Methods and apparatus for an output buffer
Various embodiments of the present technology may provide methods and apparatus for an output buffer. The output buffer is configured to perform in both a DP mode and an HDMI mode, as well as meet certain compliance conditions in an HDMI compliance testing mode. The output buffer includes a plurality of transistors and resistors arranged to operate in DP mode and HDMI mode. The plurality of transistors and resistors are arranged to reduce leakage current during the HDMI compliance testing mode.
1. An output buffer having an output pad, comprising:
a plurality of transistors, wherein each transistor comprises a source terminal, a drain terminal, a gate terminal, and a bulk terminal, comprising:
a first transistor connected in parallel with a second transistor; wherein the first and second transistors are connected to a supply voltage and a bulk potential; and
wherein a first resistor is connected to the bulk potential and the source terminal of the first transistor;
a third transistor connected between the first and second transistors; wherein the third transistor is also connected to the bulk potential and responsive to a first control signal; and
a fourth transistor connected:
in series with a second resistor; and
to the output pad;
wherein the second resistor is connected between the gate terminal of the first transistor and the supply voltage.
2. The output buffer according to claim 1 , wherein the bulk terminal of the fourth transistor is connected to the bulk potential.
3. The output buffer according to claim 1 , wherein each of the first, second, third, and fourth transistors comprise a p-channel transistor.
4. The output buffer according to claim 1 , further comprising a fifth transistor, from the plurality of transistors, connected in series with the second resistor and responsive to a second control signal.
5. The output buffer according to claim 4 , wherein the fifth transistor comprises an n-channel transistor.
6. The output buffer according to claim 1 , further comprising a termination resistor connected directly between the output pad and the first transistor.
7. The output buffer according to claim 1 , further comprising a sixth transistor connected in parallel with the third transistor and connected to the bulk potential.
8. A method for operating a multi-modal output buffer connected between a host device and a sink device, comprising:
operating the output buffer in a first mode comprising:
turning ON a first plurality of transistors, wherein the first plurality of transistors comprises:
a first p-channel transistor connected to a supply voltage, a bulk potential, and to an output pad via a termination resistor; and
a first n-channel transistor connected to a gate terminal of the first p-channel transistor; and
turning OFF a second plurality of transistors, wherein the second plurality of transistors comprises:
a second p-channel transistor connected between the gate terminal of the first p-channel transistor and the output pad; and
a third p-channel transistor connected to a drain terminal of the first p-channel transistor and the bulk potential;
operating the output buffer in a second mode comprising:
turning ON the third p-channel transistor; and
turning OFF the first p-channel transistor, the first n-channel transistor, and the second p-channel transistor; and
operating the output buffer in a test mode comprising:
turning ON the third p-channel transistor and second p-channel transistor; and
turning OFF the first p-channel transistor and the first n-channel transistor.
9. The method according to claim 8 , further comprising measuring a voltage at the output pad during the test mode.
10. The method according to claim 8 , wherein operating the output buffer in the test mode further comprises turning OFF the host device while the sink device is ON.
11. The method according to claim 8 , further comprising preventing leakage across the output pad during the test mode by providing a first resistor in series with the second p-channel transistor.
12. The method according to claim 8 , further comprising preventing leakage current across the output pad during the test mode by providing a second resistor connected to the bulk potential and a source terminal of the first p-channel transistor.
13. The method according to claim 8 , wherein the first mode is a Display Port mode and the second mode is a High-definition Multimedia Interface mode.
14. A system, comprising:
a host device connected to a sink device via an interface, wherein the interface is configured to operate in a first mode and a second mode, and comprises:
a receiver connected in series with an output buffer, wherein the output buffer is connected to the sink device via an output pad and comprises:
a plurality of transistors, wherein each transistor comprises a gate terminal, a drain terminal, a source terminal, and a bulk terminal; and wherein at least a first p-channel transistor and a second p-channel transistor, from the plurality of transistors, are connected to a common bulk potential via the respective bulk terminals;
a first resistor connected to the bulk terminal of the first p-channel transistor and the source terminal of the first p-channel transistor;
a third p-channel transistor, from the plurality of transistors, connected to the output pad and the gate terminal of the first p-channel transistor;
a second resistor connected to:
the source terminal of the third p-channel transistor; and
the gate terminal of the first p-channel transistor.
15. The system according to claim 14 , wherein the first and second p-channel transistors are connected to a supply voltage via the respective source terminals.
16. The system according to claim 14 , wherein the gate terminal of the second p-channel transistor is configured to receive a first control signal.
17. The system according to claim 14 , further comprising a first n-channel transistor, the plurality of transistors, configured to operate according to a second control signal and connected in series with the second resistor.
18. The system according to claim 14 , further comprising a termination resistor connected directly between the output pad and the first p-channel transistor.
19. The system according to claim 14 , wherein the bulk terminal of the third p-channel transistor is connected to the bulk potential.
20. The system according to claim 14 , further comprising a fourth p-channel transistor connected in series with a resistor and connected in parallel with the second p-channel transistor and connected to the common bulk potential.