SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
A semiconductor device which is provided with: a wiring substrate which has a first region, and a relay pad and a connection pad that are arranged outside the first region; a first semiconductor chip which has an electrode pad that is formed on one surface, and which is mounted on the first region of the wiring substrate; a first wire that connects the electrode pad and the relay pad with each other; and a second wire that connects the relay pad and the connection pad with each other.
1 . A semiconductor device comprising:
a wiring board having a first region, and first and second connection pads disposed outside the first region;
a first semiconductor chip which has a first electrode formed on one surface thereof and is mounted in the first region of the wiring board;
a first wire for connecting the first electrode and the first connection pad; and
a second wire for connecting the first connection pad and the second connection pad.
2 . The semiconductor device as claimed in claim 1 , wherein the first wire and the second wire are continuously formed by a single wire.
3 . The semiconductor device as claimed in claim 1 , wherein the first wire and the second wire are formed by separate wires.
4 . The semiconductor device as claimed in claim 1 , wherein:
wiring is further provided outside the first region; and
the second wire is disposed in such a way as to straddle said wiring.
5 . The semiconductor device as claimed in claim 4 , wherein:
the first semiconductor chip has a substantially rectangular shape;
a plurality of the first electrodes are disposed along first and second short sides of the substantially rectangular shape;
the number of first electrodes disposed on the first short side is greater than the number of first electrodes disposed on the second short side; and
the first connection pad and the second connection pad are connected by way of the second wire on the side of the first short side.
6 . The semiconductor device as claimed in claim 5 , wherein the side of the first short side constitutes a dense wiring region in which the wiring is densely packed.
7 . The semiconductor device as claimed in claim 6 , wherein:
the first connection pad forms a relay pad in the dense wiring regions; and
the second wire is connected to the second connection pad via the relay pad while passing over the wiring.
8 . The semiconductor device as claimed in claim 7 , wherein the first wire is connected between the first electrode and the relay pad in a bent state.
9 . The semiconductor device as claimed in claim 5 , wherein:
another semiconductor chip having substantially the same configuration as the first semiconductor chip is disposed between the wiring board and the first semiconductor chip;
the first semiconductor chip is stacked in such a way as to be rotated through 90° with respect to said other semiconductor chip; and
the gap between the first short side and an end of the wiring board is wider than the gap between the second short side and an end of the wiring board.
10 . The semiconductor device as claimed in claim 1 , further comprising:
a second semiconductor chip which has a second electrode formed on one surface thereof and is stacked on the first semiconductor chip; and
a third wire for connecting the first electrode and the second electrode.
11 . The semiconductor device as claimed in claim 7 , wherein a plurality of the relay pads are provided between the first electrode and the second connection pad.
12 . A method for manufacturing a semiconductor device, comprising:
preparing a wiring board having, on one surface, a first region, and first and second connection pads disposed outside the first region;
mounting a first semiconductor chip which has a first electrode formed on one surface thereof in the first region of the wiring board;
connecting the first electrode and the first connection pad by means of a first wire; and
connecting the first connection pad and the second connection pad by means of a second wire.
13 . The method for manufacturing a semiconductor device as claimed in claim 12 , further comprising forming a sealing resin on said one surface of the wiring board in such a way as to cover at least the first semiconductor chip.
14 . The method for manufacturing a semiconductor device as claimed in claim 12 , wherein the first wire and the second wire are continuously formed by a single wire.
15 . The method for manufacturing a semiconductor device as claimed in claim 12 , wherein the first wire and the second wire are formed by separate wires.
16 . The method for manufacturing a semiconductor device as claimed in claim 12 , further comprising:
forming wiring outside the first region; and
forming the second wire in such a way as to straddle said wiring.
17 . The method for manufacturing a semiconductor device as claimed in claim 12 , further comprising:
stacking a second semiconductor chip having a second electrode formed on one surface thereof on the first semiconductor chip; and
connecting the first electrode and the second electrode by means of a third wire.
18 . The method for manufacturing a semiconductor device as claimed in claim 17 , further comprising:
preforming a stud bump on the first electrode of the first semiconductor chip;
bonding a ball section of a wire in a capillary by thermosonic bonding on the second electrode of the second semiconductor chip;
moving the capillary whereby the ball section is bonded by means of thermosonic bonding to the stud bump in such a way that the wire describes a predetermined loop; and
moving the capillary in such a way that the wire further describes a loop without being cut, whereby the wire is bonded by means of thermosonic bonding to the first and second connection pads on the wiring board, and the first, second and third wires are continuously formed as a result.