Extended HBM offsets in 2.5D interposers
A semiconductor package includes an interposer, a number of a first integrated circuit (IC) dies, one or more second IC dies, and one or more dummy dies. The first IC dies, the second IC dies and the dummy dies are implemented on the interposer. The dummy dies are configured to enable routing of pins of the first IC dies to selected circuits of the second IC dies while conforming to predefined routing rules.
1. A semiconductor package comprising:
an interposer;
a plurality of a first integrated circuit (IC) dies;
one or more second IC dies; and
one or more dummy dies,
wherein the plurality of the first IC dies, the one or more second IC dies and the one or more dummy dies are implemented on the interposer, and wherein the one or more dummy dies are configured to enable routing of pins of the plurality of first IC dies to selected circuits of the one or more second IC dies while conforming to predefined routing rules.
2. The semiconductor package of claim 1 , wherein the plurality of the first IC dies comprise a plurality of high-bandwidth memory (HBM) dies.
3. The semiconductor package of claim 1 , wherein the one or more second IC dies comprise one or more application-specific integrated circuit (ASIC) dies.
4. The semiconductor package of claim 3 , wherein the selected circuits of the one or more second IC dies comprise physical layer (PHY) circuits of the one or more ASIC dies.
5. The semiconductor package of claim 1 , wherein the one or more dummy dies are placed between the plurality of the first IC dies and the one or more second IC dies.
6. The semiconductor package of claim 1 , wherein the one or more dummy dies are placed in between the one or more second IC dies.
7. The semiconductor package of claim 6 , wherein the one or more dummy dies comprise metallic dies implemented in a metal layer of the interposer.
8. The semiconductor package of claim 7 , wherein the one or more dummy dies vary in dimensions.
9. The semiconductor package of claim 7 , wherein the predefined routing rules comprise 45-degree and orthogonal routing rules.
10. The semiconductor package of claim 1 , wherein the one or more dummy dies are configured to enable routing with various amounts of offsets between the plurality of first IC dies and the one or more second IC dies.
11. A method of packaging semiconductor dies, the method comprising:
placing a plurality of a first integrated circuit (IC) dies on an interposer;
placing one or more second IC dies on the interposer; and
placing one or more dummy dies on the interposer,
wherein placing the one or more dummy dies comprises configuring the one or more dummy dies to enable routing of pins of the plurality of first IC die to selected circuits of the one or more second IC dies while conforming to predefined routing rules.
12. The method of claim 11 , wherein the plurality of the first IC dies comprise a plurality of high-bandwidth memory (HBM) dies, and wherein the one or more second IC dies comprise one or more application-specific integrated circuit (ASIC) dies.
13. The method of claim 11 , wherein placing the one or more dummy dies comprises placing the one or more dummy dies in-between the one or more second IC dies.
14. The method of claim 11 , wherein placing the one or more dummy dies comprises placing the one or more dummy dies between the plurality of the first IC dies and the one or more second IC dies.
15. The method of claim 11 , wherein placing the one or more dummy dies comprises placing one or more metallic dies in a metal layer of the interposer.
16. The method of claim 11 , wherein conforming to the predefined routing rules comprises conforming to 45-degree and orthogonal routing rules.
17. The method of claim 11 , further comprising configuring the one or more dummy dies to enable routing with various amounts of offsets between the plurality of first IC dies and the one or more second IC dies.
18. An interposer with extended high-bandwidth memory (HBM) offsets, the interposer comprising:
a plurality of HBM dies;
two or more application-specific integrated circuits (ASICs); and
one or more dummy dies placed on the interposer,
wherein sizes and placement locations of one or more dummy dies are configured to enable routing of pins of the plurality of HBM dies to selected circuits of the one or more ASIC dies while conforming to predefined routing rules; and wherein the one or more dummy dies are placed at the configured placement locations on the interposer.
19. The interposer of claim 18 , wherein the configured placement locations on the interposer comprise in-between the two or ASICs, and wherein placement of the one or more dummy dies comprises placement of one or more metallic dies in a metal layer of the interposer.
20. The interposer of claim 18 , the configured placement locations on the interposer comprise in-between the plurality of HBM dies and the two or more ASIC dies, and wherein conforming to the predefined routing rules comprises conforming to 45-degree and orthogonal routing rules.