APPARATUS AND METHOD FOR TESTING ELECTRONIC DEVICE, AND NOISE BLOCKING MODULE THEREFOR
An apparatus for testing an electronic device in response to a radio frequency (RF) input signal includes an RF input signal generation source, a noise blocking unit, an RF signal transmission medium, a passband measurement unit, and a control unit. The RF input signal generation source generates the RF input signal. The noise blocking unit has a passband for passing the RF input signal and blocking noise to provide a noise blocked RF input signal. The RF signal transmission medium transmits the noise blocked RF input signal to the electronic device. The passband measurement unit measures the passband of the noise blocking unit based on the noise blocked RF input signal and outputs a passband value. The control unit performs feedback control of the passband by varying a control signal output to the noise blocking unit based on the passband value, so that the passband falls within a target range.
1 . An apparatus for testing an electronic device in response to a radio frequency (RF) input signal, the apparatus comprising:
an RF input signal generation source configured to generate the RF input signal;
a noise blocking unit having a passband for passing the RF input signal and blocking noise to provide a noise blocked RF input signal;
an RF signal transmission medium for transmitting the noise blocked RF input signal to the electronic device;
a passband measurement unit configured to measure the passband of the noise blocking unit based on the noise blocked RF input signal and output a passband value; and
a control unit configured to perform feedback control of the passband by varying a control signal output to the noise blocking unit based on the passband value, so that the passband falls within a target range.
2 . The apparatus of claim 1 , wherein the noise blocking unit comprises one or more noise filters configured to block noise having a frequency outside the passband.
3 . The apparatus of claim 2 , wherein the one or more noise filters are band-pass filters.
4 . The apparatus of claim 2 , wherein each of the one or more noise filters comprises one or more variable capacitors, and
wherein each of the one or more variable capacitors has capacitance that varies with a voltage of the control signal.
5 . The apparatus of claim 4 , further comprising:
a control signal generation unit configured to receive an adjustment signal from the control unit and to determine the voltage of the control signal based on the adjustment signal.
6 . The apparatus of claim 1 , wherein the control unit comprises a microcontroller unit (MCU).
7 . A noise blocking module, comprising:
a noise blocking unit having a passband for passing a radio frequency (RF) signal and blocking noise;
an RF signal transmission medium for transmitting the RF signal via the noise blocking unit;
a passband measurement unit configured to measure the passband and output a passband value; and
a control unit configured to perform a feedback control of the passband by varying a control signal provided to the noise blocking unit based on the passband value, so that the passband falls within a target range.
8 . The noise blocking module of claim 7 , wherein the noise blocking unit includes at least one noise filter configured to block noise having frequencies outside the passband.
9 . The noise blocking module of claim 8 , wherein the at least one noise filter comprises a band-pass filter.
10 . The noise blocking module of claim 8 , wherein the at least one noise filter includes at least one variable capacitor having a capacitance that varies with a voltage of the control signal.
11 . The noise blocking module of claim 10 , further comprising:
a control signal generation unit configured to receive an adjustment signal from the control unit and determine the voltage of the control signal based on the adjustment signal.
12 . The noise blocking module of claim 7 , wherein the control unit comprises a microcontroller unit (MCU).
13 . The noise blocking module of claim 1 , further comprising:
a housing containing at least the noise blocking unit, and formed of a material that blocks or absorbs noise from the outside.
14 . A method for testing an electronic device configured to process a radio frequency (RF) signal, the method comprising:
passing the RF signal and blocking noise with a passband of a noise blocking device;
measuring the passband to obtain a passband value;
performing feedback control of the passband by varying a control signal provided to the noise blocking device based on the passband value, so that the passband falls within a target range;
transmitting the RF signal to the electronic device through the noise blocking device having the passband that falls within the target range; and
analyzing an output from the electric device,
wherein the feedback control of the passband is performed using a control device having a processor and a memory.
15 . The method of claim 14 , wherein the noise blocking device comprises one or more noise filters configured to block noise having frequencies outside the passband.
16 . The method of claim 15 , wherein the noise filters are band-pass filters.
17 . The method of claim 15 , wherein each of the noise filters has one or more variable capacitors, and
wherein each of the variable capacitors has capacitance which varies with a voltage of the control signal.
18 . The method of claim 17 , wherein performing the feedback control of the passband includes receiving an adjustment signal from the control device and determining the voltage of the control signal based on the adjustment signal.
19 . The method of claim 15 , wherein the control unit is a microcontroller unit (MCU).
20 . The method of claim 14 , wherein the electronic device is an RF power amplifier.