Schottky diode with tunable blocking voltage
A Schottky diode includes a substrate having a first type dopant, a buried layer within the substrate and having a second type dopant, an epitaxial layer above the buried layer and having the second type dopant, a plurality of rings within the epitaxial layer and having the first type dopant, wherein the plurality of rings comprises an L-shaped ring, a shallow trench isolation (STI) layer at the top region of the epitaxial layer, an anode, a cathode spaced from the anode by the STI layer, and wherein the buried layer has an open region substantially vertically aligned with the anode.
1. A Schottky diode comprising:
a substrate having a first type dopant;
a buried layer within the substrate and having a second type dopant;
an epitaxial layer above the buried layer and having the second type dopant;
a plurality of rings within the epitaxial layer and having the first type dopant, wherein the plurality of rings comprises an L-shaped ring;
a shallow trench isolation (STI) layer at the top region of the epitaxial layer;
an anode;
a cathode spaced from the anode by the STI layer; and
wherein the buried layer has an open region substantially vertically aligned with the anode.
2. The Schottky diode of claim 1 , wherein the L-shaped ring covers a corner of the STI layer adjacent to the anode.
3. The Schottky diode of claim 2 , wherein a dimension of the L-shaped ring is adjustable and wherein a blocking voltage of the Schottky diode is based at least in part on the dimension of the L-shaped ring.
4. The Schottky diode of claim 3 , wherein the dimension of the L-shaped ring is a width of the L-shaped ring that extends under the STI layer.
5. The Schottky diode of claim 1 , wherein the open region of the buried layer has an adjustable width and wherein a blocking voltage of the Schottky diode is based at least in part on the width of the open region.
6. The Schottky diode of claim 1 , further comprising at least one field plate above the STI layer.
7. The Schottky diode of claim 1 , further comprising at least one plug in contact with the buried layer.
8. The Schottky diode of claim 1 , wherein the first type dopant is p-type and wherein the second type dopant is n-type.
9. The Schottky diode of claim 1 , wherein the substrate is comprised of silicon.
10. The Schottky diode of claim 1 , wherein the substrate and the epitaxial layer are comprised of a crystalline semiconductor material, selected from silicon, Ge, AlGaN, InGaAs, GaAs, InAs, InP, AlN, InN, GaN, SiC, SiGe.