Methods of removing electrical runout in a machine shaft surface
A method of removing electrical runout from a measurement surface of a rotatable machine shaft is disclosed. The method includes providing a sensor adjacent to the measurement surface of the rotatable machine shaft, rotating the rotatable machine shaft, measuring a combined runout of the measurement surface, determining an angular location of one or more local valleys on the measurement surface, and re-working the measurement surface at the angular location of the one or more local valleys. Re-work may be by polishing at the one or more local valleys. Various alternative methods are disclosed, as are other aspects.
1. A method of removing runout from a measurement surface of a rotatable machine shaft, comprising:
providing a sensor adjacent to the measurement surface of the rotatable machine shaft;
rotating the rotatable machine shaft;
measuring a combined runout of the measurement surface;
determining an angular location of one or more local valleys on the measurement surface; and
re-working the measurement surface at the angular location of the one or more local valleys, wherein the re-working comprises polishing the measurement surface at the location of the one or more local valleys, and
wherein the polishing of the measurement surface is accomplished using a silicon carbide cloth.
2. The method of claim 1 , wherein the re-working of the measurement surface at the location of the one or more local valleys has no appreciable effect on a surface finish of the measurement surface.
3. The method of claim 1 , wherein the re-working of the measurement surface at the location of the one or more local valleys has no appreciable effect on a diameter of the measurement.
4. The method of claim 1 , wherein the re-working of the measurement surface at the location of the one or more local valleys has no appreciable effect on the residual magnetism of the shaft.
5. The method of claim 1 , wherein the re-working of the measurement surface is completed in less than 35 minutes.
6. The method of claim 1 , wherein the polishing of the measurement surface is accomplished using a fine grade of silicon carbide cloth.
7. The method of claim 1 , wherein the polishing of the measurement surface is accomplished on an area of +/− about 30 degrees around a location of a local minima.
8. The method of claim 1 , wherein the polishing of the measurement surface is accomplished for a test period of between about 10 seconds and about 35 seconds followed by re-measuring a combined runout of the measurement surface.
9. The method of claim 1 , wherein the re-working comprises polishing the measurement surface at the location of the one or more local valleys in a direction that is generally parallel to an axial axis of the rotatable machine shaft.
10. The method of claim 1 , comprising marking an angular location of one or more local valleys adjacent to or on the measurement surface.
11. The method of claim 1 , wherein the measuring of the combined runout of the measurement surface is accomplished using a non-contact eddy current sensor.
12. The method of claim 1 , wherein the re-working comprises polishing the measurement surface at the location of two or more local valleys.
13. The method of claim 1 , wherein the rework comprises polishing the measurement surface at the angular location of the one or more local valleys until a peak-to-peak combined runout of the measurement surface is within a predetermined tolerance.
14. A method of removing runout from a measurement surface of a rotatable machine shaft, comprising:
providing a sensor adjacent to the measurement surface of the rotatable machine shaft;
rotating the rotatable machine shaft;
measuring a combined runout of the measurement surface;
determining an angular location of one or more local valleys on the measurement surface; and
re-working the measurement surface at the angular location of the one or more local valleys, wherein the re-working comprises polishing the measurement surface at the location of the one or more local valleys, and
wherein the polishing of the measurement surface is accomplished using a crocus cloth.
15. The method of claim 14 , wherein the re-working of the measurement surface is completed in less than 35 minutes.
16. The method of claim 14 , wherein the polishing of the measurement surface is accomplished on an area of +/− about 30 degrees around a location of a local minima.
17. The method of claim 14 , wherein the polishing of the measurement surface is accomplished for a test period of between about 10 seconds and about 35 seconds followed by re-measuring a combined runout of the measurement surface.
18. The method of claim 14 , comprising marking an angular location of one or more local valleys adjacent to or on the measurement surface.
19. The method of claim 14 , wherein the measuring of the combined runout of the measurement surface is accomplished using a non-contact eddy current sensor.
20. The method of claim 14 , wherein the re-working comprises polishing the measurement surface at the angular location of the one or more local valleys until a peak-to-peak combined runout of the measurement surface is within a predetermined tolerance.