LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT
A system includes a light source, an optical splitter, and a pulse-energy measurement circuit. The light source is configured to generate an emitted beam of light that includes an emitted pulse of light. The optical splitter is configured to split the emitted beam of light to produce at least (i) a test beam of light that includes a test pulse of light, the test pulse of light including a first portion of the emitted pulse of light and (ii) an output beam of light that includes an output pulse of light, the output pulse of light including a second portion of the emitted pulse of light allowed to at least in part exit the system. The pulse-energy measurement circuit is configured to receive the test pulse of light and determine a numerical value corresponding to an individual energy amount of the test pulse of light.
1 . A system, comprising:
a light source configured to generate an emitted beam of light comprising an emitted pulse of light;
an optical splitter configured to split the emitted beam of light to produce at least (i) a test beam of light comprising a test pulse of light, the test pulse of light comprising a first portion of the emitted pulse of light and (ii) an output beam of light comprising an output pulse of light, the output pulse of light comprising a second portion of the emitted pulse of light allowed to at least in part exit the system; and
a pulse-energy measurement circuit configured to receive the test pulse of light and determine a numerical value corresponding to an individual energy amount of the test pulse of light.
2 . The system of claim 1 , wherein the pulse-energy measurement circuit comprises:
a detector configured to produce a pulse of photocurrent corresponding to the test pulse of light;
an electronic amplifier configured to produce a voltage pulse corresponding to the pulse of photocurrent;
a peak-hold circuit configured to produce a voltage signal corresponding to a peak of the voltage pulse; and
an analog-to-digital converter (ADC) configured to determine the numerical value corresponding to the individual energy amount of the test pulse of light, wherein the numerical value is determined based on the voltage signal corresponding to the peak of the voltage pulse.
3 . The system of claim 2 , wherein the pulse-energy measurement circuit further comprises a threshold detector configured to produce a trigger signal when the voltage signal rises above a particular threshold voltage, wherein the trigger signal is supplied to the ADC to initiate determination by the ADC of the numerical value corresponding to the individual energy amount of the test pulse of light.
4 . The system of claim 3 , wherein the pulse-energy measurement circuit further comprises a reset timer configured to supply a reset signal to the peak-hold circuit a particular time interval after the trigger signal is produced.
5 . The system of claim 2 , wherein the pulse-energy measurement circuit further comprises a buffer amplifier located between the peak-hold circuit and the ADC, wherein the buffer amplifier is configured to receive the voltage signal corresponding to the peak of the voltage pulse and produce an output signal corresponding to the received voltage signal, wherein the output signal is supplied to the ADC.
6 . The system of claim 2 , wherein the pulse-energy measurement circuit further comprises a timer configured to determine a time of receipt for the test pulse of light.
7 . The system of claim 1 , wherein the pulse-energy measurement circuit comprises:
a detector configured to produce a pulse of photocurrent corresponding to the test pulse of light;
an electronic amplifier configured to produce a voltage pulse corresponding to the pulse of photocurrent; and
a plurality of comparators and a plurality of time-to-digital converters (TDCs), wherein:
each comparator of the plurality of comparators is coupled to a corresponding one of the TDCs and is configured to provide an electrical-edge signal to the corresponding TDC when the voltage pulse rises above or falls below a particular threshold voltage; and
the corresponding TDC is configured to produce a time value corresponding to a time when the electrical-edge signal was received.
8 . The system of claim 7 , wherein the numerical value corresponding to the individual energy amount of the test pulse of light is determined based on one or more time values produced by one or more of the TDCs.
9 . The system of claim 7 , further comprising a processor configured to determine a duration or a shape of the test pulse of light based on one or more time values produced by one or more of the TDCs.
10 . The system of claim 9 , wherein the processor is further configured to:
determine that the duration or the shape of the test pulse of light is different from an expected duration or shape; and
send, in response to determining that the duration or the shape of the test pulse of light is different from the expected duration or shape, an alert that the system is not operating properly.
11 . The system of claim 1 , further comprising a processor configured to determine the individual energy amount of the test pulse of light based on the numerical value corresponding to the individual energy amount of the test pulse of light.
12 . The system of claim 1 , further comprising a processor configured to determine an individual energy amount of the output pulse of light based on the individual energy amount of the test pulse of light.
13 . The system of claim 12 , wherein the individual energy amount of the output pulse of light (Eo) is determined from an expression E O = E T /ƒ, wherein E T is the individual energy amount of the test pulse of light, and ƒ is a split ratio of the optical splitter.
14 . The system of claim 12 , further comprising:
a receiver is configured to detect a received pulse of light and determine an energy of the received pulse of light, the received pulse of light comprising a portion of the output pulse of light scattered by a target located a distance from the system; and
wherein the processor is further configured to determine a reflectivity of the target based on (i) the energy of the received pulse of light, (ii) the individual energy amount of the output pulse of light, and (iii) the distance from the system to the target.
15 . The system of claim 1 , further comprising a processor configured to:
determine that the individual energy amount of the test pulse of light among a plurality of test pulses of light is below a particular operating energy; and
send, in response to determining that the individual energy amount is below the particular operating energy, an instruction to adjust the light source.
16 . The system of claim 15 , wherein:
the light source comprises a fiber-optic amplifier comprising a pump laser diode; and
adjusting the light source includes increasing an electrical current supplied to the pump laser diode to increase an optical gain of the fiber-optic amplifier.
17 . The system of claim 1 , further comprising:
a processor configured to:
determine that the individual energy amount of the test pulse of light among a plurality of test pulses of light is below a particular minimum energy; and
send, in response to determining that the individual energy amount is below the particular minimum energy, an alert that the system is not operating properly.
18 . The system of claim 17 , wherein the alert comprises an instruction to shut down at least a portion of the system.
19 . The system of claim 1 , further comprising:
a processor configured to:
determine that the individual energy amount of the test pulse of light among a plurality of test pulses of light is outside an operating energy range; and
send, in response to determining that the individual energy amount is outside the operating energy range, an alert that the system is not operating properly.
20 . The system of claim 1 , further comprising:
a processor configured to:
based on the numerical value corresponding to the individual energy amount of the test pulse of light, send an instruction to adjust the light source; and
use a subsequent measurement received from the pulse-energy measurement circuit to verify a performance of the instruction to adjust the light source.
21 . The system of claim 20 , wherein the instruction to adjust the light source comprises an instruction to decrease an energy of one or more subsequently emitted pulses of light below a particular threshold energy, wherein the one or more subsequently emitted pulses of light correspond to output pulses of light that are directed by a scanner away from a window of the system.
22 . The system of claim 1 , further comprising:
a processor configured to:
determine that a time of receipt for the test pulse of light is outside a time-of-receipt interval; and
send, in response to determining that the time of receipt is outside the time-of-receipt interval, an alert that the system is not operating properly.
23 . The system of claim 1 , wherein the optical splitter is configured to split the emitted beam of light so that:
the individual energy amount of the test pulse of light is less than or equal to 2% of an energy of the emitted pulse of light; and
an energy of the output pulse of light is greater than or equal to 98% of the energy of the emitted pulse of light.
24 . The system of claim 1 , wherein the emitted pulse of light is one of a plurality of emitted pulses of light produced by the light source, wherein the emitted pulses of light have optical characteristics comprising:
a wavelength between 900 nanometers and 1700 nanometers;
a pulse energy between 0.1 µJ and 100 µJ;
a pulse repetition frequency between 80 kHz and 10 MHz; and
a pulse duration between 1 ns and 100 ns.
25 . The system of claim 1 , wherein the light source comprises a direct-emitter laser diode configured to produce the emitted beam of light.
26 . The system of claim 1 , wherein the light source comprises:
a seed laser diode configured to produce seed light; and
a semiconductor optical amplifier (SOA) configured to amplify the seed light to produce the emitted beam of light.
27 . The system of claim 1 , wherein the light source comprises:
a seed laser diode configured to produce seed light; and
a fiber-optic amplifier configured to amplify the seed light to produce the emitted beam of light.
28 . The system of claim 1 , wherein the light source comprises:
a seed laser diode configured to produce seed light;
a semiconductor optical amplifier (SOA) configured to amplify the seed light to produce amplified seed light; and
a fiber-optic amplifier configured to further amplify the amplified seed light to produce the emitted beam of light.
29 . The system of claim 1 , further comprising:
a scanner configured to scan the output beam of light across a field of regard of the system;
a receiver configured to detect a received pulse of light, the received pulse of light comprising a portion of the output pulse of light scattered by a target located a distance from the system; and
a processor configured to determine the distance from the system to the target based on a round-trip time for the portion of the output pulse of light to travel to the target and back to the system.
30 . The system of claim 29 , wherein the scanner comprises:
a first scan mirror comprising a polygon mirror, the polygon mirror configured to scan the output beam of light along a first scan axis to produce a plurality of scan lines; and
a second scan mirror configured to distribute the scan lines along a second scan axis different from the first scan axis.
31 . A method comprising:
generating an emitted beam of light comprising an emitted pulse of light;
splitting the emitted beam of light to produce at least (i) a test beam of light comprising a test pulse of light, the test pulse of light comprising a first portion of the emitted pulse of light and (ii) an output beam of light comprising an output pulse of light, the output pulse of light comprising a second portion of the emitted pulse of light;
producing a pulse of photocurrent corresponding to the test pulse of light;
producing a voltage pulse corresponding to the pulse of photocurrent;
producing a voltage signal corresponding to a peak of the voltage pulse; and
determining a numerical value corresponding to an individual energy amount of the test pulse of light, wherein the numerical value is determined based on the voltage signal corresponding to the peak of the voltage pulse.
32 . A system, comprising:
a light source configured to generate an emitted beam of light comprising an emitted pulse of light;
an optical splitter configured to split the emitted beam of light to produce at least (i) a test beam of light comprising a test pulse of light, the test pulse of light comprising a first portion of the emitted pulse of light and (ii) an output beam of light comprising an output pulse of light, the output pulse of light comprising a second portion of the emitted pulse of light allowed to at least in part exit the system;
a pulse-energy measurement circuit configured to receive the test pulse of light and produce a digital numerical value corresponding to a voltage peak of the test pulse of light; and
a processor configured to determine an individual energy amount of the test pulse of light based on the digital numerical value corresponding to the voltage peak of the test pulse of light.