System and method for input power detection of two power sources using single monitoring circuit
A voltage supply system that includes a first power supply branch and a second power supply branch. Both branches includes a voltage supply; a serially connected diode and switch connected between the voltage supply and an output of the voltage supply system; and a gate driver connected to the first switch to control operation of the switch. The system also includes a voltage monitor/controller configured to perform a built-in test of the system by controlling the state of the first and second switches by controlling enable signals provided to the first and second gate drivers.
1. A voltage supply system comprising:
a first power supply branch that includes:
a first voltage supply;
a serially connected first diode and first switch connected between the first voltage supply and an output of the voltage supply system; and
a first gate driver connected to the first switch to control operation of the first switch;
a second power supply branch that includes:
a second voltage supply;
a serially connected second diode and second switch connected between the second voltage supply and the output of the voltage supply system; and
a second gate driver connected to the second switch to control operation of the first switch; and
a voltage monitor/controller configured to perform a built-in test of the system by controlling the state of the first and second switches by controlling enable signals provided to the first and second gate drivers;
wherein the gate drivers receive power from their respective power supplies; and
wherein the first gate driver includes a first enable input (EN 1 ) and the second gate driver includes a second enable input (EN 2 ), wherein the first gate driver causes the first switch to conduct when it receives a signal at EN 1 and the second gate driver causes the second switch to conduct when it receives a signal at EN 2 .
2. The system of claim 1 , wherein the voltage monitor controller includes logic that controls the built in test.
3. The system of claim 2 , wherein the logic causes the system to operate in a first state where both the first and second gate drives are enabled to cause both the first and second switches to be conductive.
4. The system of claim 3 , wherein the logic determines that neither of the first and second voltage sources are operational when the voltage monitor measures a voltage below an expected voltage while the system is in the first state.
5. The system of claim 3 , wherein the logic determines that at least one of the first and second voltage sources are operational when the voltage monitor measures an expected voltage while the system is in the first state.
6. The system of claim 5 , wherein when the logic determines that at least one of the first and second voltage sources are operational, the logic cycles to a second state where the first gate driver is enabled and the first switch is conductive and the second gate driver is disabled.
7. The system of claim 6 , wherein the logic determines that the first voltage source has failed and returns the system to the first state if the voltage monitor measures a value that falls below an expected value.
8. The system of claim 7 , wherein the logic determines that the first voltage source is operational when the voltage monitor measures an expected voltage while the system is in the second state and then cycles into a third state wherein the first gate driver is disable, the second gate driver is enabled and the second switch is conductive.
9. The system of claim 8 , wherein the logic determines that the second voltage source has failed and returns the system to the first or second state if the voltage monitor measures a value that falls below an expected value.
10. A method of testing a voltage supply system with a single circuit, the method comprising:
providing a system as claimed in claim 1 ;
causing the system to operate in a first state where both the first and second gate drives are enabled to cause both the first and second switches to be conductive; and
measuring a voltage at an output of the system with the voltage monitor.
11. The method of claim 10 , further comprising:
determining that neither of the first and second voltage sources are operational when the voltage monitor measures a voltage below an expected voltage while the system is in the first state.
12. The method of claim 10 , further comprising:
determining that at least one of the first and second voltage sources are operational when the voltage monitor measures an expected voltage while the system is in the first state.
13. The method of claim 12 , wherein, when at least one of the first and second voltage sources are operational, switching the circuit to a second state where the first gate driver is enabled and the first switch is conductive and the second gate driver is disabled.
14. The method of claim 13 , further comprising:
determining that the first voltage source has failed and returns the system to the first state if the voltage monitor measures a value that falls below an expected value.
15. The method of claim 13 , further comprising:
determining that the first voltage source is operational when the voltage monitor measures an expected voltage while the system is in the second state; and
cycling into a third state wherein the first gate driver is disable, the second gate driver is enabled and the second switch is conductive.
16. The method of claim 15 , further comprising:
determining that the second voltage source has failed and returning the system to the first or second state if the voltage monitor measures a value that falls below an expected value.