At-speed scan testing of interface functional logic of an embedded memory or other circuit core
View Patent ↗An integrated circuit comprises scan test circuitry and at least one circuit core coupled to the scan test circuitry. The scan test circuitry comprises input and output scan chains coupled to respective input and output interfaces of the circuit core via respective functional logic blocks, and interface signal selection circuitry. The interface signal selection circuitry is configured to select a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals. By way of example only, the first and second scan test input signals may comprise respective first and second distinct address values and the designated input signal lines of the input interface of the circuit core may comprise address input signal lines of an embedded memory.
1. An integrated circuit comprising:
scan test circuitry; and
a circuit core coupled to the scan test circuitry;
the scan test circuitry comprising:
input and output scan chains coupled to respective input and output interfaces of the circuit core via respective functional logic blocks; and
interface signal selection circuitry configured to select a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals;
wherein first and second scan test input signals of the plurality of scan test input signals comprise respective first and second distinct address values and said one or more designated input signal lines of the input interface of the circuit core comprise a plurality of address input signal lines of an embedded memory of the circuit core of the integrated circuit.
2. The integrated circuit of claim 1 wherein the embedded memory comprises at least one of a dual-port memory and a single-port memory.
3. The integrated circuit of claim 1 wherein the scan test circuitry further comprises a scan test controller coupled to the interface signal selection circuitry and configured to generate at least first and second control signals of said one or more control signals.
4. The integrated circuit of claim 3 wherein the scan test controller comprises a finite state machine configured to generate a flag signal utilized to generate at least one of the first and second control signals.
5. The integrated circuit of claim 4 wherein the finite state machine has a plurality of states including an idle state associated with deassertion of a write enable signal and at least one additional state that is entered when the write enable signal is asserted.
6. A processing device comprising the integrated circuit of claim 1 .
7. The integrated circuit of claim 1 wherein the plurality of address input signal lines comprise a read address signal line and a write address signal line, and an address value on each of the read and write address signal lines remains the same over a plurality of cycles of a clock signal.
8. An integrated circuit comprising:
scan test circuitry; and
a circuit core coupled to the scan test circuitry;
the scan test circuitry comprising:
input and output scan chains coupled to respective input and output interfaces of the circuit core via respective functional logic blocks; and
interface signal selection circuitry configured to select a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals;
wherein the interface signal selection circuitry comprises:
a first multiplexer having a first input adapted to receive a first one of the scan test input signals, a second input adapted to receive a second one of the scan test input signals, and an output; and
a second multiplexer having a first input coupled to the output of the first multiplexer, a second input adapted to receive the functional input signal, and an output providing the selected particular one of the functional input signal and the first and second scan test input signals for application to said one or more designated input signal lines of the input interface of the circuit core;
wherein the first and second multiplexers further have respective select signal inputs that are adapted to receive respective first and second control signals of said one or more control signals.
9. The integrated circuit of claim 8 wherein the first control signal comprises a toggle signal that causes the first multiplexer to alternate between selection of the first and second scan test input signals over a plurality of cycles of a clock signal.
10. The integrated circuit of claim 8 wherein the first control signal is determined as a function of a toggle signal and a flag signal, where the flag signal prevents the first multiplexer from alternating between selection of the first and second scan test input signals over a plurality of cycles of a clock signal after a designated number of the cycles.
11. The integrated circuit of claim 8 wherein the second control signal comprises a scan test mode signal having a first logic level in a scan test mode of operation and a second logic level in a functional mode of operation.
12. A method of scan testing an integrated circuit, comprising:
providing input and output scan chains coupled to respective input and output interfaces of a circuit core via respective functional logic blocks; and
selecting a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals;
wherein first and second scan test input signals of the plurality of scan test input signals comprise respective first and second distinct address values and said one or more designated input signal lines of the input interface of the circuit core comprise a plurality of address input signal lines of an embedded memory.
13. The method of claim 12 wherein said selecting comprises alternating between selection of the first and second scan test input signals over a plurality of cycles of a clock signal in a scan test mode of operation.
14. The method of claim 13 wherein said selecting further comprises temporarily preventing the alternating between selection of the first and second scan test input signals over the plurality of cycles of the clock signal in the scan test mode of operation after a designated number of the cycles.
15. The method of claim 12 wherein a first control signal of said one or more control signals comprises a toggle signal that causes said selecting to alternate between selection of the first and second scan test input signals over a plurality of cycles of a clock signal in a scan test mode of operation.
16. A computer program product comprising a non-transitory computer-readable storage medium having computer program code embodied therein for use in scan testing an integrated circuit, wherein the computer program code when executed causes the integrated circuit to perform the method of claim 12 .
17. The method of claim 12 wherein:
the plurality of address input signal lines comprise a read address signal line and a write address signal line; and
said selecting comprises temporarily preventing alternating between selection of the first and second distinct address values for each of the read and write address signal lines over a plurality of cycles of a clock signal in a scan test mode of operation after a designated number of the cycles.
18. A method of scan testing an integrated circuit, comprising:
providing input and output scan chains coupled to respective input and output interfaces of a circuit core via respective functional logic blocks; and
selecting a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals;
wherein a first control signal of said one or more control signals is generated as a function of a toggle signal and a flag signal, where the flag signal temporarily prevents said selecting from alternating between selection of the first and second scan test input signals over a plurality of cycles of a clock signal in a scan test mode of operation after a designated number of the cycles.
19. A processing system comprising:
a processor; and
a memory coupled to the processor and configured to store information characterizing an integrated circuit design comprising at least one circuit core;
wherein the processing system is configured to provide, within the integrated circuit design, scan test circuitry comprising:
input and output scan chains coupled to respective input and output interfaces of the circuit core via respective functional logic blocks; and
interface signal selection circuitry configured to select a particular one of a functional input signal and a plurality of scan test input signals for application to one or more designated input signal lines of the input interface of the circuit core responsive to one or more control signals;
wherein first and second scan test input signals of the plurality of scan test input signals comprise respective first and second distinct address values and said one or more designated input signal lines of the input interface of the circuit core comprise a plurality of address input signal lines of an embedded memory.
20. The processing system of claim 19 wherein the plurality of address input signal lines comprise a read address signal line and a write address signal line, and an address value on each of the read and write address signal lines remains the same over a plurality of cycles of a clock signal.