IP Library Granted Patent US 11,677,032
Granted Patent B2
US 11,677,032 · App. 17/806,758 · Granted Jun 13, 2023

Sensor integrated circuit with integrated coil and element in central region of mold material

Inventors: Ravi Vig (Concord, NH); William P. Taylor (Amherst, NH); Paul A. David (Bow, NH); P. Karl Scheller (Dover, NH); Andreas P. Friedrich (Metz-Tessy, FR)
Assignee: Allegro MicroSystems, LLC
H01L29/82G01D5/147G01R33/0047G01R33/0052G01R33/06G01R15/207H01L2224/45147H01L2224/48247H01L2924/00011
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Quick Facts
Patent No.
US 11,677,032
App. No.
17/806,758
Granted
Jun 13, 2023
Kind
B2
Abstract

A sensor includes a lead frame having a first surface, a second opposing surface, and a plurality of leads and a semiconductor die having a first surface attached to the first surface of the lead frame and a second, opposing surface. The sensor further includes a non-conductive mold material enclosing the die and at least a portion of the lead frame, a conductive coil secured to the non-conductive mold material, a mold material secured to the non-conductive mold material and enclosing the conductive coil, wherein the mold material has a central region and an element disposed in the central region of the mold material.

Claims (37)

1. A sensor comprising:

a lead frame having a first surface, a second opposing surface, and a plurality of leads;

a semiconductor die having a first surface attached to the first surface of the lead frame and a second, opposing surface;

a non-conductive mold material enclosing the die and at least a portion of the lead frame;

a conductive coil secured to the non-conductive mold material;

a mold material secured to the non-conductive mold material and enclosing the conductive coil, wherein the mold material has a central region and the conductive coil is disposed outside the central region; and

an element disposed in the central region of the mold material.

2. The sensor of claim 1 wherein the element is a separately formed element.

3. The sensor of claim 2 wherein the element is formed by machining, sintering, or molding.

4. The sensor of claim 1 wherein the element is secured to a surface of the central region of the mold material by an adhesive or a press fit.

5. The sensor of claim 1 wherein the element comprises an interfering feature and wherein the interfering feature is secured to the mold material.

6. The sensor of claim 5 wherein the interfering feature comprises a barb extending from the element into the mold material.

7. The sensor of claim 1 wherein the element is comprised of a hard ferromagnetic material.

8. The sensor of claim 1 wherein the element is comprised of a soft ferromagnetic material.

9. The sensor of claim 1 wherein the element is comprised of a non-ferromagnetic, non-conductive material.

10. The sensor of claim 1 wherein the element is comprised of a potting compound filled with a soft ferromagnetic material.

11. The sensor of claim 1 wherein the element is comprised of a sintered steel rod.

12. The sensor of claim 1 wherein the semiconductor die comprises a first semiconductor die and wherein the sensor further comprises a second semiconductor die.

13. The sensor of claim 12 further comprising a sensing element supported by the first semiconductor die and processing circuitry supported by the second semiconductor die.

14. The sensor of claim 13 wherein the sensing element comprises a magnetic field sensing element.

15. The sensor of claim 1 wherein the mold material is a soft ferromagnetic mold material.

16. The sensor of claim 1 wherein the mold material is a hard ferromagnetic mold material.

17. A sensor comprising:

a lead frame having a first surface, a second opposing surface, and a plurality of leads;

a semiconductor die having a first surface attached to the first surface of the lead frame and a second, opposing surface;

a non-conductive mold material enclosing the die and at least a portion of the lead frame;

a conductive coil secured to the non-conductive mold material;

a mold material secured to the non-conductive mold material and enclosing the conductive coil, wherein the mold material has a central region; and

an element disposed in the central region of the mold material, wherein the element comprises an interfering feature and wherein the interfering feature is secured to the mold material.

18. The sensor of claim 17 wherein the interfering feature comprises a barb extending from the element into the mold material.

19. A sensor comprising:

a lead frame having a first surface, a second opposing surface, and a plurality of leads;

a semiconductor die having a first surface attached to the first surface of the lead frame and a second, opposing surface;

a non-conductive mold material enclosing the die and at least a portion of the lead frame;

a conductive coil secured to the non-conductive mold material;

a mold material secured to the non-conductive mold material and enclosing the conductive coil, wherein the mold material has a central region; and

an element disposed in the central region of the mold material, wherein the element comprises a sintered steel rod.

Assignments (4)
PATENT SECURITY AGREEMENT Recorded Jun 22, 2023
From: ALLEGRO MICROSYSTEMS, LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS THE COLLATERAL AGENT
Reel/Frame 064068/0459 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2022
From: VIG, RAVI; TAYLOR, WILLIAM P.; DAVID, PAUL A.; SCHELLER, P. KARL; FRIEDRICH, ANDREAS P.
To: ALLEGRO MICROSYSTEMS, INC.
Reel/Frame 060192/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2022
From: ALLEGRO MICROSYSTEMS EUROPE LIMITED
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 060192/0187 →
CHANGE OF NAME Recorded Jun 14, 2022
From: ALLEGRO MICROSYSTEMS, INC
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 060380/0659 →
Continuity (6)
Division 17130085 · Dec 22, 2020
Division 16252789 · Jan 21, 2019
Division 15618251 · Jun 9, 2017
Division 13748999 · Jan 24, 2013
Continuation In Part 13424618 · Mar 20, 2012
Related Publication 20220310853A1 · Sep 29, 2022