IP Library Granted Patent US 9,455,681
Granted Patent B2
US 9,455,681 · App. 14/191,771 · Granted Sep 27, 2016

Bulk acoustic wave resonator having doped piezoelectric layer

Inventors: Chris Feng (Fort Collins, CO); Phil Nikkel (Westminster, CO); John Choy (Westminster, CO); Kevin J. Grannen (Thronton, CO); Tangshiun Yeh (Fort Collins, CO)
Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
H03H9/02031H03H9/02157H03H9/173H03H9/175
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Quick Facts
Patent No.
US 9,455,681
App. No.
14/191,771
Granted
Sep 27, 2016
Kind
B2
Abstract

In accordance with a representative embodiment, a bulk acoustic wave (BAW) resonator comprises: a first electrode having a first electrode thickness; a second electrode having a second electrode thickness; and a piezoelectric layer having a piezoelectric layer thickness and being disposed between the first and second electrodes, the piezoelectric layer comprising a piezoelectric material doped with at least one rare earth element. For a particular acoustic coupling coefficient (kt 2 ) value and a series resonance frequency (F s ) of the BAW resonator, the first electrode thickness and the second electrode thickness are each greater than a thickness of a first electrode and a thickness of a second electrode of a BAW resonator comprising an undoped piezoelectric layer.

Claims (28)

1. A bulk acoustic wave (BAW) resonator comprising:

a first electrode having a first electrode thickness;

a second electrode having a second electrode thickness; and

a piezoelectric layer having a piezoelectric layer thickness and being disposed between the first and second electrodes, the piezoelectric layer comprising a piezoelectric material doped with at least one rare earth element, wherein for a particular acoustic coupling coefficient (kt 2 ) value and series resonance frequency (F s ) of the BAW resonator, the first electrode thickness and the second electrode thickness are respectively greater than a thickness of a first electrode and a thickness of a second electrode of a comparable BAW resonator comprising identical layers and materials except for comprising an undoped piezoelectric layer of the same piezoelectric material.

2. A BAW resonator as claimed in claim 1 , wherein, for the particular F s and kt 2 value, the piezoelectric layer comprising the piezoelectric material doped with at least one rare earth element is thinner than a thickness of the undoped piezoelectric layer of the comparable BAW resonator.

3. A BAW resonator as claimed in claim 2 , wherein, for the particular F s and kt 2 value, the first electrode thickness and the second electrode thickness are respectively approximately twice the first electrode thickness and the second electrode thickness of the comparable BAW resonator comprising the undoped piezoelectric layer.

4. A BAW resonator as claimed in claim 2 , wherein, for the particular F s and kt 2 value, the thickness of the piezoelectric layer comprising the piezoelectric material doped with at least one rare earth element is approximately one-half the thickness of the undoped piezoelectric layer of the comparable BAW resonator.

5. A BAW resonator as claimed in claim 1 , wherein, for the particular F s and kt 2 value, the first electrode thickness and the second electrode thickness are respectively approximately twice the first electrode thickness and the second electrode thickness of the comparable BAW resonator comprising the undoped piezoelectric layer.

6. A BAW resonator as claimed in claim 1 , wherein the kt 2 is approximately 7.0%.

7. A BAW resonator as claimed in claim 6 , wherein the piezoelectric layer comprising the piezoelectric material doped with at least one rare earth element has a thickness of approximately 5800 Å.

8. A BAW resonator as claimed in claim 6 , wherein the first electrode has a thickness of approximately 4100 Å.

9. A BAW resonator as claimed in claim 6 , wherein the second electrode has a thickness of approximately 3000 Å.

10. A BAW resonator as claimed in claim 1 , wherein the kt 2 is in the range of approximately 6.5% to approximately 9.0%.

11. A BAW resonator as claimed in claim 10 , wherein the piezoelectric layer comprising the piezoelectric material doped with at least one rare earth element has a thickness in the range of approximately 4600 Å to approximately 12000 Å.

12. A BAW resonator as claimed in claim 10 , wherein the second electrode has a thickness in the range of approximately 3300 Å to approximately 2000 Å.

13. A BAW resonator as claimed in claim 10 , wherein the first electrode of has a thickness in the range of approximately 4500 Å to approximately 2500 Å.

14. A BAW resonator as claimed in claim 1 , further comprising an acoustic reflector disposed beneath the first electrode, the second electrode and the piezoelectric layer, wherein an overlap of the acoustic reflector, the first electrode, the second electrode and the piezoelectric layer defines an active area of the acoustic resonator.

15. A BAW resonator as claimed in claim 14 , wherein the acoustic reflector comprises a cavity disposed in a substrate over which the first electrode, the second electrode and the piezoelectric layer are disposed.

16. A BAW resonator as claimed in claim 14 , wherein the acoustic reflector comprises a plurality of layers having alternating high acoustic impedance and low acoustic impedance.

17. A BAW resonator as claimed in claim 1 , wherein the piezoelectric material comprises aluminum nitride (AlN).

18. A BAW resonator as claimed in claim 17 , wherein the at least one rare earth element is incorporated into a crystal lattice of the AlN piezoelectric material.

19. A BAW resonator as claimed in claim 17 , wherein the at least one rare earth element comprises scandium (Sc).

20. A BAW resonator as claimed in claim 19 , wherein an atomic percentage of the Sc in the AlN piezoelectric material is approximately 0.5% to less than approximately 10.0%.

21. A BAW resonator as claimed in claim 19 , wherein an atomic percentage of the Sc in the AlN piezoelectric material is approximately 0.5% to approximately 44%.

22. A BAW resonator as claimed in claim 19 , wherein an atomic percentage of the Sc in the AlN piezoelectric material is approximately 2.5% to less than approximately 5.0%.

23. A BAW resonator as claimed in claim 17 , wherein the at least one rare earth element comprises two or more rare earth elements incorporated into a crystal lattice of the AlN piezoelectric material.

24. A BAW resonator as claimed in claim 23 , wherein the two or more rare earth elements comprise scandium (Sc) and erbium (Er).

25. An BAW resonator as claimed in claim 24 , wherein the two or more rare earth elements further comprise yttrium (Y).

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 047422 FRAME: 0464. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 6, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048883/0702 →
MERGER Recorded Oct 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047422/0464 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2014
From: FENG, CHRIS; NIKKEL, PHIL; CHOY, JOHN; GRANNEN, KEVIN J.; YEH, TANGSHIUN
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 032315/0390 →
Continuity (1)
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