounded by the constraint threshold.

14. The device of claim 13 , wherein the processor is configured to move the data from the first data block to the second data block by:

copying the data from the first data block to the second data block;

erasing the data from the first data block; and

allocating the first erased data block for a subsequent writing operation.

15. The device of claim 13 , wherein the constraint threshold is defined by at least one or both of 1) a substantially linear function of a minimum erasure count of the determined erasure counts and the maximum erasure count and 2) a substantially exponential function of the minimum erasure count and the maximum erasure count.

16. The device of claim 13 , wherein the constraint on static wear levelness restricts the copying of the data until a maximum erasure count of the plurality of data blocks is at least about 25% of an end-of-life erasure count of the plurality of data blocks.

17. The device of claim 16 , wherein the constraint on static wear levelness restricts the copying of the data until the maximum erasure count of the plurality of data blocks is at least about 50% of the end-of-life erasure count.

18. The device of claim 13 , wherein the constraint threshold is determined based at least in part on a minimum erasure count of the determined erasure counts.

19. The device of claim 13 , wherein the constraint threshold is further determined using an end-of-life erasure count of the plurality of data blocks.

20. The device of claim 13 , wherein the constraint threshold is further determined using at least one quantifiable property of the plurality of the data blocks.