Data storage device calibrating write parameter by pressing actuator against crash stop
A data storage device is disclosed comprising a head actuated over a disk surface by an actuator arm. The actuator is controlled to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different write parameter setting. Each burst is read in order to measure a quality metric for each burst, and an operating setting for the write parameter is configured based on the measured quality metrics.
1. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm; and
control circuitry configured to:
control the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, and read each burst in order to measure a quality metric for each burst, the writing of the plurality of bursts comprising:
writing a first burst at a first write angle of the disk surface, and
writing a second burst at a second write angle of the disk surface, and
configure an operating setting for the write parameter based on the measured quality metrics.
2. The data storage device as recited in claim 1 , wherein the control circuitry is further configured to:
during a first revolution of the disk surface, write the first burst at the first write angle;
during a second revolution of the disk surface, read the first burst to generate a first quality metric;
during a third revolution of the disk surface, write the second burst at the second write angle;
during a fourth revolution of the disk surface, read the second burst to generate a second quality metric; and
configure the operating setting for the write parameter based on the first and second measured quality metrics.
3. The data storage device as recited in claim 1 , wherein the control circuitry is further configured to:
during a first revolution of the disk surface, write the first burst at the first write angle and write the second burst at the second write angle during a first revolution of the disk surface;
during a second revolution of the disk surface, read the first burst to generate a first quality metric and read the second burst to generate a second quality metric; and
configure the operating setting for the write parameter based on the first and second measured quality metrics.
4. The data storage device as recited in claim 1 , wherein:
the head comprises a write coil; and
the write parameter comprises a write current applied to the write coil.
5. The data storage device as recited in claim 1 , wherein:
the head comprises a write assist element to assist a write coil; and
the write parameter comprises a bias applied to the write assist element.
6. The data storage device as recited in claim 5 , wherein the write assist element comprises a laser, the quality metric is a burst amplitude, and the control circuitry is further configured to:
increase the bias applied to the laser prior to writing each burst; and
configure the operating setting for the bias based on when the burst amplitude saturates.
7. The data storage device as recited in claim 1 , wherein the control circuitry is further configured to servo write the disk surface with servo sectors using the operating setting for the write parameter.
8. The data storage device as recited in claim 1 , wherein the control circuitry is further configured to erase the bursts from the disk surface using the configured operating setting for the write parameter.
9. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm; and
control circuitry configured to:
apply a control bias to the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, and scan read each burst in order to measure a quality metric for each burst, the writing of the plurality of bursts comprising:
write a first burst at a first write angle of the disk surface; and
write a second burst at a second write angle of the disk surface, and
configure an operating setting for the write parameter based on the measured quality metrics.
10. The data storage device as recited in claim 9 , wherein the control circuitry is further configured to scan read each burst by decreasing the control bias over multiple revolutions of the disk surface in order to scan the head radially over each burst.
11. The data storage device as recited in claim 9 , wherein the control circuitry is further configured to:
during a first revolution of the disk surface, write the first burst at the first write angle;
during a second revolution of the disk surface, read the first burst to generate a first quality metric;
during a third revolution of the disk surface, write the second burst at the second write angle;
during a fourth revolution of the disk surface, read the second burst to generate a second quality metric; and
configure the operating setting for the write parameter based on the first and second measured quality metrics.
12. The data storage device as recited in claim 10 , wherein the control circuitry is further configured to:
during a first revolution of the disk surface, write the first burst at the first write angle and write the second burst at the second write angle during a first revolution of the disk surface;
during a second revolution of the disk surface, read the first burst to generate a first quality metric and read the second burst to generate a second quality metric; and
configure the operating setting for the write parameter based on the first and second measured quality metrics.
13. The data storage device as recited in claim 9 , wherein:
the head comprises a write coil; and
the write parameter comprises a write current applied to the write coil.
14. The data storage device as recited in claim 9 , wherein:
the head comprises a write assist element to assist a write coil; and
the write parameter comprises a bias applied to the write assist element.
15. The data storage device as recited in claim 14 , wherein the write assist element comprises a laser, the quality metric is a burst amplitude, and the control circuitry is further configured to:
increase the bias applied to the laser prior to writing each burst; and
configure the operating setting for the bias based on when the burst amplitude saturates.
16. The data storage device as recited in claim 9 , wherein the control circuitry is further configured to servo write the disk surface with servo sectors using the operating setting for the write parameter.
17. The data storage device as recited in claim 9 , wherein the control circuitry is further configured to erase the bursts from the disk surface using the configured operating setting for the write parameter.
18. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm; and
a means for controlling the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, and read each burst in order to measure a quality metric for each burst, the writing of the plurality of bursts comprising:
writing a first burst at a first write angle of the disk surface, and
writing a second burst at a second write angle of the disk surface, and
a means for configuring an operating setting for the write parameter based on the measured quality metrics.
19. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm, the head comprising a write assist element to assist a write coil, the write assist element comprising a laser; and
control circuitry configured to:
control the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, increase a bias applied to the laser prior to writing each burst, read each burst in order to measure a quality metric for each burst, the quality metric comprising a burst amplitude, and
configure an operating setting for the write parameter based on the measured quality metrics, the write parameter comprising the bias applied to the laser, wherein the operating setting for the bias is configured based on when the burst amplitude saturates.
20. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm; and
control circuitry configured to:
apply a control bias to the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, and scan read each burst in order to measure a quality metric for each burst, wherein each burst is scan read by decreasing the control bias over multiple revolutions of the disk surface in order to scan the head radially over each burst; and
configure an operating setting for the write parameter based on the measured quality metrics.
21. A data storage device comprising:
a disk surface;
an actuator;
an actuator arm actuated by the actuator;
a head actuated over the disk surface by the actuator arm, the head comprising a write assist element to assist a write coil, the write assist element comprising a laser; and
control circuitry configured to:
apply a control bias to the actuator to press the actuator arm against a crash stop in order to write a plurality of bursts on the disk surface each with a different setting for a write parameter, increase a bias applied to the laser prior to writing each burst, and scan read each burst in order to measure a quality metric for each burst, the quality metric comprising a burst amplitude, and
configure an operating setting for the write parameter based on the measured quality metrics, the write parameter comprising the bias applied to the laser, wherein the operating setting for the bias is configured based on when the burst amplitude saturates.