IP Library Granted Patent US 10,198,316
Granted Patent B2
US 10,198,316 · App. 14/925,688 · Granted Feb 5, 2019

Systems and methods for efficient flash memory access

Inventors: Razmik Karabed (San Jose, CA); Zhijun Zhao (Fremont, CA); Shaohua Yang (San Jose, CA)
Assignee: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
G06F11/1072G11C29/52H03M7/00H03M13/1111H03M13/6588
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Quick Facts
Patent No.
US 10,198,316
App. No.
14/925,688
Granted
Feb 5, 2019
Kind
B2
Abstract

Embodiments are related to systems and methods for data storage, and more particularly to systems and methods for storing and accessing data from a flash memory.

Claims (33)

1. A system for accessing a flash memory device, the system comprising:

a first encoder circuit operable to apply a first encoding algorithm to a user data set to yield a first number of first algorithm codewords, wherein each of the first number of the first algorithm codewords includes a second number of elements;

a second encoder circuit operable to apply a second encoding algorithm to a combination of the first number of the first algorithm codewords to yield a second number of sets of a third number of voltage values; wherein each of the sets of the third number of voltage values represents corresponding elements of each of the first number of the first algorithm codewords; and

a write circuit operable to apply voltages indicated by each of the third number of voltage values to respective flash memory cells.

2. The system of claim 1 , wherein the first encoding algorithm is a low density parity check algorithm, and wherein the first algorithm codewords are low density parity check algorithm codewords.

3. The system of claim 1 , wherein the first number is five, and wherein the third number is three, wherein the flash memory cells are two-bit memory cells, and wherein each of the three voltage values is selected from a group consisting of: 0, 1, 2, and 3.

4. The system of claim 1 , wherein each of the elements of the second number of elements are indicated at positions of the first algorithm codewords.

5. The system of claim 1 , wherein the system is implemented as part of an integrated circuit.

6. The system of claim 1 , wherein the system further comprises:

a data read circuit operable to compare voltages read from a group of flash memory cells with a first threshold value to yield a binary output set, wherein each of the flash memory cells is programmed to hold two or more bits;

a first data decoding circuit operable to decode the binary output set to yield at least one of the first algorithm codewords; and

a second data decoding circuit operable to decode the at least one of the first algorithm codewords.

7. The system of claim 6 , wherein the binary output set is a first binary output set wherein the at least one of the first algorithm codewords includes a first algorithm codeword, wherein the data read circuit is further operable to compare voltages read from the group of flash memory cells with a second threshold value to yield a second binary output set, and wherein the first data decoding circuit is further operable to decode the second binary output set to yield at least a second and third of the first algorithm codewords.

8. The system of claim 7 , wherein the data read circuit is further operable to compare voltages read from the group of flash memory cells with a third threshold value to yield a third binary output set, and wherein the first data decoding circuit is further operable to decode the third binary output set to yield at least a fourth and a fifth of the first algorithm codewords.

9. The system of claim 6 , wherein the second data decoding circuit is a low density parity check decoding circuit.

10. The system of claim 9 , wherein five low density parity check codewords are represented as voltages in the a group of flash memory cells.

11. The system of claim 9 , wherein each three flash memory cells of the group of flash memory cells are programmed with voltages representing a single element from each of the five low density parity check codewords.

12. A system for accessing a flash memory device, the system comprising:

a data read circuit operable to compare voltages read from a group of flash memory cells with a first threshold value to yield a binary output set, wherein each of the flash memory cells is programmed to hold two or more bits;

a first data decoding circuit operable to decode the binary output set to yield at least one encoded codeword; and

a second data decoding circuit operable to decode the at least one encoded codeword.

13. The system of claim 12 , wherein the binary output set is a first binary output set, wherein the at least one encoded codeword includes a first encoded codeword, wherein the data read circuit is further operable to compare voltages read from the group of flash memory cells with a second threshold value to yield a second binary output set, and wherein the first data decoding circuit is operable to decode the second binary output set to yield at least a second and third encoded codeword.

14. The system of claim 13 , wherein the data read circuit is further operable to compare voltages read from the group of flash memory cells with a third threshold value to yield a third binary output set, and wherein the first data decoding circuit is operable to decode the third binary output set to yield at least a fourth and a fifth encoded codeword.

15. The system of claim 12 , wherein the second data decoding circuit is a low density parity check decoding circuit.

16. The system of claim 15 , wherein five low density parity check codewords are represented as voltages in the a group of flash memory cells.

17. The system of claim 15 , wherein each three flash memory cells of the group of flash memory cells are programmed with voltages representing a single element from each of the five low density parity check codewords.

18. The system of claim 12 , wherein the system is implemented as part of an integrated circuit.

19. The system of claim 12 , wherein the system further comprises:

a first encoder circuit operable to apply a first encoding algorithm to a user data set to yield a first number of the encoded codewords, wherein each of the first number of encoded codewords includes a second number of elements;

a second encoder circuit operable to apply a second encoding algorithm to a combination of the first number of the encoded codewords to yield a second number of sets of a third number of voltage values; wherein each of the sets of the third number of voltage values represents corresponding elements of each of the first number of the encoded codewords; and

a write circuit operable to apply voltages indicated by each of the third number of voltage values to respective ones of the flash memory cells.

20. The system of claim 19 , wherein the first encoding algorithm is a low density parity check algorithm, and wherein the encoded codewords are low density parity check algorithm codewords.

21. The system of claim 19 , wherein the first number is five, and wherein the third number is three.

Assignments (8)
MERGER Recorded Mar 3, 2023
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED; BROADCOM INTERNATIONAL PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 062952/0850 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2020
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
To: BROADCOM INTERNATIONAL PTE. LTD.
Reel/Frame 053771/0901 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF THE MERGER AND APPLICATION NOS. 13/237,550 AND 16/103,107 FROM THE MERGER PREVIOUSLY RECORDED ON REEL 047231 FRAME 0369. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 8, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048549/0113 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047231/0369 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2016
From: KARABED, RAZMIK; ZHAO, ZHIJUN; YANG, SHAOHUA
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037666/0590 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2015
From: KARABED, RAZMIK; YANG, SHAOHUA; ZHAO, ZHIJUN
To: AVAGO TECHNOLOGIES IP (SINGAPORE) PTE. LTD.
Reel/Frame 036905/0995 →
Continuity (1)
Related Publication 20170123906A1 · May 4, 2017