Semiconductor system
To provide a semiconductor system including a plurality of core chips and an interface chip that controls the core chips. Each of the core chips includes an internal voltage generating circuit. The interface chip includes an unused chip information holding circuit that stores therein unused chip information of the core chips. The core chips respectively receive the unused chip information from the unused chip information holding circuit. When the unused chip information indicates an unused state, the internal voltage generating circuits are inactivated, and when the unused chip information indicates a used state, the internal voltage generating circuits are activated. With this configuration, unnecessary power consumption by the unused chips is reduced.
1. A method for controlling power in a plurality of stacked semiconductor devices interconnected by through electrodes, comprising the steps of:
receiving an unused chip signal in each of the plurality of stacked semiconductor devices through one or more through electrodes;
enabling an internal voltage generating circuit in each of the plurality of stacked semiconductor devices if the corresponding unused chip signal has a first logic level; and
disabling the internal voltage generating circuit in each of the plurality of stacked semiconductor devices if the corresponding unused chip signal has a second logic level not equal to the first logic level.
2. The method as claimed in claim 1 wherein each unused chip signal is received through a dedicated through electrode.
3. The method as claimed in claim 2 wherein the unused chip signals are received through shifted through electrodes.
4. The method as claimed in claim 1 wherein the unused chip signals are provided by an interface chip stacked together with the plurality of stacked semiconductor devices.
5. The method as claimed in claim 4 wherein the unused chip signals are provided by an unused chip information holding circuit on the interface chip.
6. The method as claimed in claim 5 wherein the unused chip information holding circuit comprises a plurality of fuses.
7. The method as claimed in claim 6 wherein unused chip information is written to the fuses during an operation test after assembly of the plurality of stacked semiconductor devices.
8. The method as claimed in claim 1 wherein the internal voltage generating circuit provides an internal voltage higher than an external power supply potential.
9. The method as claimed in claim 1 wherein the internal voltage generating circuit provides an internal voltage lower than an external power supply potential.
10. The method as claimed in claim 1 wherein the internal voltage generating circuit provides a plurality of internal voltages.
11. The method as claimed in claim 1 wherein the plurality of stacked semiconductor devices are memory devices.
12. The method as claimed in claim 1 wherein the plurality of stacked semiconductor devices are dynamic random access memory devices.
13. A system comprising:
a plurality of stacked semiconductor devices interconnected by through electrodes, each of the stacked semiconductor devices being configured to:
receive an unused chip signal through one or more of the through electrodes;
enable an internal voltage generating circuit if the corresponding unused chip signal has a first logic level; and
disable an internal voltage generating circuit if the corresponding unused chip signal has a second logic level that is not equal to the first logic level.
14. The system as claimed in claim 13 wherein each of the plurality of stacked semiconductor devices is configured to receive the unused chip signal through a dedicated through electrode.
15. The system as claimed in claim 14 wherein the plurality of stacked semiconductor devices are configured to receive the unused chip signals through shifted through electrodes.
16. The system as claimed in claim 13 wherein the system comprises an interface chip stacked together with the plurality of stacked semiconductor devices, the interface chip being configured to provide the unused chip signals.
17. The system as claimed in claim 16 wherein the interface chip comprises an unused chip information holding circuit, the unused chip information holding circuit being configured to provide the unused chip signals.
18. The system as claimed in claim 17 wherein the unused chip information holding circuit comprises a plurality of fuses.
19. The system as claimed in claim 18 wherein the interface chip is configured to write the unused chip information to the fuses during an operation test performed after assembly of the plurality of stacked semiconductor devices.
20. The system as claimed in claim 13 wherein the internal voltage generating circuit is configured to provide an internal voltage higher than an external power supply potential.
21. The system as claimed in claim 13 wherein the internal voltage generating circuit is configured to provide an internal voltage lower than an external power supply potential.
22. The system as claimed in claim 13 wherein the internal voltage generating circuit is configured to provide a plurality of internal voltages.
23. The system as claimed in claim 13 wherein the plurality of stacked semiconductor devices are memory devices.
24. The system as claimed in claim 13 wherein the plurality of stacked semiconductor devices are dynamic random access memory devices.