METHOD AND SYSTEM FOR REDUCING MEMORY TEST TIME UTILIZING A BUILT-IN SELF-TEST ARCHITECTURE
Methods and systems for reducing memory test time utilizing a serial per march element communicating architecture. A small number of slow speed signals can be configured between a BIST wrapper and a BIST controller to transfer information in accordance with a BIST sequence that includes a number of march elements. An information transfer protocol can be implemented between the BIST wrapper and the BIST controller to transfer Information with respect to each march element that includes a number of BIST operations, address sequencing information, and data pattern. A command register can be loaded utilizing the slow speed signals and slow speed clock and content of the command register can be decoded. An encoded BIST operation can then be executed once for each BIST operation per march element. The serial per march element communicating architecture reduces test time as a communication overhead and a requirement for high speed wires are eliminated.
1 . A method for reducing memory test time, said method comprising:
assembling slow speed signals between a BIST wrapper and a BIST controller to transfer information in accordance with a BIST sequence that includes a plurality of march elements;
facilitating an information transfer protocol between said BIST wrapper and said BIST controller to transfer said information with respect to each march element among said plurality of march elements; and
loading a command register utilizing said slow speed signals and a slow BIST clock to decode a content of said command register so as to execute an encoded BIST operation once with respect to each BIST operation per march element.
2 . The method of claim 1 further comprising reducing a test time via said slow speed signals and said information transfer protocol.
3 . The method of claim 1 wherein said march element comprises at least one of: a plurality of BIST operations, an address sequencing information, and a data pattern.
4 . The method of claim 1 further comprising:
pulsing a scan force signal in order to execute an operation for each march element once a content of said command register structure that includes a shorter BIST run is loaded;
receiving a memory access command from said BIST controller by said BIST wrapper in accordance with said BIST sequence via said slow speed signals; and
executing a plurality of memory access and comparison operations.
5 . The method of claim 1 further comprising:
controlling a set of BIST through said BIST sequence by said BIST controller; and
reading a plurality of status and diagnostic information from said BIST wrapper.
6 . The method of claim 1 further comprising:
separating said BIST sequence into at least one individual memory BIST operation during a BIST run phase by said BIST controller wherein said information is communicated to said BIST wrapper via said information transfer protocol.
7 . The method of claim 1 further comprising:
determining a plurality of signals running between said BIST controller and said BIST wrapper by said information transfer protocol; and
reading a result of said BIST run from said BIST wrapper utilizing said BIST controller.
8 . A system for reducing memory test time, said system comprising:
a processor; and
a computer-usable medium embodying computer program code, said computer-usable medium capable of communicating with the processor, said computer program code comprising instructions executable by said processor and configured for:
assembling slow speed signals between a BIST wrapper and a BIST controller to transfer information in accordance with a BIST sequence that includes a plurality of march elements;
facilitating an information transfer protocol between said BIST wrapper and said BIST controller to transfer said information with respect to each march element among said plurality of march elements; and
loading a command register utilizing said slow speed signals and a slow BIST clock to decode a content of said command register so as to execute an encoded BIST operation once with respect to each BIST operation per march element.
9 . The system of claim 8 wherein said instructions are further configured for reducing a test time via said slow speed signals and said information transfer protocol.
10 . The system of claim 8 wherein said march element comprises at least one of: a plurality of BIST operations, an address sequencing information, and a data pattern.
11 . The system of claim 8 wherein said instructions are further configured for:
pulsing a scan force signal in order to execute an operation for each march element once a content of said command register structure that includes a shorter BIST run is loaded;
receiving a memory access command from said BIST controller by said BIST wrapper in accordance with said BIST sequence via said slow speed signals; and
executing a plurality of memory access and comparison operations.
12 . The system of claim 8 wherein said instructions are further configured for:
controlling a set of BIST through said BIST sequence by said BIST controller; and
reading a plurality of status and diagnostic information from said BIST wrapper.
13 . The system of claim 8 wherein said instructions are further configured for separating said BIST sequence into at least one individual memory BIST operation during a BIST run phase by said BIST controller wherein said information is communicated to said BIST wrapper via said information transfer protocol.
14 . The system of claim 8 wherein said instructions are further configured for:
determining a plurality of signals running between said BIST controller and said BIST wrapper by said information transfer protocol; and
reading a result of said BIST run from said BIST wrapper utilizing said BIST controller.
15 . A processor-readable medium storing code representing instructions to cause a process for reducing memory test time, said code comprising code to:
assemble slow speed signals between a BIST wrapper and a BIST controller to transfer information in accordance with a BIST sequence that includes a plurality of march elements;
facilitate an information transfer protocol between said BIST wrapper and said BIST controller to transfer said information with respect to each march element among said plurality of march elements; and
load a command register utilizing said slow speed signals and a slow BIST clock to decode a content of said command register so as to execute an encoded BIST operation once with respect to each BIST operation per march element.
16 . The processor-readable medium of claim 15 wherein said code further comprises code to reduce a test time via said slow speed signals and said information transfer protocol.
17 . The processor-readable medium of claim 15 wherein said march element comprises at least one of: a plurality of BIST operations, an address sequencing information, and a data pattern.
18 . The processor-readable medium of claim 15 wherein said code further comprises code to:
pulse a scan force signal in order to execute an operation for each march element once a content of said command register structure that includes a shorter BIST run is loaded;
receive a memory access command from said BIST controller by said BIST wrapper in accordance with said BIST sequence via said slow speed signals; and
execute a plurality of memory access and comparison operations.
19 . The processor-readable medium of claim 15 wherein said code further comprises code to:
control a set of BIST through said BIST sequence by said BIST controller; and
read a plurality of status and diagnostic information from said BIST wrapper.
20 . The processor-readable medium of claim 15 wherein said code further comprises code to separate said BIST sequence into at least one individual memory BIST operation during a BIST run phase by said BIST controller wherein said information is communicated to said BIST wrapper via said information transfer protocol.