IP Library Granted Patent US 8,694,847
Granted Patent B2
US 8,694,847 · App. 13/597,026 · Granted Apr 8, 2014

Systems and methods for sector quality determination in a data processing system

Inventors: Fan Zhang (Milpitas, CA); Yang Han (Sunnyvale, CA); Xuebin Wu (San Jose, CA); Shaohua Yang (San Jose, CA)
Assignee: LSI Corporation
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Quick Facts
Patent No.
US 8,694,847
App. No.
13/597,026
Granted
Apr 8, 2014
Kind
B2
Abstract

The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for data set quality determination.

Claims (48)

1. A data processing system, the data processing system comprising:

a data decoder circuit operable to apply a data decode algorithm to a decoder input derived from a data set to yield a decoded output, wherein the decoded output includes an unsatisfied check, and soft data associated with the unsatisfied check; and

a quality metric calculation circuit operable to calculate a quality metric corresponding to the data set using the soft data using the soft data to calculate a contribution from each variable node associated with the unsatisfied check to yield a local metric.

2. The system of claim 1 , wherein the system further comprises:

a data detector circuit operable to apply a data detection algorithm to the data set to yield a detected output, wherein the decoder input is derived from the detected output.

3. The system of claim 2 , wherein the data detector circuit is selected from a group consisting of: a Viterbi algorithm data detector circuit, and a maximum a posteriori data detector circuit.

4. The system of claim 1 , wherein the local metric is a first local metric, wherein the unsatisfied check is a first unsatisfied check, and wherein calculating the quality metric corresponding to the data set further comprises:

using the soft data to calculate a contribution from each variable node associated with a second unsatisfied check to yield a second local metric; and

summing a first interim metric derived from the first local metric and a second interim metric derived form the second local metric to yield the quality metric.

5. The system of claim 4 , wherein the quality metric calculation circuit is further operable to:

normalize the first local metric to a number of variable nodes corresponding the first unsatisfied check to yield the first interim metric; and

normalize the second local metric to a number of variable nodes corresponding the second unsatisfied check to yield the second interim metric.

6. The system of claim 1 , wherein the quality metric is a first quality metric; wherein the unsatisfied check is a first unsatisfied check; wherein the data set is a first data set, wherein the decoder input is a first decoder input; wherein the decoded output is a first decoded output; wherein the data decoder circuit is further operable to apply the data decode algorithm to a second decoder input derived from a second data set to yield a second decoded output; wherein the second decoded output includes a second unsatisfied check, and soft data associated with the second unsatisfied check; wherein the quality metric calculation circuit is further operable to calculate a second quality metric corresponding to the second data set using the soft data associated with the second unsatisfied check.

7. The system of claim 6 , wherein the system further comprises:

an input buffer operable to store the first data set and the second data set; and

a scheduling circuit operable to select one of the first data set and the second data set for processing based at least in part on a comparison of the first quality metric and the second quality metric.

8. The system of claim 1 , wherein the data decoder circuit is a low density parity check decoder circuit.

9. The system of claim 1 , wherein the system is implemented as an integrated circuit.

10. The system of claim 1 , wherein the system is incorporated in a device selected from a group consisting of: a storage device, and a data transmission device.

11. A method for data set quality determination, the method comprising:

applying a data decode algorithm by a data decoder circuit to a decoder input derived from a data set to yield a decoded output, wherein the decoded output includes an unsatisfied check, and soft data associated with the unsatisfied check; and

calculating a quality metric for the data set based at least in part on the soft data using the soft data to calculate a contribution from each variable node associated with the unsatisfied check to yield a local metric.

12. The method of claim 11 , the method further comprising:

applying a data detection algorithm to the data set to yield a detected output, wherein the decoder input is derived from the detected output.

13. The method of claim 11 , wherein the local metric is a first local metric, wherein the unsatisfied check is a first unsatisfied check, and wherein calculating the quality metric corresponding to the data set further comprises: using the soft data to calculate a contribution from each variable node associated with a second unsatisfied check to yield a second local metric; and summing a first interim metric derived from the first local metric and a second interim metric derived from the second local metric to yield the quality metric.

14. The method of claim 13 , wherein calculating the quality metric further comprises:

normalizing the first local metric to a number of variable nodes corresponding the first unsatisfied check to yield the first interim metric; and

normalizing the second local metric to a number of variable nodes corresponding the second unsatisfied check to yield the second interim metric.

15. The method of claim 11 , wherein the quality metric is a first quality metric; wherein the unsatisfied check is a first unsatisfied check; wherein the data set is a first data set, wherein the decoder input is a first decoder input; wherein the decoded output is a first decoded output; and wherein the method further comprises:

applying the data decode algorithm to a second decoder input derived from a second data set to yield a second decoded output, wherein the second decoded output includes a second unsatisfied check, and soft data associated with the second unsatisfied check; and

calculating a second quality metric for the second data set based at least in part on the soft data associated with the second unsatisfied check.

16. The method of claim 11 , wherein the method further comprises:

selecting the data set for additional processing based at least in part on the quality metric.

17. A storage device, the storage device comprising:

a storage medium;

a head assembly disposed in relation to the storage medium and operable to provide a sensed signal corresponding to information on the storage medium;

a read channel circuit including:

an analog to digital converter circuit operable to sample an analog signal derived from the sensed signal to yield a series of digital samples;

an equalizer circuit operable to equalize the digital samples to yield a data set;

a data decoder circuit operable to apply a data decode algorithm to a decoder input derived from the data set to yield a decoded output, wherein the decoded output includes an unsatisfied check, and soft data associated with the unsatisfied check; and

a quality metric calculation circuit operable to calculate a quality metric corresponding to the data set using the soft data using the soft data to calculate a contribution from each variable node associated with the unsatisfied check to yield a local metric.

18. The storage device of claim 17 , wherein the local metric is a first local metric, wherein the unsatisfied check is a first unsatisfied check, and wherein calculating the quality metric corresponding to the data set further comprises:

using the soft data to calculate a contribution from each variable node associated with a second unsatisfied check to yield a second local metric; and

summing a first interim metric derived from the first local metric and a second interim metric derived form the second local metric to yield the quality metric.

19. The storage device of claim 18 , wherein the quality metric calculation circuit is further operable to:

normalize the first local metric to a number of variable nodes corresponding the first unsatisfied check to yield the first interim metric; and

normalize the second local metric to a number of variable nodes corresponding the second unsatisfied check to yield the second interim metric.

20. The storage device of claim 17 , wherein the quality metric is a first quality metric; wherein the unsatisfied check is a first unsatisfied check; wherein the data set is a first data set, wherein the decoder input is a first decoder input; wherein the decoded output is a first decoded output; wherein the data decoder circuit is further operable to apply the data decode algorithm to a second decoder input derived from a second data set to yield a second decoded output; wherein the second decoded output includes a second unsatisfied check, and soft data associated with the second unsatisfied check; wherein the quality metric calculation circuit is further operable to calculate a second quality metric corresponding to the second data set using the soft data associated with the second unsatisfied check.

Assignments (11)
MERGER Recorded Mar 3, 2023
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED; BROADCOM INTERNATIONAL PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 062952/0850 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2020
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
To: BROADCOM INTERNATIONAL PTE. LTD.
Reel/Frame 053771/0901 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER IN THE INCORRECT US PATENT NO. 8,876,094 PREVIOUSLY RECORDED ON REEL 047351 FRAME 0384. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 8, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 049248/0558 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF THE MERGER PREVIOUSLY RECORDED AT REEL: 047230 FRAME: 0910. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047351/0384 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047230/0910 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2012
From: ZHANG, FAN; HAN, YANG; WU, XUEBIN; YANG, SHAOHUA
To: LSI CORPORATION
Reel/Frame 028863/0217 →
Continuity (1)
Related Publication 20140068394A1 · Mar 6, 2014