IP Library Granted Patent US 9,236,947
Granted Patent B2
US 9,236,947 · App. 14/016,390 · Granted Jan 12, 2016

Fast thin-film light emitting diode

Inventor: Nikolaus W. Schunk (Maxhuette-Haidhof, DE)
Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
H04B10/502H01L33/06H01L33/145
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Quick Facts
Patent No.
US 9,236,947
App. No.
14/016,390
Granted
Jan 12, 2016
Kind
B2
Abstract

A thin-film Light Emitting Diode (LED) and methods of manufacturing the same are disclosed. Specifically, the thin-film LED is provided with an epitaxial layer having a proton implantation that controls the size of the active volume. Controlling the size of the active volume enables the thin-film LED to enjoy decreased rise and fall times, thereby achieving a thin-film LED that is useable for transmission in high transmission rate communication systems.

Claims (38)

1. A thin-film Light Emitting Diode (LED), comprising:

a substrate;

a first electrode formed on the substrate;

a second electrode;

an epitaxial layer positioned between the first electrode and the second electrode and configured such that an electrical potential applied between the first electrode and the second electrode cause a portion of the active volume to emit light of a predetermined wavelength, wherein the epitaxial layer is provided with a proton implantation that destroys a crystalline structure of the epitaxial layer in selected locations to create an active volume having an area smaller than a total area of the epitaxial layer; and

a passivation layer positioned over the active volume and being configured to at least one of: reduce reflection at an LED-air interface and protect material of the epitaxial layer from an environment surrounding the thin-film LED.

2. The thin-film LED of claim 1 , wherein the area of the active volume is constricted by the proton implantation thereby increasing a carrier density in the active volume.

3. The thin-film LED of claim 1 , wherein the selected locations of the epitaxial layer having the proton implantation is substantially inhibited from conducting current.

4. The thin-film LED of claim 1 , wherein the active volume enables the LED to transmit data at a rate greater than 1 Gigabit/sec.

5. The thin-film LED of claim 1 , further comprising:

an attenuation layer positioned over the active volume thereby decreasing an intensity of light emitted from the thin-film LED by absorbing at least some of the light emitted by the active volume.

6. The thin-film LED of claim 5 , wherein the attenuation layer comprises oxidized alumina.

7. The thin-film LED of claim 5 , wherein the attenuation layer comprises a thickness designed to accommodate power ratings of an optical data communication system.

8. The thin-film LED of claim 1 , wherein the passivation layer reduces reflection at an LED-air interface.

9. The thin-film LED of claim 1 , wherein the active volume comprises at least two and no more than seven Quantum Wells.

10. The thin-film LED of claim 1 , wherein the active volume is configured to produce light with rise and fall times no greater than 5 ns.

11. The thin-film LED of claim 1 , wherein a thickness of the proton implantation is less than a thickness of the epitaxial layer.

12. The thin-film LED of claim 1 , wherein the predetermined wavelength is between approximately 400 nm and approximately 1400 nm.

13. A Light Emitting Diode (LED) for use in a high speed optical data transmission system, the LED comprising:

a substrate;

an anode established on the substrate as a thin film;

a cathode established on the substrate as a thin film;

an epitaxial layer established between the anode and cathode, the epitaxial layer comprising a proton implantation that decreases an active volume of the epitaxial layer from a first area to a second area;

an attenuation layer established on at least part of the active volume; and

a mirror layer established on the substrate, wherein the active volume is positioned between the mirror layer and the attenuation layer.

14. The LED of claim 13 , wherein the proton implantation destroys a crystalline structure of the epitaxial layer.

15. The LED of claim 13 , wherein the attenuation layer comprises oxidized alumina.

16. The LED of claim 13 , wherein the substrate comprises at least one of sapphire, Silicon Carbide, Silicon, Gallium Arsenide, and Germanium, wherein the anode and cathode comprise conductive metal, and wherein the epitaxial layer comprises Gallium Nitride.

17. The LED of claim 13 , wherein the mirror layer comprises at least one of gold, silver, and alumina.

18. An optical communications system, comprising:

a transmitter including one or more thin-film Light Emitting Diodes, each of the one or more thin-film LEDs being configured to transmit data at a rate greater than or equal to approximately 1 Gigabit/sec, wherein each of the one or more thin-film LEDs comprise:

a substrate;

an anode established on the substrate;

a cathode established on the substrate;

an epitaxial layer established between the anode and cathode, the epitaxial layer comprising a proton implantation that constricts a light-emitting volume of the epitaxial layer to enable data transmission rates to be greater than or equal to approximately 1 Gigabit/sec;

an attenuation layer established on at least part of the epitaxial layer; and

a passivation layer positioned over the light-emitting volume.

19. The system of claim 18 , wherein the passivation layer comprises at least one of a quarter wavelength thickness and an odd multiple thickness to minimize reflections of light at an LED-air interface.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 047422 FRAME: 0464. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 6, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048883/0702 →
MERGER Recorded Oct 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047422/0464 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2013
From: SCHUNK, NIKOLAUS W.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 031141/0016 →
Continuity (1)
Related Publication 20150063829A1 · Mar 5, 2015